D. Yaney

A meta-stable leakage phenomenon in DRAM charge storage —Variable hold time

D. Yaney, C. Lu, R. Kohler, 1987, 1987 International Electron Devices Meeting.

Alpha particle tracks in silicon and their effect on dynamic MOS RAM reliability

D. Yaney, J. T. Nelson, L. L. Vanskike, 1978, 1978 International Electron Devices Meeting.

Short-channel effects in MOSFET's

D.S. Yaney, D. Yaney, C. W. Pearce, 1985, IEEE Electron Device Letters.