Ahmed Shariq

Systematic Study of Process Impact on FinFET Reliability

Rakesh Ranjan, Md. Iqbal Mahmud, HwaSung Rhee, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Detailed leakage current analysis of metal–insulator–metal capacitors with ZrO2, ZrO2/SiO2/ZrO2, and ZrO2/Al2O3/ZrO2 as dielectric and TiN electrodes

Albena Paskaleva, Anton J. Bauer, K. Seidel, 2013 .

Exploring the next neighbourhood relationship in amorphous alloys utilizing atom probe tomography.

Reiner Kirchheim, Ahmed Shariq, R. Kirchheim, 2007, Ultramicroscopy.