Valeri Kirischian

SIGNATURE TESTING OF ANALOG-TO-DIGITAL CONVERTERS

Lev Kirischian, Vadim Geurkov, Valeri Kirischian, 2009 .

Single Event Upset Characterization of the Cyclone V Field Programmable Gate Array Using Proton Irradiation

Valeri Kirischian, Qingyu Chen, Li Chen, 2006, 2019 IEEE Radiation Effects Data Workshop.

High energy proton irradiation results for the DSP cores of the KeyStone II system-on-chip (SoC) 66AK2L06

Valeri Kirischian, Qingyu Chen, David M. Hiemstra, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation

Valeri Kirischian, David M. Hiemstra, Jakub Brelski, 2006, 2016 IEEE Radiation Effects Data Workshop (REDW).

Single event upset characterization of the Zynq UltraScale+ MPSoC using proton irradiation

Valeri Kirischian, David M. Hiemstra, Jakub Brelski, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Multilevel Radiation Protection of Partially Reconfigurable Field Programmable Gate Array Devices

Lev Kirischian, Vadim Geurkov, Jacob Kleiman, 2006 .

Single event upset characterization of the Tegra K1 mobile processor using proton irradiation

Li Chen, Valeri Kirischian, Qingyu Chen, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Single Event Upset Characterization of the Stratix IV Field Programmable Gate Array using Proton Irradiation

Li Chen, Valeri Kirischian, Qingyu Chen, 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

Single Event Upset Characterization of the Spartan-6 Field Programmable Gate Array Using Proton Irradiation

Valeri Kirischian, David M. Hiemstra, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Two Photon Absorption Laser Facility for Single Event Effect Testing

Li Chen, Valeri Kirischian, David M. Hiemstra, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).