Vincent Goiffon

发表

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage

Olivier Marcelot, Pierre Magnan, Alexandre Le Roch, 2019, Sensors.

Smart CMOS image sensor for lightning detection and imaging.

Romain Molina, Pierre Magnan, Franck Larnaudie, 2013, Applied optics.

On The Pixel Level Estimation of Pinning Voltage, Pinned Photodiode Capacitance and Transfer Gate Channel Potential

Olivier Marcelot, Pierre Magnan, Philippe Martin-Gonthier, 2013 .

Multi-MGy Radiation Hardened Camera for Nuclear Facilities

Romain Molina, Pierre Magnan, Sylvain Girard, 2015 .

CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current

Pierre Magnan, Vincent Goiffon, Yolène Sacchettini, 2019, Sensors.

Charge Transfer Inefficiency in Pinned Photodiode CMOS image sensors: Simple Montecarlo modeling and experimental measurement based on a pulsed storage-gate method

Pierre Magnan, Cedric Virmontois, Vincent Goiffon, 2016 .

Finding reaction pathways and transition states: r-ARTn and d-ARTn as an efficient and versatile alternative to string approaches.

Stefano de Gironcoli, Nicolas Salles, Vincent Goiffon, 2020, Journal of chemical theory and computation.

Ionizing radiation effects on CMOS imagers manufactured in deep submicron process

Pierre Magnan, Olivier Saint-Pé, Franck Corbière, 2008, Electronic Imaging.

Special NSREC 2019 issue of the IEEE Transactions on Nuclear Science Editor Comments

Heather Quinn, Daniel M. Fleetwood, Vincent Goiffon, 2020 .

Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI

Olivier Marcelot, Romain Molina, Pierre Magnan, 2014, IEEE Transactions on Electron Devices.

Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors

Pierre Magnan, Vincent Goiffon, Guy Rolland, 2013 .

Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes

Pierre Magnan, Cedric Virmontois, Franck Corbière, 2010, Remote Sensing.

CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations

Youcef Ouerdane, Romain Molina, Pierre Magnan, 2018 .

Comments by the Editors

Heather Quinn, Daniel M. Fleetwood, Vincent Goiffon, 2019 .

Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method

Pierre Magnan, Vincent Goiffon, Cédric Virmontois, 2015, 2015 45th European Solid State Device Research Conference (ESSDERC).

Special NSREC 2018 Issue of the IEEE Transactions on Nuclear Science Comments by the Editors

Heather Quinn, William H. Robinson, Vincent Goiffon, 2019 .

Plasma Antenna Charging in CMOS Image Sensors

Pierre Magnan, Vincent Goiffon, Y. Sacchettini, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

New source of random telegraph signal in CMOS image sensors

Pierre Magnan, Cedric Virmontois, Philippe Martin-Gonthier, 2012 .

CMOS Image Sensors in Harsh Radiation Environments

Vincent Goiffon, 2016 .

Radiation Effects on CMOS Active Pixel Image Sensors

Vincent Goiffon, V. Goiffon, 2015 .

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors †

Shang-Fu Yeh, Vincent Goiffon, Philippe Paillet, 2019, Sensors.

CMOS Image Sensor with on-chip Intelligence for Lightning Detection and Imaging

Romain Molina, Pierre Magnan, Franck Larnaudie, 2012 .

FURHIS project: Development of MGy Radiation‐Hardened Imaging System for ITER remote handling operations

Marco Van Uffelen, Youcef Ouerdane, Pierre Magnan, 2017 .

Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation

Pierre Magnan, Magali Estribeau, Vincent Goiffon, 2009 .

Nuclear background effects on plasma diagnostics for megajoule class laser facility

Pierre Magnan, Sylvain Girard, Matthieu Hamel, 2013, Optics & Photonics - Optical Engineering + Applications.

Special NSREC 2020 Issue of the IEEE Transactions on Nuclear Science Editor Comments

Heather Quinn, Vincent Goiffon, Philippe Paillet, 2021 .

Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests

Romain Molina, Pierre Magnan, Sylvain Girard, 2015, IEEE Transactions on Nuclear Science.

Total-Ionizing Dose Effects on Charge Transfer Efficiency and Image Lag in Pinned Photodiode CMOS Image Sensors

Pierre Magnan, Claude Marcandella, Magali Estribeau, 2018, IEEE Transactions on Nuclear Science.

Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process

Pierre Magnan, Vincent Goiffon, Olivier Saint-Pe, 2009 .

Pierre Magnan, Sylvain Girard, Cedric Virmontois, 2012, IEEE Transactions on Nuclear Science.

Single-Event Effects in CMOS Image Sensors

Pierre Magnan, Vincent Goiffon, Guy Rolland, 2013, IEEE Transactions on Nuclear Science.

Coupled experiment/simulation approach for the design of radiation-hardened rare-earth doped optical fibers and amplifiers

Thierry Robin, Francesco Prudenzano, Sylvain Girard, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

Comparison of Pinning Voltage Estimation Methods in Pinned Photodiode CMOS Image Sensors

Pierre Magnan, Cedric Virmontois, Vincent Goiffon, 2016, IEEE Journal of the Electron Devices Society.

Growth and Decay Kinetics of Radiation-Induced Attenuation in Bulk Optical Materials

Youcef Ouerdane, Sylvain Girard, Aziz Boukenter, 2018, IEEE Transactions on Nuclear Science.

Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides

Pierre Magnan, Sylvain Girard, Claude Marcandella, 2013, IEEE Transactions on Nuclear Science.

Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments

Sylvain Girard, Cedric Virmontois, Vincent Goiffon, 2013, IEEE Transactions on Nuclear Science.

Influence of Pixel Design on Charge Transfer Performances in CMOS Image Sensors

Olivier Marcelot, Pierre Magnan, Magali Estribeau, 2018, IEEE Transactions on Electron Devices.

Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors

Olivier Marcelot, Pierre Magnan, Magali Estribeau, 2014, IEEE Journal of the Electron Devices Society.

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Olivier Marcelot, Pierre Magnan, Robin Scott, 2018, IEEE Transactions on Nuclear Science.

Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors

Alex Materne, Cedric Virmontois, Vincent Goiffon, 2014, IEEE Transactions on Nuclear Science.

Localization of Dark Current Random Telegraph Signal sources in pinned photodiode CMOS Image Sensors

Pierre Magnan, Vincent Goiffon, Cédric Virmontois, 2017, 2017 International Conference on Noise and Fluctuations (ICNF).

Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment

Pierre Magnan, Sylvain Girard, Vincent Goiffon, 2012 .

Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors.

Romain Molina, Pierre Magnan, Vincent Goiffon, 2016, Optics express.

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Romain Molina, Pierre Magnan, Sylvain Girard, 2019, IEEE Transactions on Nuclear Science.

Dark Current Random Telegraph Signals in Solid-State Image Sensors

Pierre Magnan, Sylvain Girard, Cedric Virmontois, 2013, IEEE Transactions on Nuclear Science.

Radiation-Induced Variable Retention Time in Dynamic Random Access Memories

Vincent Goiffon, Philippe Paillet, Jean-Marc Belloir, 2020, IEEE Transactions on Nuclear Science.

Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors

Romain Molina, Pierre Magnan, Magali Estribeau, 2014, IEEE Transactions on Nuclear Science.

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Olivier Marcelot, Pierre Magnan, Robin Scott, 2017, IEEE Transactions on Nuclear Science.

Single Event Effects in 4T Pinned Photodiode Image Sensors

Pierre Magnan, Cedric Virmontois, Vincent Goiffon, 2013, IEEE Transactions on Nuclear Science.