Steffen Lehmann

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

Jung-Suk Goo, Germain Bossu, Robert Tu, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

A simple and accurate method for extracting the emitter and thermal resistance of BJTs and HBTs

Michael Schroter, Andreas Pawlak, Steffen Lehmann, 2014, 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

Advantages of Faceted P-Raised Source/Drain in Fully Depleted Silicon on Insulator Technology

Alexis Divay, Dirk Utess, Thomas Feudel, 2018, ECS Transactions.

Characterization of the Static Thermal Coupling Between Emitter Fingers of Bipolar Transistors

Michael Schroter, Andreas Pawlak, Steffen Lehmann, 2014, IEEE Transactions on Electron Devices.

SiGe HBT modeling for mm-wave circuit design

Michael Schroter, Andreas Pawlak, Klaus Aufinger, 2015, 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM.