G. May

Tae Seon Kim, G. May, 1998, Proceedings. 4th International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces (Cat. No.98EX153).

Modeling electron mobility in MBE-grown InAs/AlSb thin films for HEMT applications using neural networks

G. May, G. Triplett, A. Brown, 2001, 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497).

An Acoustic Temperature Sensor to Monitor Variable Frequency Microwave Curing of Polymer Dielectrics

G. May, C. Davis, W. Hunt, 2007, 2007 IEEE Sensors.

An acoustic sensor for monitoring microelectronics packaging manufacturing processes

G. May, W. Hunt, S. Pinkett, 2003, IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003..

Optical In-Situ Plasma Process Monitoring Technique for Detection of Abnormal Plasma Discharge

J. H. Ahn, G. May, S. Hong, 2013 .

AFRL-ML-WP-TR-2004-4291 MIXED ANION HETEROSTRUCTURE MATERIALS

G. May, Georgia, Z. L. Wang, 2005 .

Neural Network Modeling of Acid-Catalyzed Degradation of Photosensitive Polycarbonates

G. May, P. Kohl, C. Davis, 2006, 2006 11th International Symposium on Advanced Packaging Materials: Processes, Properties and Interface.

Mixed Anion Heterostructure Materials

G. May, Z. Wang, April Brown, 2004 .

Using neural networks to construct models of the molecular beam epitaxy process

April S. Brown, Gary S. May, G. May, 2000 .

Neural Network Modeling of Anion Exchange using Reflection High-Energy Electron Diffraction Data

G. May, T. Sarmiento, 2005 .

Real-time monitoring of RHEED using machine vision techniques

G. May, R. Bicknell-Tassius, Kyoungnae Lee, 1997 .

Interfacial roughening in lattice-matched GaInP/GaAs heterostructures

Zhong Lin Wang, G. May, T. Brown, 2001 .

Optimization of neural network structure and learning parameters using genetic algorithms

G.S. May, Seung-Soo Han, Seung-Soo Han, 1996, Proceedings Eighth IEEE International Conference on Tools with Artificial Intelligence.

Modeling and optimization of integral capacitor fabrication using neural networks

G. May, G. May, T. Thongvigitmanee, 2000, Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146).

Modeling the growth of PECVD silicon nitride films for solar cell applications using neural networks

Gary S. May, Seung-Soo Han, Li Cai, 1996 .

Fundamentals of Semiconductor Manufacturing and Process Control

Costas J. Spanos, Gary S. May, C. Spanos, 2006 .

In Situ Acoustic Temperature Measurement During Variable-Frequency Microwave Curing

G. May, C. Davis, W. Hunt, 2008, IEEE Transactions on Electronics Packaging Manufacturing.

Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells

DongSeop Kim, Seung Soo Han, Gary S. May, 2007, ISNN.

Using neural networks to model an electromagnetic-actuated microactuator

Gary S. May, Peter J. Hesketh, Yves H. Berthelot, 2007 .

Using Neural Networks for RHEED Modeling of Interfaces in AlGaSb-InAs HEMT Devices

April S. Brown, Gary S. May, Gregory Triplett, 2002 .

Role of neural networks and genetic algorithms in developing intelligent quality controllers for on-line parameter design

Ratna Babu Chinnam, G. S. May, G. May, 2000 .

Optimization of saturation current density of PECVD SiN coated phosphorus diffused emitters using neural network modeling

Ajeet Rohatgi, T. Krygowski, G. May, 1996 .

Optimization of silicon solar cell fabrication based on neural network and genetic programming modeling

Hyun-Soo Kim, Sungshin Kim, Hyeon Bae, 2009, Soft Comput..

Advantages of plasma etch modeling using neural networks over statistical techniques

Gary S. May, C. D. Himmel, G. May, 1993 .

Statistical Experimental Design in Plasma Etch

Costas J. Spanos, Gary S. May, Jiahua Huang, 1991 .

Thermodynamic analysis of anion exchange during heteroepitaxy

G. May, T. Brown, Zhong Lin Wang, 2002 .

Configurations of misfit dislocations at interfaces of lattice-matched Ga0.5In0.5P/GaAs heterostructures

Zhong Lin Wang, G. May, T. Brown, 2000 .

Fundamental reactions controlling anion exchange during mixed anion heterojunction formation : Chemistry and kinetics of P-for-As exchange reaction

G. May, G. Bruno, M. Losurdo, 2006 .

Hybrid neural network modeling of anion exchange at the interfaces of mixed anion III-V heterostructures grown by molecular beam epitaxy

G. May, T. Brown, G.S. May, 2005, IEEE Transactions on Semiconductor Manufacturing.

Fundamental reactions controlling anion exchange during the synthesis of Sb/As mixed-anion heterojunctions

G. May, G. Bruno, M. Losurdo, 2004 .

Advanced process control

Costas J. Spanos, Gary S. May, C. Spanos, 1989 .

Growth of GaN on lithium gallate substrates for development of a GaN thin compliant substrate

G. May, P. Kohl, S. Stock, 1998 .

IEEE Transactions on Semiconductor Manufacturing

Robert W. Dutton, Duane S. Boning, W. Chandler Blvd, 2005 .

Fundamentals of Semiconductor Fabrication

Gary S. May, Simon M. Sze, G. May, 2003 .

Fault Detection and Classification in Plasma Etch Equipment for Semiconductor Manufacturing $e$-Diagnostics

Sang Jeen Hong, Woo Yup Lim, Taesu Cheong, 2012, IEEE Transactions on Semiconductor Manufacturing.

Neural network modeling of fabrication yield using manufacturing data

Z. N. Mevawalla, G. S. May, M. Honjo, 2011, 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Anion exchange at the interfaces of mixed anion III-V heterostructures grown by molecular beam epitaxy

G. May, T. Brown, A. Brown, 2002 .

Neural network based adaptive tracking controller for a reactive ion etching system

G. S. May, Y. Pei, G. May, 2001, Proceedings of the 2001 American Control Conference. (Cat. No.01CH37148).

Use of In-Situ Optical Emission Spectroscopy for Leak Fault Detection and Classification in Plasma Etching

G. May, S. Hong, D. Seo, 2013 .

Neural network modeling of reactive ion etching using optical emission spectroscopy data

Gary S. May, Sang Jeen Hong, G. May, 2003 .

Reactive ion etch modeling using neural networks and simulated annealing

Gary S. May, G. May, B. Kim, 1996 .

Investigation of the properties of plasma-enhanced chemical vapor deposited silicon nitride and its effect on silicon surface passivation

Ajeet Rohatgi, Gary S. May, Min Zou, 1998 .

Modeling the properties of PECVD silicon dioxide films using optimized back-propagation neural networks

Gary S. May, Seung-Soo Han, Paul A. Kohl, 1994 .

Fundamentals of Semiconductor Manufacturing and Process Control: May/Fundamentals of Semiconductor Manufacturing and Process Control

Costas J. Spanos, Gary S. May, C. Spanos, 2006 .

Modeling Component Placement Errors In Surface Mount Technology Using Neural Networks

A. Louis-Charles, G. May, G.S. May, 1997, 1997 Proceedings 47th Electronic Components and Technology Conference.

Neural-network-based sensor fusion of optical emission and mass spectroscopy data for real-time fault detection in reactive ion etching

Gary S. May, Sang Jeen Hong, G. May, 2005, IEEE Transactions on Industrial Electronics.

Statistical Experimental Design

Costas J. Spanos, Gary S. May, C. Spanos, 2006 .

Computer simulation study of the MOCVD growth of titanium dioxide films

G. May, A. Erbil, Z. Nami, 1997 .

Neural Network Modeling for Advanced Process Control Using Production Data

Z N Mevawalla, G S May, M W Kiehlbauch, 2011, IEEE Transactions on Semiconductor Manufacturing.

Neural networks for advanced process control

Z. N. Mevawalla, G. S. May, M. W. Kiehlbauch, 2010, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Process and Equipment Diagnosis

Costas J. Spanos, Gary S. May, C. Spanos, 2006 .

Modeling the plasma enhanced chemical vapor deposition process using neural networks and genetic algorithms

Seung Soo Han, Gary S. May, Seung-Soo Han, 1994, Proceedings Sixth International Conference on Tools with Artificial Intelligence. TAI 94.

Indirect adaptive control of reactive ion etching using neural networks

David Stokes, Gary S. May, G. May, 2001, IEEE Trans. Robotics Autom..

Statistically based parametric yield prediction for integrated circuits

Martin A. Brooke, D. S. Gibson, R. Poddar, 1997 .

Real-time diagnosis of semiconductor manufacturing equipment using a hybrid neural network expert system

Gary S. May, B. Kim, G. May, 1997 .

An optimal neural network process model for plasma etching

Gary S. May, Byungwhan Kim, G. May, 1994 .

Fabrication of a Real Time Reactive Ion Etching Resonant Sensor Using a Low Temperature Sacrificial Polymer

G. May, P. Joseph, B. G. Morris, 2007 .

In-situ prediction of reactive ion etch endpoint using neural networks

Gary S. May, C. D. Himmel, G. May, 1995 .

Real-time predictive control of semiconductor manufacturing processes using neural networks

G. S. May, E. W. Kamen, C. D. Himmel, 1995, Proceedings of 1995 American Control Conference - ACC'95.

Neural network based time series modeling of optical emission spectroscopy data for fault detection in reactive ion etching

Sang Jeen Hong, Gary Stephen May, G. May, 2003, SPIE Advanced Lithography.

Time series modeling of reactive ion etching using neural networks

Gary S. May, M. D. Baker, C. D. Himmel, 1995 .

Statistical experimental design for MBE process characterization

G. May, R. Bicknell-Tassius, G. Dagnall, 1996, Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium.