R. Bez
发表
C. Lombardi,
S. Keeney,
R. Bez,
1993,
ESSDERC '93: 23rd European solid State Device Research Conference.
D. Ielmini,
R. Bez,
A. Pirovano,
2006,
2006 International Electron Devices Meeting.
R. Bez,
D. Cantarelli,
M. Dallabora,
1998,
IEEE Electron Device Letters.
R. Bez,
A. Pirovano,
F. Pellizzer,
2010,
2010 IEEE International Memory Workshop.
R. Bez,
A. Pirovano,
A. Pirovano,
2014
.
R. Bez,
1992
.
R. Bez,
G. Torelli,
S. Shimizu,
2000,
2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).
A 20 MB/s data rate 2.5 V flash memory with current-controlled field erasing for 1 M cycle endurance
R. Bez,
D. Cantarelli,
S. Schippers,
1997,
1997 IEEE International Solids-State Circuits Conference. Digest of Technical Papers.
C. Lombardi,
R. Bez,
F. Piccinini,
1994,
ESSDERC '94: 24th European Solid State Device Research Conference.
D. Ielmini,
R. Bez,
A. Pirovano,
2004,
IEEE Transactions on Device and Materials Reliability.
R. Bez,
L. Ravazzi,
D. Cantarelli,
1990,
ESSDERC '90: 20th European Solid State Device Research Conference.
R. Bez,
G. Torelli,
A. Pirovano,
2005,
IEEE Journal of Solid-State Circuits.
R. Bez,
P. Zuliani,
A. Pirovano,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
G. Crisenza,
R. Bez,
M. Melanotte,
1991,
ESSDERC '91: 21st European Solid State Device Research Conference.
R. Bez,
L. Ravazzi,
D. Esseni,
1995,
ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference.
R. Bez,
A. Visconti,
P. Cappelletti,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
R. Bez,
P. Cappelletti,
R. Bez,
2005,
IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech)..
R. Bez,
A. Pirovano,
F. Pellizzer,
2004,
2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525).