Felix Beaudoin

发表

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Silicon Thinning and Polishing on Packaged Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

OBIRCH for Isolating High and Low Resistance Test Structure Failures During Sub-14nm Technology Development

Felix Beaudoin, 2018 .

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Femtosecond Laser Ablation for Backside Silicon Thinning

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2004, Microelectron. Reliab..

NIR laser stimulation for dynamic timing analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

IR confocal laser microscopy for MEMS Technological Evaluation

Romain Desplats, Djemel Lellouchi, Philippe Perdu, 2002, Microelectron. Reliab..

Understanding the effects of NIR laser stimulation on NMOS transistor

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2004, Microelectron. Reliab..

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2001, Microelectron. Reliab..

Comprehensive failure analysis of leakage faults in bipolar transistors

Philippe Descamps, Felix Beaudoin, Patrick Poirier, 2002, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

DynamicOptical Techniques forICDebugandFailure Analysis

Philippe Perdu, Felix Beaudoin, Julie Ferrigno, 2006 .

Magnetic emission mapping for passive integrated components characterisation

Romain Desplats, Philippe Descamps, Philippe Perdu, 2003, Microelectron. Reliab..

Panel Discussion: System to Component Level Failure Analysis in Space & Oil industries

Felix Beaudoin, 2014 .

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Application of various optical techniques for ESD defect localization

André Touboul, Philippe Perdu, Dean Lewis, 2006, Microelectron. Reliab..

Fault localization using time resolved photon emission and stil waveforms

Romain Desplats, Ketan Shah, Philippe Perdu, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Solar Cell Analysis with Light Emission and OBIC Techniques

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2003, Microelectron. Reliab..

Time Resolved Photon Emission Processing Flow for IC Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Excimer laser cleaning for microelectronics: modeling, applications, and challenges

Michel Meunier, Felix Beaudoin, Edward Sacher, 1999, Photonics West.

A physical approach on SCOBIC investigation in VLSI

Philippe Perdu, Dean Lewis, Yves Danto, 2003, Microelectron. Reliab..

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

Hervé Lapuyade, André Touboul, Philippe Perdu, 2001, Microelectron. Reliab..

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Impact of semiconductors material on IR Laser Stimulation signal

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005, Microelectron. Reliab..

Automated PICA transistor channeling and spatial-temporal photon correlation for faster IC diagnosis

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Failure analysis of micro-heating elements suspended on thin membranes

Jérôme Courbat, Nico F. de Rooij, Romain Desplats, 2005, Microelectron. Reliab..

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Philippe Perdu, Kevin Sanchez, Felix Beaudoin, 2007, Microelectron. Reliab..

Method and device for thinning a circuit board integrated

Romain Desplats, Felix Beaudoin, 2001 .

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

The advent of MEMS in space

Djemel Lellouchi, Francis Pressecq, Petra Schmitt, 2003, Microelectron. Reliab..

Implementing laser-based failure analysis methodologies using test vehicles

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005 .

A new approach for faster IC analysis with PICA: STPC-3D

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

Backside laser testing of ICs for SET sensitivity evaluation

Hervé Lapuyade, D. Lewis, Philippe Perdu, 2001 .

A review of sample backside preparation techniques for VLSI

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2000 .

New non-destructive laser ablation based backside sample preparation method

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2000 .

Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.