T. Schram

发表

Naoto Horiguchi, Y. Son, Tom Schram, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

R. Ritzenthaler, T. Schram, N. Horiguchi, 2013 .

T. Schram, A. Veloso, M. Jurczak, 2008, 2008 Symposium on VLSI Technology.

A. Hikavyy, G. Mannaert, T. Schram, 2011, 2011 International Electron Devices Meeting.

H. Mertens, R. Ritzenthaler, A. Hikavyy, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

S. De Gendt, L. Pantisano, A. Kerber, 2003, IEEE International Electron Devices Meeting 2003.

Tom Schram, Malgorzata Jurczak, Pieter Blomme, 2010, 2010 Symposium on VLSI Technology.

S. Chew, T. Schram, A. Veloso, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

N. Horiguchi, T. Schram, P. Matagne, 2016, 2016 IEEE Symposium on VLSI Technology.

T. Schram, O. Richard, H. Bender, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

S. De Gendt, N. Collaert, W. Boullart, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..

Paul Zimmerman, Tom Schram, Stefan De Gendt, 2005 .

B. Parvais, S. Biesemans, T. Schram, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

R. Ritzenthaler, T. Schram, N. Horiguchi, 2018, IEEE Transactions on Electron Devices.

A. Hikavyy, E. Rosseel, T. Schram, 2010, 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP).

N. Collaert, J. Mitard, M. Jurczak, 2011, Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.

R. Ritzenthaler, T. Schram, N. Horiguchi, 2014, 2014 IEEE Workshop On Microelectronics And Electron Devices (WMED).

H. Mertens, T. Schram, D. Linten, 2019, 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).

R. Ritzenthaler, T. Schram, N. Horiguchi, 2018, Semiconductor Science and Technology.

R. Ritzenthaler, T. Schram, A. Chasin, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

T. Schram, M. Jurczak, J. van Houdt, 2010, 2010 IEEE International Memory Workshop.

T. Schram, C. Adelmann, L. Ragnarsson, 2011 .

T. Schram, H. Dekkers, N. Horiguchi, 2018, Journal of Applied Physics.

T. Schram, O. Richard, G. Pourtois, 2009 .

T. Schram, C. Adelmann, V. Paraschiv, 2010, Proceedings of 2010 International Symposium on VLSI Technology, System and Application.

T. Schram, K. Barla, N. Horiguchi, 2016, IEEE Electron Device Letters.

B. Parvais, A. Brand, N. Horiguchi, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

S. Chew, T. Schram, K. Devriendt, 2012, Symposium on VLSI Technology.

T. Schram, B. O’Sullivan, T. Witters, 2007, ECS Transactions.

L. Pantisano, G. Groeseneken, A. Kerber, 2003, IEEE Electron Device Letters.

Naoto Horiguchi, Tom Schram, Nadine Collaert, 2016, IEEE Transactions on Electron Devices.

T. Schram, A. Veloso, G. Pourtois, 2005 .

E. Simoen, C. Claeys, R. Ritzenthaler, 2015, 2015 International Conference on Noise and Fluctuations (ICNF).

R. Ritzenthaler, T. Schram, N. Horiguchi, 2015, 2015 China Semiconductor Technology International Conference.

Naoto Horiguchi, Wilfried Vandervorst, Tom Schram, 2014, IEEE Transactions on Electron Devices.

R. Ritzenthaler, T. Schram, N. Horiguchi, 2014, 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Naoto Horiguchi, Eddy Simoen, Aaron Thean, 2013, 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

S. Van Elshocht, A. Akheyar, S. Biesemans, 2008, IEEE Electron Device Letters.

T. Schram, I. Radu, D. Jang, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

J. Woicik, S. Chew, T. Schram, 2014 .

Tom Schram, J. Chen, K. Henson, 2005, Microelectron. Reliab..

Naoto Horiguchi, Aaron Thean, Tom Schram, 2014, IEEE Electron Device Letters.

E. Rosseel, T. Schram, S. Demuynck, 2015, IEEE Electron Device Letters.

S. De Gendt, S. Van Elshocht, L. Pantisano, 2006, IEEE Transactions on Electron Devices.

E. Augendre, A. Veloso, S. Biesemans, 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..

R. Ritzenthaler, T. Schram, N. Horiguchi, 2017, 2017 International Conference on Noise and Fluctuations (ICNF).

Jacopo Franco, Tom Schram, Marc Aoulaiche, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

T. Schram, K. Devriendt, I. Radu, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

R. Degraeve, B. Kaczer, A. Akheyar, 2009, 2009 IEEE International Reliability Physics Symposium.

Cedric Huyghebaert, Tom Schram, Dennis Lin, 2017, 2017 47th European Solid-State Device Research Conference (ESSDERC).

T. Schram, R. Degraeve, G. Groeseneken, 2012, IEEE Transactions on Device and Materials Reliability.

H. Mertens, Z. Tao, T. Schram, 2021, International Electron Devices Meeting.

T. Schram, G. Kar, B. Kaczer, 2023, 2023 IEEE International Reliability Physics Symposium (IRPS).

Naoto Horiguchi, Jérôme Mitard, P. Eyben, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

A. Jourdain, G. Beyer, E. Beyne, 2022, IEEE Transactions on Electron Devices.

A. Jourdain, G. Beyer, E. Beyne, 2022, 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).

S. De Gendt, G. Groeseneken, B. Kaczer, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

T. Schram, A. Milenin, S. Baudot, 2018, 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Z. Li, Luigi Pantisano, Tom Schram, 2007, Microelectron. Reliab..

Tom Schram, Stefan De Gendt, Johan Vertommen, 2003 .

R. Ritzenthaler, T. Schram, N. Horiguchi, 2016 .

Naoto Horiguchi, Jerome Mitard, Eddy Simoen, 2016, IEEE Transactions on Electron Devices.

H. Bender, G. Eneman, N. Horiguchi, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

R. Ritzenthaler, T. Schram, N. Horiguchi, 2019, ECS Journal of Solid State Science and Technology.

D. Mocuta, R. Ritzenthaler, W. Vandervorst, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).