Katsuhiro Suma

Highly reliable testing of ULSI memories with on-chip voltage-down converters

Hideto Hidaka, Masaki Tsukude, Kazutami Arimoto, 1993, IEEE Design & Test of Computers.

Features of SOI DRAM's and their Potential for Low-Voltage and/or Giga-Bit Scale DRAM's (Special Issue on ULSI Memory Technology)

Hideto Hidaka, Katsuhiro Suma, Kazuyasu Fujishima, 1996 .

Column selection circuit in a semiconductor memory device

Hideto Hidaka, Masaki Tsukude, Kazutami Arimoto, 1992 .

For simultaneously determining a Vielbittestmodus and a special test mode enabled semiconductor memory device

Katsuhiro Suma, 1996 .