Lode K. J. Vandamme

Analysis and Simulation of Epidemic COVID-19 Curves with the Verhulst Model Applied to Statistical Inhomogeneous Age Groups

Paulo R. F. Rocha, Lode K. J. Vandamme, 2021 .

Noise as a diagnostic tool for quality and reliability of electronic devices

Lode K. J. Vandamme, L. Vandamme, 1994 .

Model for 1/f noise in metal‐oxide‐semiconductor transistors

Lode K. J. Vandamme, L. Vandamme, T. Kleinpenning, 1981 .