Hi-Deok Lee

发表

Low-Noise Chopper Amplifier Using Lateral PNP Input Stage With Automatic Base Current Cancellation

Choul-Young Kim, Hyoungho Ko, Hyun-Woong Choi, 2021, IEEE Transactions on Circuits and Systems II: Express Briefs.

Demonstration of $L_{g} \sim \hbox{55}\ \hbox{nm}$ pMOSFETs With $\hbox{Si/Si}_{0.25}\hbox{Ge}_{0.75}/\hbox{Si}$ Channels, High $I_{\rm on}/I_{\rm off}\ (≫ \hbox{5} \times \hbox{10}^{4})$ , and Controlled Short Channel Effects (SCEs)

Hsing-Huang Tseng, S. Datta, R. Jammy, 2008, IEEE Electron Device Letters.

Real time on-chip characterization of time delay arising from multi-level-metallization: decoupling of pure charging and drift-and-charging

Jeong-Mo Hwang, Dae-Mann Kim, Young-Jong Lee, 1998 .

Arsenic and phosphorus double ion implanted source/drain junction for 0.25and sub-0.25-μm MOSFET technology

Young-Jong Lee, Hi-Deok Lee, H. Lee, 1999 .

Suppression of Nickel-germanide (NiGe) Agglomeration and NiPenetration by Hydrogen (H) Ion Shower Doping in NiGe on a ThinEpitaxial Ge-on-Si Substrate

Raj Jammy, Ga-Won Lee, Min-Ho Kang, 2009 .

Characterization of Near-Interface Oxide Trap Density in Nitrided Oxides for Nanoscale MOSFET Applications

Chang-Ki Baek, Hee-Hwan Ji, In-Shik Han, 2009, IEEE Transactions on Nanotechnology.

Improvement of Thermal Stability of Nickel Silicide Using Co-sputtering of Ni and Ti for Nano-Scale CMOS Technology

Meng Li, Hi-Deok Lee, H. Lee, 2013 .

Characterization of crosstalk-induced noise for 0.18 /spl mu/m CMOS technology with 6-level metallization using time domain reflectometry and S-parameters

Oh-Kyong Kwon, Jeong-Mo Hwang, Dae-Mann Kim, 1999 .

Improvement of Thermal Stability of Ni Germanide Using a Ni–Pt(1%) Alloy on Ge-on-Si Substrate for Nanoscale Ge MOSFETs

Hsing-Huang Tseng, Ga-Won Lee, R. Jammy, 2010, IEEE Transactions on Nanotechnology.

Experimental evidence for nonlucky electron model effect in 0.15-/spl mu/m NMOSFETs

Jeong-Mo Hwang, Sang-Gi Lee, Hi-Deok Lee, 2002 .

Accurate extraction of reverse leakage current components of shallow silicided p/sup +/-n junction for quarter- and sub-quarter-micron MOSFET's

Jeong-Mo Hwang, Hi-Deok Lee, H. Lee, 1998 .

On-chip characterization of interconnect parameters and time delay in 0.18 /spl mu/m CMOS technology for ULSI circuit applications

Dae-Mann Kim, Hi-Deok Lee, Myoung-Jun Jang, 2000 .

PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- $k$ Dielectrics

Yoon-Ha Jeong, Chang Yong Kang, J.C. Lee, 2008, IEEE Electron Device Letters.

Charge Spreading Effect of Stored Charge on Retention Characteristics in SONOS NAND Flash Memory Devices

Ga-Won Lee, Jun-Kyo Jeong, Seung-Dong Yang, 2015 .

Study of Abnormal Oxidation of Ni-Germanosilicide by High Temperature Post-Silicidation Annealing(Session A3 Si Materails and Process)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))

Jeong-Gun Lee, Yong-Goo Kim, Hi-Deok Lee, 2004 .

Improvement of Thermal Stability of Ni-Silicide Using Vacuum Annealing on Boron Cluster Implanted Ultra Shallow Source/Drain for Nano-Scale CMOSFETs

Ga-Won Lee, Min-Ho Kang, Se-Kyung Oh, 2010 .

Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate

Chang Yong Kang, Sang-Uk Park, Ga-Won Lee, 2011, IEEE Electron Device Letters.

A comparative study of reliability and performance of strain engineering using CESL stressor and mechanical strain

Yoon-Ha Jeong, Chang Yong Kang, Byoung Hun Lee, 2008, 2008 IEEE International Reliability Physics Symposium.

Novel Method for Accurate Extraction of fMAX for Nano-Scale MOSFETs

이희승, Dae-Byung Kim, 김대병, 2004 .

Dependence of 1/f noise characteristics of NMOSFETs on body bias and temperature in sub-threshold region

Sung-Kyu Kwon, Jae-Hyung Jang, Song-Jae Lee, 2011, 2011 International Semiconductor Device Research Symposium (ISDRS).

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Byoung Hun Lee, Sung-Kyu Kwon, Sun-Ho Oh, 2014, IEEE Transactions on Electron Devices.

Thermal Immune Ni Germanide for High Performance Ge MOSFETs on Ge -on- Si Substrate Utilizing $ \hbox{Ni}_{0.95}\hbox{Pd}_{0.05}$ Alloy

Won-Ho Choi, R. Jammy, Zhun Zhong, 2009 .

Novel silicon surface passivation by Al2O3/ZnO/Al2O3 films deposited by thermal atomic layer deposition

Ga-Won Lee, Ho-Jin Yun, Kwang-Seok Jeong, 2014 .

Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering

Dong-Ho Nam, Ga-Won Lee, Won-Ho Choi, 2009 .

Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\hbox{Si}_{1 - x}\hbox{Ge}_{x}$ pMOSFETs With High-$k$/Metal Gate Stacks

Raj Jammy, Ga-Won Lee, Won-Ho Choi, 2010, IEEE Electron Device Letters.

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Sung-Kyu Kwon, Jae-Hyung Jang, Hyuk-Min Kwon, 2012, IEEE Transactions on Semiconductor Manufacturing.

Novel test structures for on-chip characterization of coupling capacitance variation by in- and anti-phase crosstalk in multi-level metallization

Hee-Hwan Ji, Dae-Byung Kim, Dae-Mann Kim, 2006, 2006 IEEE International Conference on Microelectronic Test Structures.

Analysis of SOHOS Flash Memory with 3-level Charge Pumping Method

Ga-Won Lee, Seung-Dong Yang, Ho-Jin Yun, 2014 .

Effects of growth temperature on GaN nucleation layers

Seong-Ju Park, Do Young Noh, Jung Ho Je, 1999 .

A study of stress-induced p/sup +//n salicided junction leakage failure and optimized process conditions for sub-0.15-/spl mu/m CMOS technology

Young-Jin Park, Joo-Hyoung Lee, Chel-Jong Choi, 2002 .

Investigation of zinc interstitial ions as the origin of anomalous stress-induced hump in amorphous indium gallium zinc oxide thin film transistors

Ga-Won Lee, Seung-Dong Yang, Ho-Jin Yun, 2013 .

Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Sung-Kyu Kwon, Ga-Won Lee, Min-Gyu Lim, 2011 .

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..

The Short Channel Effect Immunity of Silicon Nanowire SONOS Flash Memory Using TCAD Simulation

Ga-Won Lee, Seung-Dong Yang, Ho-Jin Yun, 2013 .