J. Wilde
发表
D. Carl,
T. Seyler,
A. Bertz,
2021,
Optical Metrology.
M. Thoben,
J. Wilde,
X. Xie,
2001,
Microelectronics and reliability.
J. Wilde,
R. Zeiser,
P. Wagner,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
Thomas Stieglitz,
Thomas Guenther,
Christian Henle,
2009
.
A. Andreescu,
S. Fischer,
P. Gromala,
2013,
2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
J. Wilde,
J. Wilde,
M. Gunther,
2012,
2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.