C. Auth
发表
P. Bai,
C. Auth,
S. Balakrishnan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
C. Auth,
A. Murthy,
R. Shaheed,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
R. Chau,
C. Auth,
M. Bost,
2007,
2007 IEEE International Electron Devices Meeting.
C. Auth,
M. Bost,
V. Chikarmane,
2012,
2012 Symposium on VLSI Technology (VLSIT).
R. Chau,
C. Auth,
C. Kenyon,
2004,
IEEE Transactions on Electron Devices.
P. Bai,
C. Auth,
R. Heussner,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
P. Bai,
C. Auth,
V. Chikarmane,
2002,
Digest. International Electron Devices Meeting,.
M. Silberstein,
C. Auth,
M. Bost,
2003,
IEEE International Electron Devices Meeting 2003.
C. Auth,
L. Shifren,
K. Mistry,
2008,
2008 Symposium on VLSI Technology.
R. Kotlyar,
P. Matagne,
C. Auth,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
C. Auth,
S. Natarajan,
K. Mistry,
2014,
2014 IEEE International Reliability Physics Symposium.
C. Auth,
V. Chikarmane,
R. Heussner,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
M. Bohr,
S. Sivakumar,
Y. El-Mansy,
2004,
IEEE Electron Device Letters.
J. Hicks,
J. Shin,
Gerald S. Leatherman,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Chris Auth,
C. Auth,
2012,
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference.
N. Seifert,
S. Chugh,
B. Orr,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
C. Auth,
Adithya Shankar,
2023,
IEEE Solid-State Circuits Magazine.
A. Rahman,
S. Ramey,
C. Auth,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
S. Natarajan,
M. Agostinelli,
C. Tsai,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Peng Zheng,
Ying Zhang,
Simeon Realov,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
Chris Auth,
C. Auth,
2008,
2008 IEEE Custom Integrated Circuits Conference.