Timothy R. Oldham

Scaling and Single Event Effects (SEE) Sensitivity

Timothy R. Oldham, 2003 .

Compendium of Ball Aerospace Total Ionizing Dose Test Results

Timothy R. Oldham, Benjamin J. Griffiths, Chad M. Whitney, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2011 IEEE Radiation Effects Data Workshop.

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Single Event Response of the Samsung 16G NAND Flash

Timothy R. Oldham, Edward P. Wilcox, Mark R. Friendlich, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Total dose failures in advanced electronics from single ions

P. Garnier, Timothy R. Oldham, T. Carriere, 1993 .

Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

Farokh Irom, Kenneth A. LaBel, Timothy R. Oldham, 2010, 2011 IEEE Radiation Effects Data Workshop.

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Farokh Irom, Kenneth A. LaBel, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

David F. Heidel, Kenneth A. LaBel, Michael J. Campola, 2010, 2011 IEEE Radiation Effects Data Workshop.

Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2009, 2009 IEEE Radiation Effects Data Workshop.