Yi-Pin Fang

Soft error rate cross-technology prediction on embedded DRAM

Balaji Vaidyanathan, Yi-Pin Fang, Anthony S. Oates, 2009, 2009 IEEE International Reliability Physics Symposium.

Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging

Yi-Pin Fang, Anthony S. Oates, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Neutron-Induced Charge Collection Simulation of Bulk FinFET SRAMs Compared With Conventional Planar SRAMs

Yi-Pin Fang, A. S. Oates, 2011, IEEE Transactions on Device and Materials Reliability.

Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices

Yi-Pin Fang, A. S. Oates, 2014, IEEE Transactions on Device and Materials Reliability.