Robert Gauthier

Optical and electrical testing of latchup in I/O interface circuits

Franco Stellari, Alan J. Weger, Peilin Song, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Implementation of diode and bipolar triggered SCRs for CDM robust ESD protection in 90nm CMOS ASICs

Shunhua Chang, Robert Gauthier, Kiran V. Chatty, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Design automation to suppress cable discharge event (CDE) induced latchup in 90nm CMOS ASICs

Paul Dunn, Robert Gauthier, Kiran V. Chatty, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Design optimization of gate-silicided ESD NMOSFETs in a 45nm bulk CMOS technology

Junjun Li, Ralph Halbach, Christian Russ, 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Reducing the turn-on time and overshoot voltage for a diode-triggered silicon-controlled rectifier during an electrostatic discharge event

Tian Xia, Ahmed Ginawi, Robert Gauthier, 2014, 2014 27th IEEE International System-on-Chip Conference (SOCC).

Interoperability for ITS: An Ontology of Learning Style Models

Robert Gauthier, Judi McCuaig, 2012, ITS.

Latchup Analysis Using Emission Microscopy

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Reliability aspects of gate oxide under ESD pulse stress

Thomas Pompl, Wolfgang Stadler, Kai Esmark, 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Investigation of diode triggered silicon control rectifier turn-on time during ESD events

Tian Xia, Robert Gauthier, Ahmed Y. Ginawi, 2017, 2017 30th IEEE International System-on-Chip Conference (SOCC).