N. Horiguchi
发表
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2016,
2016 IEEE Symposium on VLSI Technology.
N. Horiguchi,
L. Ragnarsson,
T. Grasser,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Jie Ding,
A. Asenov,
Naoto Horiguchi,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
N. Horiguchi,
B. Kaczer,
A. Asenov,
2014,
IEEE Transactions on Electron Devices.
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Y. Son,
Tom Schram,
2015,
2015 International Conference on IC Design & Technology (ICICDT).
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2013
.
N. Horiguchi,
T. Yamamoto,
S. Satoh,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
T. Schram,
N. Horiguchi,
A. Thean,
2016,
2016 IEEE Symposium on VLSI Technology.
A. Hikavyy,
H. Bender,
N. Horiguchi,
2011,
2011 International Electron Devices Meeting.
B. Douhard,
N. Horiguchi,
M. Togo,
2011,
2011 International Electron Devices Meeting.
A. Hikavyy,
G. Mannaert,
T. Schram,
2011,
2011 International Electron Devices Meeting.
A. Hikavyy,
H. Dekkers,
N. Horiguchi,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
N. Horiguchi,
N. Collaert,
A. Veloso,
2011
.
N. Horiguchi,
B. Parvais,
T. Hoffmann,
2011,
2011 IEEE ICMTS International Conference on Microelectronic Test Structures.
S. Chew,
T. Schram,
K. Devriendt,
2014
.
Naoto Horiguchi,
Geert Hellings,
Niamh Waldron,
2012
.
N. Horiguchi,
T. Grasser,
B. Kaczer,
2011,
2011 International Reliability Physics Symposium.
N. Horiguchi,
T. Grasser,
M. Waltl,
2017,
IEEE Transactions on Electron Devices.
N. Horiguchi,
T. Grasser,
M. Waltl,
2017,
IEEE Transactions on Electron Devices.
N. Horiguchi,
T. Grasser,
M. Waltl,
2016,
2016 IEEE Symposium on VLSI Technology.
N. Horiguchi,
R. Degraeve,
T. Grasser,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects
N. Horiguchi,
T. Grasser,
G. Rzepa,
2016,
International Integrated Reliability Workshop.
Christopher J. Wilson,
B. T. Chan,
H. Mertens,
2020,
IEEE Transactions on Electron Devices.
A. Chasin,
N. Horiguchi,
N. Collaert,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
R. Ritzenthaler,
N. Horiguchi,
2021
.
H. Mertens,
R. Ritzenthaler,
N. Horiguchi,
2020,
2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
D. Mocuta,
N. Horiguchi,
A. Veloso,
2020,
Solid-State Electronics.
D. Mocuta,
N. Horiguchi,
A. Veloso,
2019,
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
N. Horiguchi,
T. Schram,
P. Matagne,
2016,
2016 IEEE Symposium on VLSI Technology.
Naoto Horiguchi,
Jerome Mitard,
Liesbeth Witters,
2017
.
A. Hikavyy,
N. Horiguchi,
L. Ragnarsson,
2011,
2011 International Electron Devices Meeting.
A. Hikavyy,
N. Horiguchi,
A. Thean,
2012,
2012 Symposium on VLSI Technology (VLSIT).
N. Horiguchi,
A. Thean,
C. Merckling,
2012,
2012 International Silicon-Germanium Technology and Device Meeting (ISTDM).
A. Hikavyy,
A. De Keersgieter,
O. Richard,
2012,
2012 International Electron Devices Meeting.
N. Horiguchi,
N. Collaert,
H. Arimura,
2020,
IEEE Transactions on Electron Devices.
N. Horiguchi,
H. Arimura,
E. Simoen,
2020,
IEEE Transactions on Electron Devices.
K. Wostyn,
H. Dekkers,
D. Mocuta,
2019,
IEEE Transactions on Electron Devices.
N. Horiguchi,
L. Ragnarsson,
G. Rzepa,
2019,
IEEE Journal of the Electron Devices Society.
A. Chasin,
N. Horiguchi,
A. Thean,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
A. Hikavyy,
N. Horiguchi,
A. Thean,
2013
.
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
Naoto Horiguchi,
Dimitri Linten,
Jacopo Franco,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Geert Hellings,
Jerome Mitard,
2014,
IEEE Transactions on Electron Devices.
R. Ritzenthaler,
N. Horiguchi,
A. Thean,
2013
.
G. Bouche,
J. Ryckaert,
D. Mocuta,
2018,
2018 IEEE Symposium on VLSI Technology.
N. Horiguchi,
M. Togo,
B. Lee,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
N. Horiguchi,
N. Collaert,
J. Mitard,
2019,
IEEE Transactions on Electron Devices.
N. Horiguchi,
N. Collaert,
A. Veloso,
2018
.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2018,
IEEE Transactions on Electron Devices.
K. B. Noh,
R. Ritzenthaler,
T. Schram,
2014
.
N. Horiguchi,
A. Veloso,
E. Simoen,
2013,
IEEE Transactions on Electron Devices.
N. Horiguchi,
A. Thean,
A. Veloso,
2013,
ACS applied materials & interfaces.
Xiaoshi Zhang,
Henry C. Kapteyn,
Margaret M. Murnane,
2018,
Advanced Lithography.
T. Schram,
H. Dekkers,
N. Horiguchi,
2018
.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2020,
IEEE Transactions on Device and Materials Reliability.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
N. Horiguchi,
N. Yokoyama,
Y. Nakata,
1997
.
G. Mannaert,
D. Mocuta,
N. Horiguchi,
2019,
Solid-State Electronics.
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2021,
2021 Symposium on VLSI Technology.
K. B. Noh,
M. Kim,
S. Chew,
2013,
2013 IEEE International Electron Devices Meeting.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2014,
2014 IEEE Workshop On Microelectronics And Electron Devices (WMED).
N. Horiguchi,
J. Mitard,
T. Chiarella,
2020,
IEEE Transactions on Electron Devices.
A. De Keersgieter,
N. Horiguchi,
N. Collaert,
2010,
2010 Symposium on VLSI Technology.
R. Ritzenthaler,
N. Horiguchi,
B. Kaczer,
2013,
IEEE Electron Device Letters.
E. Simoen,
R. Ritzenthaler,
N. Horiguchi,
2014,
2014 IEEE International Electron Devices Meeting.
Can we optimize the gate oxide quality of DRAM input/output pMOSFETs by a post-deposition treatment?
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2018,
Semiconductor Science and Technology.
Naoto Horiguchi,
Dimitri Linten,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2020,
IEEE Transactions on Device and Materials Reliability.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2017
.
R. Ritzenthaler,
T. Schram,
A. Chasin,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
N. Horiguchi,
T. Chiarella,
Y. Kikuchi,
2017,
IEEE Transactions on Electron Devices.
N. Horiguchi,
A. Veloso,
V. Paraschiv,
2014
.
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2018,
2018 IEEE Symposium on VLSI Technology.
N. Horiguchi,
N. Yokoyama,
A. Nakajima,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2016
.
N. Horiguchi,
A. Veloso,
E. Simoen,
2020,
IEEE Transactions on Electron Devices.
N. Horiguchi,
A. Thean,
A. Veloso,
2013,
IEEE Transactions on Electron Devices.
N. Horiguchi,
N. Jourdan,
J. Maes,
2022,
2022 IEEE International Interconnect Technology Conference (IITC).
A. Hikavyy,
S. Chew,
E. Rosseel,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
N. Horiguchi,
A. Veloso,
V. Paraschiv,
2013,
2013 22nd International Conference on Noise and Fluctuations (ICNF).
D. Mocuta,
N. Horiguchi,
N. Collaert,
2019,
IEEE Electron Device Letters.
T. Schram,
H. Dekkers,
N. Horiguchi,
2018,
Journal of Applied Physics.
K. Barla,
N. Horiguchi,
A. Thean,
2016
.
R. Ritzenthaler,
A. Chasin,
N. Horiguchi,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Liesbeth Witters,
Aaron Thean,
2015
.
T. Schram,
K. Barla,
N. Horiguchi,
2016,
IEEE Electron Device Letters.
A. Hikavyy,
E. Rosseel,
K. Devriendt,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
A. De Keersgieter,
G. Mannaert,
2019,
2019 Symposium on VLSI Technology.
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2016,
2016 IEEE Symposium on VLSI Technology.
D. Mocuta,
N. Horiguchi,
N. Collaert,
2017,
IEEE Transactions on Electron Devices.
N. Horiguchi,
N. Yokoyama,
Y. Nakata,
1995,
Proceedings of International Electron Devices Meeting.
N. Horiguchi,
Y. Awano,
N. Yokoyama,
1998
.
H. Mertens,
R. Ritzenthaler,
M. Kim,
2018,
International Electron Devices Meeting.
N. Horiguchi,
D. Linten,
M. Ker,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Parvais,
A. Brand,
N. Horiguchi,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
S. Chew,
T. Schram,
K. Devriendt,
2013
.
S. Chew,
T. Schram,
K. Devriendt,
2012,
Symposium on VLSI Technology.
Tom Schram,
Anabela Veloso,
S. A. Chew,
2013
.
Naoto Horiguchi,
Tom Schram,
Farid Sebaai,
2018
.
N. Horiguchi,
A. Veloso,
V. Paraschiv,
2013,
2013 IEEE International Conference of Electron Devices and Solid-state Circuits.
E. Simoen,
C. Claeys,
N. Horiguchi,
2012,
IEEE Electron Device Letters.
Naoto Horiguchi,
Tom Schram,
Nadine Collaert,
2016,
IEEE Transactions on Electron Devices.
S. Chew,
D. Mocuta,
N. Horiguchi,
2018,
2018 18th International Workshop on Junction Technology (IWJT).
Naoto Horiguchi,
Nadine Collaert,
Daeyong Kim,
2016,
IEEE Transactions on Electron Devices.
Christina L. Porter,
Charles S. Bevis,
Robert M. Karl,
2021,
Science Advances.
B. Kaczer,
T. Grasser,
D. Linten,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
N. Horiguchi,
M. Togo,
W. Vandervorst,
2012,
2012 Symposium on VLSI Technology (VLSIT).
Naoto Horiguchi,
Liesbeth Witters,
Andriy Hikavyy,
2017
.
N. Horiguchi,
N. Yokoyama,
A. Nakajima,
1997
.
N. Horiguchi,
N. Yokoyama,
O. Ueda,
1996
.
Naoto Horiguchi,
Anabela Veloso,
Nadine Collaert,
2017
.
N. Horiguchi,
L. Ragnarsson,
J. Mitard,
2021,
International Electron Devices Meeting.
F. M. Bufler,
H. Mertens,
R. Ritzenthaler,
2018,
IEEE Electron Device Letters.
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
E. Simoen,
C. Claeys,
R. Ritzenthaler,
2015,
2015 International Conference on Noise and Fluctuations (ICNF).
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2015,
2015 China Semiconductor Technology International Conference.
Naoto Horiguchi,
Wilfried Vandervorst,
Tom Schram,
2014,
IEEE Transactions on Electron Devices.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2014,
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Naoto Horiguchi,
Eddy Simoen,
Aaron Thean,
2013,
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
Naoto Horiguchi,
Naoki Yokoyama,
Tatsuya Usuki,
1998
.
A. Jourdain,
A. De Keersgieter,
N. Horiguchi,
2022,
ECS Meeting Abstracts.
A. Brand,
P. Eyben,
L. Witters,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
A. Hikavyy,
E. Rosseel,
B. Douhard,
2019,
ECS Transactions.
Naoto Horiguchi,
Yu-Long Jiang,
Nadine Collaert,
2017,
IEEE Electron Device Letters.
J. Ryckaert,
D. Verkest,
P. Weckx,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
M. H. van der Veen,
S. Demuynck,
N. Horiguchi,
2020,
2020 IEEE International Interconnect Technology Conference (IITC).
N. Horiguchi,
L. Ragnarsson,
B. Parvais,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
N. Horiguchi,
L. Ragnarsson,
B. Kaczer,
2018,
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
A. Hikavyy,
K. Wostyn,
G. Mannaert,
2014
.
Naoto Horiguchi,
Geert Hellings,
Anabela Veloso,
2013
.
J. Woicik,
S. Chew,
T. Schram,
2014
.
N. Horiguchi,
A. Veloso,
E. Simoen,
2020,
IEEE Electron Device Letters.
F. M. Bufler,
N. Horiguchi,
P. Matagne,
2022,
IEEE Transactions on Electron Devices.
Naoto Horiguchi,
Dimitri Linten,
Jacopo Franco,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Naoto Horiguchi,
Aaron Thean,
Tom Schram,
2014,
IEEE Electron Device Letters.
Anh Khoa Augustin Lu,
N. Horiguchi,
N. Collaert,
2018,
ECS Journal of Solid State Science and Technology.
E. Rosseel,
S. Demuynck,
K. Barla,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
N. Horiguchi,
D. Linten,
2019,
IEEE Transactions on Device and Materials Reliability.
A. Hikavyy,
S. Chew,
G. Mannaert,
2017,
2017 IEEE International Interconnect Technology Conference (IITC).
S. Demuynck,
K. Barla,
N. Horiguchi,
2016,
2016 16th International Workshop on Junction Technology (IWJT).
E. Rosseel,
T. Schram,
S. Demuynck,
2015,
IEEE Electron Device Letters.
A. Mercha,
D. Verkest,
M. Badaroglu,
2012,
International Electron Devices Meeting.
S. Chew,
E. Rosseel,
S. Demuynck,
2016,
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC).
A. Vandooren,
Naoto Horiguchi,
Dimitri Linten,
2021,
2021 International Conference on IC Design and Technology (ICICDT).
J. Ryckaert,
D. Verkest,
M. Badaroglu,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
S. Chew,
E. Rosseel,
2016,
2016 IEEE Symposium on VLSI Technology.
D. Mocuta,
N. Horiguchi,
N. Collaert,
2018,
IEEE Electron Device Letters.
S. Demuynck,
N. Horiguchi,
Zsolt Tkei,
2008
.
Replacement Metal Contact Using Sacrificial ILD0 for Wrap Around Contact in Scaled FinFET Technology
S. Chew,
K. Devriendt,
S. Demuynck,
2018,
2018 IEEE International Interconnect Technology Conference (IITC).
Diederik Verkest,
Naoto Horiguchi,
Aaron Thean,
2014,
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference.
A. Hikavyy,
E. Rosseel,
B. Douhard,
2020,
ECS Meeting Abstracts.
Gian Francesco Lorusso,
Naoto Horiguchi,
Christopher J. Wilson,
2017,
Advanced Lithography.
H. Mertens,
R. Ritzenthaler,
N. Horiguchi,
2020,
Applied Sciences.
D. Mocuta,
H. Bender,
R. Ritzenthaler,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Naoto Horiguchi,
Yu-Long Jiang,
Nadine Collaert,
2018,
IEEE Transactions on Electron Devices.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2017,
2017 International Conference on Noise and Fluctuations (ICNF).
R. Ritzenthaler,
A. Hikavyy,
G. Mannaert,
2012,
2012 International Electron Devices Meeting.
H. Mertens,
N. Horiguchi,
Y. Oniki,
2022,
Advanced Etch Technology and Process Integration for Nanopatterning XI.
H. Mertens,
A. Chasin,
N. Horiguchi,
2020,
ECS Meeting Abstracts.
H. Mertens,
N. Horiguchi,
M. Sendelbach,
2018
.
H. Mertens,
A. Hikavyy,
K. Wostyn,
2018,
Solid State Phenomena.
A. Hikavyy,
G. Mannaert,
E. Rosseel,
2016
.
Geert Vandenberghe,
Diederik Verkest,
Naoto Horiguchi,
2014,
Advanced Lithography.
K. Wostyn,
D. Mocuta,
N. Horiguchi,
2019,
2019 Symposium on VLSI Technology.
E. Beyne,
N. Horiguchi,
I. Radu,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
Byoung Hun Lee,
L. Pantisano,
T. Chiarella,
2012,
IEEE Electron Device Letters.
N. Horiguchi,
L. Ragnarsson,
J. Mitard,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
H. Mertens,
R. Ritzenthaler,
Z. Tao,
2020,
2020 IEEE Symposium on VLSI Technology.
Naoto Horiguchi,
Jérôme Mitard,
P. Eyben,
2016,
2016 46th European Solid-State Device Research Conference (ESSDERC).
Massimo Alioto,
Naoto Horiguchi,
Guido Groeseneken,
2012,
IEEE Transactions on Circuits and Systems II: Express Briefs.
B. Kaczer,
L. Witters,
N. Waldron,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
Diederik Verkest,
Naoto Horiguchi,
Aaron Thean,
2015,
2015 IEEE Custom Integrated Circuits Conference (CICC).
A. Jourdain,
G. Beyer,
E. Beyne,
2022,
IEEE Transactions on Electron Devices.
A. Jourdain,
G. Beyer,
E. Beyne,
2021,
2021 Symposium on VLSI Technology.
A. Jourdain,
N. Horiguchi,
A. Veloso,
2021,
Electrical Overstress/Electrostatic Discharge Symposium.
H. Mertens,
K. Devriendt,
J. Geypen,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
E. Simoen,
E. Vecchio,
H. Bender,
2013,
2013 Symposium on VLSI Technology.
H. Mertens,
N. Horiguchi,
A. Veloso,
2022,
Advanced Lithography.
Naoto Horiguchi,
Julien Ryckaert,
Pieter Weckx,
2021
.
J. Ryckaert,
T. Chiarella,
N. Horiguchi,
2020,
2020 IEEE Symposium on VLSI Technology.
H. Mertens,
Z. Tao,
N. Horiguchi,
2023,
Advanced Lithography.
H. Mertens,
Z. Tao,
G. Mannaert,
2022,
Advanced Lithography.
N. Horiguchi,
N. Jourdan,
N. Heylen,
2022,
International Interconnect Technology Conference.
A. Jourdain,
G. Beyer,
E. Beyne,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
H. Mertens,
Z. Tao,
K. Devriendt,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
A. Jourdain,
E. Beyne,
A. De Keersgieter,
2022,
International Electron Devices Meeting.
H. Mertens,
A. Hikavyy,
Z. Tao,
2023,
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
H. Mertens,
R. Ritzenthaler,
A. Hikavyy,
2022,
2022 International Electron Devices Meeting (IEDM).
Naoto Horiguchi,
Alessio Spessot,
Eugenio Dentoni Litta,
2021
.
D. Tsvetanova,
N. Horiguchi,
J. Ryckaert,
2022,
International Electron Devices Meeting.
A. Jourdain,
A. Hikavyy,
G. Mannaert,
2022,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
A. Hikavyy,
G. Mannaert,
E. Rosseel,
2020,
2020 IEEE Symposium on VLSI Technology.
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
N. Horiguchi,
L. Ragnarsson,
J. Mitard,
2020,
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Naoto Horiguchi,
Eddy Simoen,
Anabela Veloso,
2014
.
Naoto Horiguchi,
Philippe Roussel,
Guido Groeseneken,
2013,
IEEE Transactions on Electron Devices.
A. Vais,
N. Collaert,
N. Horiguchi,
2019,
Advanced Lithography.
H. Dekkers,
N. Horiguchi,
N. Collaert,
2019,
IEEE Transactions on Device and Materials Reliability.
A. Hikavyy,
A. De Keersgieter,
N. Horiguchi,
2021,
IEEE Transactions on Electron Devices.
A. Hikavyy,
E. Rosseel,
N. Horiguchi,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
A. De Keersgieter,
N. Horiguchi,
2020,
ECS Meeting Abstracts.
A. Hikavyy,
A. De Keersgieter,
H. Bender,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
N. Horiguchi,
A. Veloso,
2023,
International Workshop on Junction Technology.
A. Jourdain,
A. Hikavyy,
N. Horiguchi,
2022,
International Conference on IC Design & Technology.
R. Ritzenthaler,
G. Mannaert,
H. Dekkers,
2013,
2013 Symposium on VLSI Technology.
F. M. Bufler,
H. Mertens,
R. Ritzenthaler,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
O. Richard,
N. Horiguchi,
K. Vandersmissen,
2023,
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2017,
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