Albert B. Chen

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability

Jiahan Zhang, Yao-Feng Chang, Chris Connor, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

13.2 A 3.6Mb 10.1Mb/mm2 Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V with Sensing Time of 5ns at 0.7V

Pulkit Jain, Fatih Hamzaoglu, Liqiong Wei, 2019, 2019 IEEE International Solid- State Circuits Conference - (ISSCC).