S. Lee
发表
P. Bai,
C. Auth,
S. Balakrishnan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Kinam Kim,
S. Lee,
S.J. Ahn,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
S. Lee,
I. Baek,
S.O. Park,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
Mark Y. Liu,
M. Bost,
R. Brain,
2008,
2008 IEEE International Electron Devices Meeting.
Kinam Kim,
S. Lee,
S.J. Ahn,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
J. Kim,
Kinam Kim,
S. Lee,
2006,
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..
P. Bai,
C. Auth,
R. Heussner,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
S.Y. Lee,
S.J. Ahn,
Kinam Kim,
2003,
IEEE International Electron Devices Meeting 2003.
S.H. Hong,
C.H. Cho,
D.J. Lee,
2002,
Digest. International Electron Devices Meeting,.
U-In Chung,
Y.T. Kim,
S.Y. Lee,
2003,
IEEE International Electron Devices Meeting 2003.
J. Jopling,
J. Neirynck,
H. Deshpande,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
Kinam Kim,
E.Y. Lee,
S. Lee,
2004,
IEEE Transactions on Magnetics.
N. Seifert,
S. Chugh,
B. Orr,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).