J. Cluzel
发表
J. Guy,
G. Molas,
E. Vianello,
2013,
2013 IEEE International Electron Devices Meeting.
A. Toffoli,
J. Cluzel,
O. Faynot,
2010,
2010 Symposium on VLSI Technology.
J. Cluzel,
S. Deleonibus,
D. Mariolle,
2003
.
C. Cagli,
C. Carabasse,
J. Nodin,
2011,
2011 International Electron Devices Meeting.
C. Cagli,
C. Carabasse,
J. Nodin,
2013
.
J. Nodin,
J. Cluzel,
A. Roule,
2009,
2009 IEEE International Memory Workshop.
J. Cluzel,
M. Charles,
G. Ghibaudo,
2020,
IEEE Transactions on Electron Devices.
J. Cluzel,
F. Andrieu,
S. Cristoloveanu,
2015,
IEEE Electron Device Letters.
J. Cluzel,
D. Louis,
M. Assous,
2002
.
J. Cluzel,
G. Reimbold,
Y. Morand,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
J. Cluzel,
G. Reimbold,
Y. Morand,
2001
.
Interface states characterization in heterojunction solar cells from CV-GV measurements and modeling
J. Cluzel,
X. Garros,
G. Reimbold,
2011
.
J. Cluzel,
D. Mariolle,
V. Jousseaume,
2021
.
J. Cluzel,
C. Soulié,
R. Cohen,
1976,
Biophysical Chemistry.
X. Garros,
J. Cluzel,
F. Cacho,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
J. Cluzel,
G. Ghibaudo,
X. Garros,
2020,
IEEE Electron Device Letters.
J. Cluzel,
O. Louveau,
M. Fayolle,
2003
.
J. Cluzel,
Veronique Sousa,
H. Scherrer,
2005
.
J. Cluzel,
C. Leroux,
M. Charles,
2021
.
A. Toffoli,
J. Cluzel,
J. Hartmann,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
J. Cluzel,
G. Ghibaudo,
R. Modica,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Sorin Cristoloveanu,
Maryline Bawedin,
Francois Andrieu,
2016,
IEEE Transactions on Electron Devices.
J. Cluzel,
G. Ghibaudo,
R. Modica,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
J. Cluzel,
G. Ghibaudo,
R. Modica,
2021,
IEEE Transactions on Electron Devices.
J. Cluzel,
Gaudenzio Meneghesso,
Romain Gwoziecki,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
L. Gerrer,
Florian Cacho,
D. Roy,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Guillaume Bourgeois,
Julien Garrione,
Jacques Cluzel,
2019,
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).
O. Faynot,
P. Batude,
M. Vinet,
2010,
2010 International Electron Devices Meeting.