B. Gleixner

Data Retention Characterization of Phase-Change Memory Arrays

B. Gleixner, A. Pirovano, J. Sarkar, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

A 90nm Phase Change Memory Technology for Stand-Alone Non-Volatile Memory Applications

B. Gleixner, A. Pirovano, R. Bez, 2006, 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..

Reliability characterization of Phase Change Memory

B. Gleixner, R. Bez, F. Pellizzer, 2009, 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS).

Evolution of phase change memory characteristics with operating cycles: Electrical characterization and physical modeling

B. Gleixner, J. Sarkar, J. Sarkar, 2007 .

Electrical characterization of anomalous cells in phase change memory arrays

D. Ielmini, R. Bez, A. Pirovano, 2006, 2006 International Electron Devices Meeting.