Tae Geun Kim

High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using Transparent Ni-Implanted AlN Ohmic Electrodes

Kyung Rock Son, Tae Hoon Park, Hideki Hirayama, 2021, IEEE Access.

Damage Free Particle Removal from Extreme Ultraviolet Lithography Mask Layers by High Energy Laser Shock Wave Cleaning

Ahmed Busnaina, Jinho Ahn, Jin-Goo Park, 2008 .