François Marc

发表

Reliability Aware ArchC based Processor Simulator

Tushar Gupta, Clément Bertolini, Olivier Heron, 2010 .

On the Simulation of HCI-Induced Variations of IC Timings at High Level

Nicolas Ventroux, François Marc, Olivier Héron, 2013, J. Electron. Test..

Editorial

François Marc, Nathalie Labat, 2013, Microelectron. Reliab..

Reliability simulation of electronic circuits with VHDL-AMS

François Marc, Yves Danto, B. Mongellaz, 2003, FDL.

Proceedings of 24th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2013 (Special issue of Microelectronics Reliability, Vol. 53, Issues 9-11) (2013)

François Marc, Nathalie Labat, 2007 .

Advancements on reliability-aware analog circuit design

François Marc, Cristell Maneux, Sudip Ghosh, 2012 .

Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT

François Marc, Thomas Zimmer, Nathalie Labat, 2010, IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials.

Microelectronics Reliability Volume 55, Issues 9–10

François Marc, Philippe Perdu, Nicolas Nolhier, 2015 .

Effects of Power consumption and Temperature on Lifetime Reliability of ArchC based Processor Architecture

Tushar Gupta, Clément Bertolini, Olivier Heron, 2009 .

Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015

François Marc, Philippe Perdu, Nicolas Nolhier, 2015 .

Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories

François Marc, Julien Coutet, Flavien Dozolme, 2018, Microelectron. Reliab..

Thermal aging model of InP/InGaAs/InP DHBT

François Marc, Thomas Zimmer, Cristell Maneux, 2010, Microelectron. Reliab..

Modelling delay degradation due to NBTI in FPGA Look-up tables

François Marc, Mohammad Naouss, 2016, 2016 26th International Conference on Field Programmable Logic and Applications (FPL).

FPGA LUT delay degradation due to HCI: Experiment and simulation results

François Marc, Mohammad Naouss, 2016, Microelectron. Reliab..

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses

François Marc, Thomas Zimmer, Nathalie Labat, 2011, Microelectron. Reliab..

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design

François Marc, Thomas Zimmer, Cristell Maneux, 2011, Microelectron. Reliab..

Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study

François Marc, Yves Danto, B. Mongellaz, 2003, Microelectron. Reliab..

Multi-level Modeling of Hot Carrier Injection for Reliability

François Marc, Yves Danto, Hervé Levi, 2006, FDL.

Design and implementation of a low cost test bench to assess the reliability of FPGA

François Marc, Mohammad Naouss, F. Marc, 2015, Microelectron. Reliab..

Statistical analysis during the reliability simulation

François Marc, Hervé Levi, Corinne Bestory, 2007, Microelectron. Reliab..

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis

François Marc, Hélène Frémont, Nathalie Labat, 2017, Microelectron. Reliab..

Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language

François Marc, Yves Danto, B. Mongellaz, 2002, Microelectron. Reliab..

High Level Power and Energy Exploration Using ArchC

Tushar Gupta, Nicolas Ventroux, François Marc, 2010, 2010 22nd International Symposium on Computer Architecture and High Performance Computing.

Relation between HCI-induced performance degradation and applications in a RISC processor

Nicolas Ventroux, François Marc, Olivier Héron, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

Impact of Power Consumption and Temperature on Processor Lifetime Reliability

Tushar Gupta, Nicolas Ventroux, François Marc, 2012, J. Low Power Electron..

Editorial

François Marc, Nathalie Labat, 2011, Microelectron. Reliab..

Advancements on reliability-aware analog circuit design

François Marc, Cristell Maneux, Sudip Ghosh, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications

François Marc, Geneviève Duchamp, Yves Danto, 2004, Microelectron. Reliab..

Editorial

François Marc, Hélène Frémont, Philippe Perdu, 2015, Microelectron. Reliab..

Long term accelerated ageing of an ASIC dedicated to cryptographic application

François Marc, Michel Sarlotte, Julien Coutet, 2019 .