M. E. Thomas

COMPUTER CONTROL WORKSHOP LECTURE NOTES, 1969 JOINT AUTOMATIC CONTROL CONFERENCE, UNIVERSITY OF COLORADO, 4 AUGUST 1969,

C. L. Smith, G. A. Bekey, E. B. Stear, 1969 .

Extraction of defect characteristics for yield estimation using the double bridge test structure

M. E. Thomas, Wojciech Maly, J. Khare, 1991, 1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers.

A Survey of the Stete of the Art in Dynamic Programming

M. E. Thomas, M. Thomas, 1975 .

Extraction of defect size distributions in an IC layer using test structure data

M. E. Thomas, Wojciech Maly, J. Khare, 1994 .