Philipp Scholz

A 0.02-mm2 9-bit 100-MS/s Charge-Injection Cell Based SAR-ADC in 65-nm LP CMOS

Georg Böck, Marcel Runge, Dario Schmock, 2018, ESSCIRC 2018 - IEEE 44th European Solid State Circuits Conference (ESSCIRC).

A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips

Stefan Keil, Philipp Scholz, Norman Dodel, 2015, ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC).

IC Debug and Fault Isolation for an Age of IoE and High Data Rates—A Vision

Christian Boit, Philipp Scholz, 2018, IEEE Transactions on Components, Packaging and Manufacturing Technology.

Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments

Christian Boit, Philipp Scholz, Uwe Kerst, 2010, Microelectron. Reliab..

Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL

Philipp Scholz, 2016 .

Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm

Christian Boit, Philipp Scholz, Uwe Kerst, 2014, Microelectron. Reliab..

Visible light techniques in the FinFET era: Challenges, threats and opportunities

Heiko Lohrke, Christian Boit, Philipp Scholz, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

High output power frequency doubler for digital PLLs in fully integrated 24 GHz CMOS radar systems

Georg Böck, Dominic Maurath, Philipp Scholz, 2017, 2017 IEEE 17th International Conference on Ubiquitous Wireless Broadband (ICUWB).

NRZ, DB, and DMT performance for short-reach VCSEL-based optical interconnects

Lukasz Chorchos, Nikolay Ledentsov, Volker Jungnickel, 2021, OPTO.

Non-Linear PAM-4 VCSEL Equalization and 22 nm SOI CMOS DAC for 112 Gbit/s Data Transmission

Mikel Agustin, Nikolay Ledentsov, Urs Hecht, 2019, 2019 12th German Microwave Conference (GeMiC).

Focused Ion Beam Created Refractive and Diffractive Lens Techniques for the Improvement of Optical Imaging through Silicon

Philipp Scholz, P. Scholz, 2012 .

Contactless visible light probing for nanoscale ICs through 10 μm bulk silicon

Heiko Lohrke, Christian Boit, Philipp Scholz, 2015 .