J. Jordan-Sweet

发表

Phase change materials and their application to random access memory technology

R. Shelby, S. Raoux, J. Jordan-Sweet, 2008 .

Effect of Al and Cu doping on the crystallization properties of the phase change materials SbTe and GeSb

A. Kellock, S. Raoux, J. Jordan-Sweet, 2007 .

Direct observation of amorphous to crystalline phase transitions in nanoparticle arrays of phase change materials

Dolores C. Miller, C. Rettner, A. Kellock, 2007 .

Solution-phase deposition and nanopatterning of GeSbSe phase-change materials.

R. Shelby, S. Raoux, J. Jordan-Sweet, 2007, Nature materials.

Phase change nanodot arrays fabricated using a self-assembly diblock copolymer approach

H. Wong, C. Rettner, T. Topuria, 2007 .

Solution-Based Processing of the Phase-Change Material KSb5S8

S. Raoux, J. Jordan-Sweet, A. Schrott, 2006 .

Quantifying non-centrosymmetric orthorhombic phase fraction in 10 nm ferroelectric Hf0.5Zr0.5O2 films

J. Jordan-Sweet, W. Weinreich, G. Leusink, 2020, Applied Physics Letters.

An ultra high endurance and thermally stable selector based on TeAsGeSiSe chalcogenides compatible with BEOL IC Integration for cross-point PCM

F. M. Lee, M. BrightSky, Y. Zhu, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

Stationary pulses of light in an atomic medium

E. A. Stach, C. Lavoie, J. Jordan-Sweet, 2022 .

Scaling properties of phase change materials

Yuan Zhang, S. Raoux, H. Wong, 2007, 2007 Non-Volatile Memory Technology Symposium.

Analysis Of Sige Fet Device Structures On Silicon-on-sapphire Substrates by X-Ray Diffraction

J. Jordan-Sweet, B. Meyerson, K. Kavanagh, 1998 .

X-ray diffraction analysis of SiGe/Si heterostructures on sapphire substrates

J. Jordan-Sweet, J. Ott, J. Chu, 1998 .

Switching of ferroelectric polarization in epitaxial BaTiO₃ films on silicon without a conducting bottom electrode.

Catherine Dubourdieu, Sergei V. Kalinin, Sergei V Kalinin, 2013, Nature nanotechnology.

Influence of interfaces and doping on the crystallization temperature of Ge–Sb

Simone Raoux, Martina Hitzbleck, Huai-Yu Cheng, 2009 .

Accelerated Publication: Evolution of stress gradients in Cu films and features induced by capping layers

E. T. Ryan, J. Jordan-Sweet, M. Toney, 2012 .

Stress gradients observed in Cu thin films induced by capping layers

J. Jordan-Sweet, P. Besser, C. Murray, 2010 .

Texture of CoSi2 Films on Si(111) (110) and (001) Substrates

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2010 .

Texture of NiSi films on Si(001), (111), and (110) substrates

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2008 .

Formation of polyimide/substrate interfaces: investigation of interfacial chemistry of polyamic acid with surfaces of silicon, copper, and chromium

S. P. Kowalczyk, J. Jordan-Sweet, 1989 .

Effects of additive elements on the phase formation and morphological stability of nickel monosilicide films

F. d'Heurle, C. Detavernier, A. Kellock, 2006 .

Polymer/metal interfaces studied by carbon near-edge x-ray absorption fine structure spectroscopy

J. Jordan-Sweet, C. Kovac, J. F. Morar, 1988 .

Quasi-two-dimensional electron gas at the epitaxial alumina/SrTiO3 interface: Control of oxygen vacancies

Kristy J. Kormondy, J. Jordan-Sweet, David J. Smith, 2015 .

Axiotaxy and epitaxial textures in C54-TiSi2 films on Si(0 0 1) and Si(1 1 1) substrates

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2018, Journal of Physics D: Applied Physics.

Effects of temperature dependent pre-amorphization implantation on NiPt silicide formation and thermal stability on Si(100)

J. Jordan-Sweet, C. Lavoie, A. Ozcan, 2013 .

Phase formation and stability of Ni silicide contacts - scaling to ultra-thin films

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2010, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.

Phase formation and thermal stability of ultrathin nickel-silicides on Si(100)

H. Bender, C. Detavernier, J. Jordan-Sweet, 2010 .

Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2009 .

The Texture of Thin NiSi Films and Its Effect on Agglomeration

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2008 .

Formation and morphological stability of NiSi in the presence of W, Ti, and Ta alloying elements

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2007 .

Ni-Pt silicide formation through Ti mediating layers

J. Jordan-Sweet, C. Lavoie, M. Gribelyuk, 2007 .

Dislocation nucleation barrier in SiGe/Si structures graded to pure Ge

J. Jordan-Sweet, P. Mooney, F. Legoues, 1994 .

High resolution x-ray diffraction measurements of strain relaxed SiGe/Si structures

J. Jordan-Sweet, J. Chu, P. Mooney, 1994 .

Atomic layer deposited ultrathin metal nitride barrier layers for ruthenium interconnect applications

J. Jordan-Sweet, C. Lavoie, G. Leusink, 2017 .

Morphological stability and specific resistivity of sub-10 nm silicide films of Ni1−xPtx on Si substrate

Andrew J. Kellock, Shi-Li Zhang, C. Lavoie, 2010 .

Formation of nickel germanides from Ni layers with thickness below 10 nm

J. Jordan-Sweet, C. Lavoie, Shi-Li Zhang, 2017 .

Exploitation of a self-limiting process for reproducible formation of ultrathin Ni1−xPtx silicide films

A. Kellock, J. Jordan-Sweet, C. Lavoie, 2010 .

Diamond Photodiodes for X-ray Applications

J. Jordan-Sweet, J. Distel, J. Smedley, 2009 .

Texture of Cobalt Germanides on Ge(100) and Ge(111) and Its Influence on the Formation Temperature

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2010 .

Epitaxial Formation of a Metastable Hexagonal Nickel–Silicide

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2008 .

Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements

K. Opsomer, C. Detavernier, J. Jordan-Sweet, 2014 .

Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2016 .

Structural Evolution of AuPt and AuPd Nanoparticles Fabricated by Microwave Assisted Synthesis: A Comparative Study

S. Raoux, J. Jordan-Sweet, K. Rademann, 2015 .

Effect of Pt addition on growth stress and thermal stress of NiSi films

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2008 .

Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements

J. Jordan-Sweet, E. Eisenbraun, C. Cabral, 2013 .

Mapping of the mechanical response in Si/SiGe nanosheet device geometries

J. Jordan-Sweet, C. Lavoie, N. Loubet, 2022, Communications Engineering.

Quasi-two-dimensional electron gas at the interface of γ-Al2O3/SrTiO3 heterostructures grown by atomic layer deposition

Kristy J. Kormondy, J. Jordan-Sweet, David J. Smith, 2015 .

Manipulating stress in Cu/low-k dielectric nanocomposites

E. T. Ryan, J. Jordan-Sweet, P. Besser, 2011 .

Synthesis and Phase Stability of Metastable Bixbyite V2O3 Colloidal Nanocrystals

J. Jordan-Sweet, D. Milliron, Amy Bergerud, 2013 .

Effects of alloying elements on cobalt silicide formation

F. d'Heurle, J. Jordan-Sweet, C. Cabral, 2002 .

Stress gradients observed in Cu thin films induced by capping layers

J. Jordan-Sweet, P. Besser, C. Murray, 2010 .

Stress gradients induced in Cu films by capping layers

J. Jordan-Sweet, P. Besser, C. Murray, 2008 .

Crystallization Characteristics of Ge-Sb Phase Change Materials

Simone Raoux, Anita Madan, Martin Salinga, 2009 .

A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction

J. Jordan-Sweet, R. Rosenberg, I. C. Noyan, 2011 .

Domain mapping of a Ca-doped manganite

J. Jordan-Sweet, J. Turner, Y. Tomioka, 2008 .

Heteroepitaxial silicon film growth at 600 °C from an Al–Si eutectic melt

J. Jordan-Sweet, M. Reuter, F. Ross, 2010 .

Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2013 .

Phase Formation Sequence of Nickel Silicides from Rapid Thermal Annealing of Ni on 4H-SiC

J. Jordan-Sweet, C. Cabral, C. Lavoie, 1997 .

Temperature dependent structural studies of high Tc oxide superconductors

J. Jordan-Sweet, P. M. Horn, D. Keane, 1988 .

Deformation field in single-crystal fields semiconductor substrates caused by metallization features

Ping-Chuan Wang, Ismail C. Noyan, J. Jordan-Sweet, 1999 .

Effects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study

J. Woicik, J. Jordan-Sweet, C. Chien, 2010 .

In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing

Abdul K. Rumaiz, Edmund R. Nowak, Paul Parsons, 2009 .

On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2014 .

Formation of a crystalline metal-rich silicide in thin film titanium/silicon reactions

J. Jordan-Sweet, C. Cabral, C. Lavoie, 1996 .

An off-normal fibre-like texture in thin films on single-crystal substrates

E. A. Stach, C. Lavoie, C. Detavernier, 2003, Nature.

A comparison of C54-TiSi 2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing

J. Jordan-Sweet, C. Cabral, J. Bucchignano, 1995 .

In situ characterization of titanium silicide formation: The effect of Mo interlayer, temperature ramp-rate, and annealing atmosphere

F. d'Heurle, J. Jordan-Sweet, C. Cabral, 1999 .

Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry

J. Jordan-Sweet, C. Cabral, C. Lavoie, 1997 .

In situ x‐ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines

G. Morales, Lawrence A. Clevenger, Karl F. Ludwig, 1995 .

The influence of alloying on the phase formation sequence of ultra-thin nickel silicide films and on the inheritance of texture

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2018 .

Formation and stability of NiSi in the presence of Co and Fe alloying elements

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2008 .

Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully silicided gate applications

C. Detavernier, J. Kittl, J. Jordan-Sweet, 2007 .

Engineering crystallinity of atomic layer deposited gate stacks containing ultrathin HfO2 and a Ti-based metal gate: Effects of postmetal gate anneal and integration schemes

J. Jordan-Sweet, M. Medikonda, G. Leusink, 2014 .

Phase transitions in Ge-Sb phase change materials

Kumar Virwani, Simone Raoux, Martina Hitzbleck, 2009 .

Light Scattering Measurement Of Surface Topography During Formation Of Titanium Silicide.

Lawrence A. Clevenger, C. Lavoie, Katherine L. Saenger, 1995 .

Instrumentation for millisecond‐resolution scattering studies (invited)

Y. S. Yang, J. Jordan-Sweet, K. Ludwig, 1989 .

Thickness-dependent Crystallization Behavior of Phase Change Materials

A. Kellock, S. Raoux, J. Jordan-Sweet, 2008 .

In situ X-ray Diffraction Study of Ni–Yb Interlayer and Alloy Systems on Si„100

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2010 .

In Situ Analysis of the Formation of thin TISI 2 , (g50 nm) Contacts in Submicron Cmos Structures during Rapid Thermal Annealing

G. Morales, Lawrence A. Clevenger, C. Lavoie, 1995 .

In situ study of the formation of silicide phases in amorphous Co-Si mixed layers

C. Detavernier, J. Jordan-Sweet, A. Vantomme, 2010 .

Axiotaxy of CoSi2 thin films on Si(100) substrates and the effects of Ti alloying

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2004 .

Electrical Enhancement and Higher-K Engineering in Ultra-Thin Atomic Layer Deposited Hf1-xAlxOy Films

J. Jordan-Sweet, G. Leusink, R. Clark, 2015 .

Characterizing the effects of etch-induced material modification on the crystallization properties of nitrogen doped Ge2Sb2Te5

Ying Zhang, Michael A. Paesler, Simone Raoux, 2011 .

Applications of synchrotron X-rays in microelectronics industry research

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2005 .

Dependence of Crystallographic Texture of C54 Tisi 2 on Thickness and Linewidth In Submicron Cmos Structures

J. Jordan-Sweet, C. Cabral, J. Harper, 1996 .

Synchrotron X-ray scattering techniques for microelectronics-related materials studies

Jean L. Jordan-Sweet, J. Jordan-Sweet, 2000, IBM J. Res. Dev..

Interdiffusion studies of single crystal TiN/NbN superlattice thin films

J. Jordan-Sweet, C. Cabral, C. Lavoie, 1999 .

Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction.

B. Lai, J. Jordan-Sweet, D. Eastman, 2002, Physical review letters.

Kinetics of Ni3Si2 formation in the Ni2Si–NiSi thin film reaction from in situ measurements

C. Detavernier, J. Kittl, J. Jordan-Sweet, 2007 .

Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines

Chenming Hu, Ping-Chuan Wang, Ismail C. Noyan, 2000 .

Mitigating residual stress in Cu metallization

E. T. Ryan, J. Jordan-Sweet, M. Toney, 2012 .

Understanding stress gradients in microelectronic metallization

E. T. Ryan, J. Jordan-Sweet, M. Toney, 2012, Powder Diffraction.

Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires

J. Jordan-Sweet, C. Hu, Ping-Chuan Wang, 2001 .

Linking strain anisotropy and plasticity in copper metallization

J. Jordan-Sweet, D. Priyadarshini, S. Nguyen, 2015 .

Irreversible altering of crystalline phase of phase-change Ge–Sb thin films

S. Raoux, J. Jordan-Sweet, C. Cabral, 2010 .

UNIQUE X-RAY DIFFRACTION PATTERN AT GRAZING INCIDENCE FROM MISFIT DISLOCATIONS IN SIGE THIN FILMS

J. Jordan-Sweet, J. Chu, P. Mooney, 1996 .

Ionic and Electronic Transport in Ag2S Nanocrystal–GeS2 Matrix Composites with Size‐Controlled Ag2S Nanocrystals

S. Raoux, J. Jordan-Sweet, D. Milliron, 2012, Advanced materials.

Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics

J. Jordan-Sweet, Ping-Chuan Wang, S. Kaldor, 2000 .

Evidence for two-step disordering of the Au(110)-1 × 2 reconstructed surface

J. Jordan-Sweet, R. Birgeneau, D. Keane, 1991 .

X-Ray scattering study of the deconstruction and thermal roughening of the Au(110) 1×3 reconstructed surface

J. Jordan-Sweet, R. Birgeneau, P. M. Horn, 1989 .

Erratum: Switching of ferroelectric polarization in epitaxial BaTiO 3 films on silicon without a conducting bottom electrode (Nature Nanotechnology (2013) 8 (748-754))

David J. Frank, Catherine Dubourdieu, Alexander A. Demkov, 2013 .

Annealing behavior of atomic layer deposited HfO2 films studied by synchrotron x-ray reflectivity and grazing incidence small angle scattering

Martin L. Green, J. Jordan-Sweet, A. Allen, 2009 .

Challenges of nickel silicidation in CMOS technologies

S. Narasimha, K. Nummy, J. Jordan-Sweet, 2015 .

Phase formation sequences in the silicon-phosphorus system: Determined by in-situ synchrotron and conventional X-ray diffraction measurements and predicted by a theoretical model

J. Jordan-Sweet, C. Cabral, C. Lavoie, 1997 .

Annealing dependence of diamond-metal Schottky barrier heights probed by hard x-ray photoelectron spectroscopy

J. Woicik, J. Jordan-Sweet, E. Cockayne, 2012 .

Phase transitions in Ga–Sb phase change alloys

S. Raoux, J. Jordan-Sweet, R. Cheek, 2012 .

The crystallization behavior of stoichiometric and off-stoichiometric Ga-Sb-Te materials for phase-change memory

S. Raoux, J. Jordan-Sweet, Huai-Yu Cheng, 2011 .

Phase Transitions in Ge-Te Phase Change Materials Studied by Time-resolved X-ray Diffraction

Simone Raoux, Huai-Yu Cheng, S. Raoux, 2009 .

Boron migration due to annealing in CoFeB/MgO/CoFeB interfaces: A combined hard x-ray photoelectron spectroscopy and x-ray absorption studies

J. Woicik, J. Jordan-Sweet, D. Fischer, 2011 .

Gas cluster ion beam assisted NiPt germano-silicide formation on SiGe

J. Jordan-Sweet, C. Lavoie, A. Ozcan, 2016 .

Controlling Morphology in Polycrystalline Films by Nucleation and Growth from Metastable Nanocrystals.

L. Lutz, S. Raoux, J. Jordan-Sweet, 2018, Nano letters.

Method to measure the viscosity of nanometer liquid films from the surface fluctuations

J. Jordan-Sweet, C. Lam, E. DiMasi, 2009 .

TEXTURE OF TETRAGONAL ALPHA-FESI2 FILMS ON SI(001)

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2004 .

Controlling the formation and stability of ultra-thin nickel silicides - An alloying strategy for preventing agglomeration

André Vantomme, Sara Bals, Christophe Detavernier, 2018 .

Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

J. Jordan-Sweet, C. Lavoie, M. Medikonda, 2013 .

Strain Relaxation in Single Crystal SrTiO3 Grown on Si (001) by Molecular Beam Epitaxy

Catherine Dubourdieu, Alexander A. Demkov, N. David Theodore, 2012 .

Relaxed Si0.7Ge0.3 buffer layers for high‐mobility devices

J. Jordan-Sweet, K. Ismail, J. Chu, 1995 .

Evolution of strain relaxation in step‐graded SiGe/Si structures

J. Jordan-Sweet, J. Chu, P. Mooney, 1995 .

In situ study of the formation of silicide phases in amorphous Ni–Si mixed layers

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2009 .

Materials engineering for Phase Change Random Access Memory

S. Raoux, J. Jordan-Sweet, Jing Li, 2011, 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding.

Crystallization properties of ultrathin phase change films

Simone Raoux, Andrew J. Kellock, A. Kellock, 2008 .

Thermal Stability of Strained Si on Relaxed Si 1−x Ge x Buffer Layers

Kevin K. H. Chan, J. Jordan-Sweet, S. Koester, 2001 .

Disorder-Induced Magnetotransport Anomalies in Amorphous and Textured Co1–xSix Semimetal Thin Films

Holt P. Bui, J. Jordan-Sweet, C. Lavoie, 2023, ACS applied electronic materials.

Identification of structural phases in ferroelectric hafnium zirconium oxide by density-functional-theory-assisted EXAFS analysis

J. Woicik, J. Jordan-Sweet, C. Lavoie, 2021 .

Stress determination through diffraction: establishing the link between Kröner and Voigt/Reuss limits

E. T. Ryan, J. Jordan-Sweet, S. Bedell, 2015, Powder Diffraction.

N-channel MOSFETs fabricated on He-implanted and annealed SiGe buffer layers

Kevin K. H. Chan, J. Jordan-Sweet, D. Boyd, 2005 .

OBSERVATION OF LOCAL TILTED REGIONS IN STRAIN-RELAXED SIGE/SI BUFFER LAYERS USING X-RAY MICRODIFFRACTION

J. Jordan-Sweet, Ping-Chuan Wang, S. Kaldor, 1999 .

Structural and thermoelectric properties of SiGe/Al multilayer systems during metal induced crystallization

S. Raoux, J. Jordan-Sweet, G. Span, 2016 .

Voltage-Controlled Ferromagnetism and Magnetoresistance in LaCoO3/SrTiO3 Heterostructures

J. Jordan-Sweet, E. Yu, A. Demkov, 2013 .

Characterization of substrate/thin-film interfaces with x-ray microdiffraction

J. Jordan-Sweet, S. Kaldor, E. Liniger, 1998 .

Understanding Tunneling Magnetoresistance During Thermal Annealing in MgO-based Junctions with CoFeB Electrodes

Edmund R. Nowak, Robert L. Opila, Jagadeesh S. Moodera, 2010 .

The use of in situ X-ray diffraction, optical scattering and resistance analysis techniques for evaluation of copper diffusion barriers in blanket films and damascene structures

J. Jordan-Sweet, C. Cabral, C. Lavoie, 2001 .

Optimization of Tunneling Magnetoresistance in Perpendicular Magnetic Tunnel Junctions With Co|Pd Reference Layers

T. Topuria, P. Rice, J. Jordan-Sweet, 2013, IEEE Magnetics Letters.

Highly-selective superconformai CVD Ti silicide process enabling area-enhanced contacts for next-generation CMOS architectures

H. van Meer, J. Jordan-Sweet, W. Wang, 2017, 2017 Symposium on VLSI Technology.

Evaluation of Thermal Stability for CMOS Gate Metal Materials

Ahmet S. Ozcan, Evgeni P. Gusev, Vijay Narayanan, 2004 .

Controlling Morphology in Polycrystalline Films by Nucleation and Growth from Metastable Nanocrystals.

L. Lutz, S. Raoux, J. Jordan-Sweet, 2018, Nano letters.

In situ X-ray diffraction study of thin film Ir/Si solid state reactions

C. Detavernier, J. Jordan-Sweet, C. Lavoie, 2010 .

Materials and Electrical Characterization of Physical Vapor Deposited LaxLu1-xO3 Thin Films on 300 mm Silicon

Barry P. Linder, Andrew J. Kellock, Sanjay Shinde, 2011 .

DISORDERING TRANSITIONS OF METAL SURFACES

J. Jordan-Sweet, R. Birgeneau, P. M. Horn, 1989 .

Quasi-two-dimensional electron gas at the epitaxial alumina/SrTiO3 interface: Control of oxygen vacancies

Kristy J. Kormondy, J. Jordan-Sweet, David J. Smith, 2015 .