D. B. Cunff

发表

Use of optical metrology for wafer level packaging of CMOS image sensor

E. Deloffre, C. Euvrard, D. Le Cunff, 2010, 2010 IEEE International 3D Systems Integration Conference (3DIC).

Reconstruction and stoichiometry of CdTe(001) surfaces: a grazing incidence X-ray diffraction and reflection high energy electron diffraction study

D. B. Cunff, M. Véron, V. Etgens, 1996 .

Low Schottky barrier height contacts to n‐CdTe using rare‐earth metals

D. B. Cunff, B. Daudin, 1996 .

Ohmic contacts on n‐type CdTe and CdZnTe using coherently grown neodymium

D. B. Cunff, J. Rouviere, B. Daudin, 1996 .

Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs

D. B. Cunff, D. Benoit, A. Claverie, 2020, Journal of Applied Crystallography.

Benefits of XPS nanocharacterization for process development and industrial control of thin SiGe channel layers in advanced CMOS technologies

D. B. Cunff, J. Hartmann, T. Baron, 2017 .

Simultaneous optical measurement of Ge-content and carbon doping in strained epitaxial SiGe films

D. B. Cunff, D. Dutartre, D. Ristoiu, 2006 .

Simultaneous optical measurement of Ge content and carbon doping in strained epitaxial SiGe films

D. B. Cunff, D. Dutartre, D. Ristoiu, 2005 .

Anisotropic relaxation during the first stages of the growth of ZnTe/(001) CdTe strained layers studied by reflection high energy electron diffraction

D. B. Cunff, J. Eymery, N. Boudet, 1995 .

Stoichiometry determination of the Te-rich (100) CdTe and (100) ZnTe surfaces

D. B. Cunff, B. Daudin, S. Tatarenko, 1996 .

Zn and Te desorption from the (100) ZnTe surface

Serge Tatarenko, D. B. Cunff, B. Daudin, 1995 .

Combining Full Wafer Inspection with Deep Learning to Recognize Wafers with Critical Defects

Anil Bora Yayak, D. B. Cunff, Tamás Sipőcz, 2023, 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Hybridization of ellipsometry and energy loss spectra from XPS for bandgap and optical constants determination in SiON thin films

D. B. Cunff, D. Fuard, B. Pélissier, 2021, Materials Chemistry and Physics.

Comparison of two techniques for measurement of in vitro killing kinetics of five antibiotics againstPseudomonas aeruginosa

D. B. Cunff, J. Petit, B. Burghoffer, 1994, European Journal of Clinical Microbiology and Infectious Diseases.

Compact electron cyclotron resonance plasma source for molecular beam epitaxy applications

D. B. Cunff, A. Barski, B. Daudin, 1996 .

Control of 3D IC process steps by optical metrologies

D. B. Cunff, G. Fresquet, Th. Raymond, 2015 .