Chih-Yuan Lu

发表

Ming-Hsiu Lee, W. Chien, F. Lee, 2011, 2011 International Electron Devices Meeting.

Chih-Yuan Lu, Ming-Yi Lee, Chih-Jen Hsiao, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Y. Shih, E. Lai, K. Hsieh, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

E. Lai, Y. King, K. Hsieh, 2007, 2007 IEEE International Electron Devices Meeting.

K. Hsieh, Chih-Yuan Lu, R. Liu, 2009 .

Tahone Yang, Jeng Gong, Rich Liu, 2006, 2006 International Electron Devices Meeting.

Kuo-Pin Chang, Bing-Yue Tsui, Yi-Hsuan Hsiao, 2014, IEEE Transactions on Electron Devices.

Chih-Yuan Lu, T. C. Lu, K. C. Chen, 2016, IEEE Electron Device Letters.

Chih-Yuan Lu, T. C. Lu, K. C. Chen, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Kuo-Pin Chang, Hang-Ting Lue, Chih-Chang Hsieh, 2010, 2010 International Electron Devices Meeting.

Wei-Hao Hsiao, Li-Kuang Kuo, Chih-Yuan Lu, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Chih-Yuan Lu, Chih-Yuan Lu, Tahui Wang, 2017, IEEE Electron Device Letters.

Chih-Yuan Lu, C.C. Liu, W.J. Tsai, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

Chih-Yuan Lu, Tahui Wang, N. Zous, 2003, IEEE International Electron Devices Meeting 2003.

Rich Liu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

K. Hsieh, Chih-Yuan Lu, B. Tsui, 2015, IEEE Transactions on Device and Materials Reliability.

Yao-Wen Chang, Ya-Chin King, Chih-Yuan Lu, 2006 .

Kuo-Pin Chang, Rich Liu, Kuang-Yeu Hsieh, 2008 .

Y. Y. Lin, C. F. Chen, E. Lai, 2012, 2012 Symposium on VLSI Technology (VLSIT).

Chih-Yuan Lu, Tahui Wang, J. Chiu, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Y. J. Chen, C. H. Lee, K. F. Chen, 2011, Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.

Tahone Yang, Jeng Gong, Rich Liu, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Chih-Yuan Lu, H. Lue, J. Hsieh, 2010, 2010 IEEE International Reliability Physics Symposium.

K. Hsieh, Chih-Yuan Lu, H. Lue, 2009, 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS).

K. S. Chen, Chih-Yuan Lu, H. M. Lee, 2003, The 11th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003..

Kuang-Yeu Hsieh, Chih-Yuan Lu, Wei-Chih Chien, 2010, 2010 International Electron Devices Meeting.

Ming-Hsiu Lee, Chih-Yuan Lu, H. Lung, 2021, IEEE Transactions on Electron Devices.

Chih-Yuan Lu, Tahui Wang, N. Zous, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

Chih-Yuan Lu, Ming-Yi Lee, A. Teng, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

E. Lai, K. Hsieh, Chih-Yuan Lu, 2007, IEEE Transactions on Device and Materials Reliability.

Chih-Yuan Lu, C. Tung, G. Sheng, 2005, IEEE Circuits and Devices Magazine.

K. Hsieh, Chih-Yuan Lu, H. Lue, 2010 .

J. S. Huang, Chih-Yuan Lu, Kuang-Chao Chen, 2011, IEEE Transactions on Electron Devices.

Chih-Yuan Lu, Ming‐Kwang Lee, C. Shih, 1983 .

Chih-Yuan Lu, Tei-Wei Kuo, Meng-Fan Chang, 2022, 2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO).

Y. Shih, K. Hsieh, Chih-Yuan Lu, 2009, 2009 IEEE International Reliability Physics Symposium.

E. Lai, Ming-Hsiu Lee, W. Chien, 2013, 2013 IEEE International Electron Devices Meeting.

K. Hsieh, Chih-Yuan Lu, H. Lue, 2010, 2010 International Electron Devices Meeting.

Chih-Yuan Lu, J. Hsieh, Ling-Wu Yang, 2016, 2016 21st International Conference on Ion Implantation Technology (IIT).

Chih-Yuan Lu, Ling-Wu Yang, Kuang-Chao Chen, 2005 .

Chih-Yuan Lu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2010, 2010 IEEE International Memory Workshop.

Rachel Huang, Chih-Yuan Lu, Irene Yi-Ju Su, 2004, SPIE Advanced Lithography.

Chih-Yuan Lu, J. Hsieh, J. Liao, 2012 .

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2007, 2007 IEEE Symposium on VLSI Technology.

Chih-Yuan Lu, Hang-Ting Lue, Wei-Chen Chen, 2019, 2019 Symposium on VLSI Technology.

Chih-Yuan Lu, Nian-Jia Wang, Wei-Hao Hsiao, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2010, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Chih-Yuan Lu, Yu-Yu Lin, Chao-Hung Wang, 2019, IEEE Transactions on Electron Devices.

Ming-Hsiu Lee, F. Lee, K. Hsieh, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

Chih-Yuan Lu, Hong-Ji Lee, Nan-Tzu Lian, 2019, 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2019, 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Chih-Yuan Lu, R. Liu, Hang-Ting Lue, 2008, 2008 IEEE International Reliability Physics Symposium.

Chihyuan Lu, Hangting Lue, Yichou Chen, 2011, Science China Information Sciences.

Rich Liu, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Chih-Yuan Lu, Y. Shih, E. Lai, 2010, IEEE Electron Device Letters.

Chih-Yuan Lu, W. C. Chen, Hang-Ting Lue, 2019, 2019 Symposium on VLSI Technology.

Chih-Yuan Lu, Ming‐Kwang Lee, C. Shih, 1984 .

Chih-Yuan Lu, J. Meindl, L. Gerzberg, 1981 .

Ta-Hung Yang, Tuung Luoh, Chih-Yuan Lu, 2008 .

Chih-Yuan Lu, Kuang-Chao Chen, T. Tseng, 2019, IEEE Transactions on Electron Devices.

Hsiang-Lan Lung, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2019, Japanese Journal of Applied Physics.

Chih-Yuan Lu, C. Tung, G. Sheng, 2003 .

Chih-Yuan Lu, Tahui Wang, Wen-Jer Tsai, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2020, 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Chih-Yuan Lu, Yen-Hao Shih, K.C. Chen, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Tahui Wang, Chih-Yuan Lu, S.H. Ku, 2018, 2018 IEEE International Memory Workshop (IMW).

Y. Shih, E. Lai, K. Hsieh, 2008, IEEE Transactions on Device and Materials Reliability.

Chih-Yuan Lu, Rich Liu, Hang-Ting Lue, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Tahone Yang, Yi-Hsuan Hsiao, Hang-Ting Lue, 2006, 2006 International Electron Devices Meeting.

Hang-Ting Lue, Chih-Yuan Lu, Yen-Hao Shih, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Chih-Yuan Lu, W.J. Tsai, A. Kuo, 2004, IEEE International Integrated Reliability Workshop Final Report, 2004.

Chih-Yuan Lu, Chih-Wei Hsu, Wen-Pin Lu, 2007, IEEE Transactions on Electron Devices.

Chih-Yuan Lu, Hang-Ting Lue, Tzu-Hsuan Hsu, 2016, 2016 IEEE 8th International Memory Workshop (IMW).

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2018, Advanced Semiconductor Manufacturing Conference.

Chia-Lin Yang, Hussam Amrouch, Hang-Ting Lue, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2020, 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Zusing Yang, Sheng-Yuan Chang, Hong-Ji Lee, 2016, 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Chih-Yuan Lu, Zusing Yang, Hong-Ji Lee, 2013, ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference.

Hsin-Yi Lin, Chih-Yuan Lu, Nian-Jia Wang, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Chih-Yuan Lu, Rich Liu, Hang-Ting Lue, 2010, IEEE Transactions on Device and Materials Reliability.

Rich Liu, Ya-Chin King, Yi-Hsuan Hsiao, 2009, IEEE Transactions on Electron Devices.

Rich Liu, Ya-Chin King, Tzu-Hsuan Hsu, 2007, IEEE Electron Device Letters.

Chih-Yuan Lu, Shou‐yih Wang, N. Liang, 1984 .

Chih-Yuan Lu, C. T. Hsuan, Fred Lo, 2014, Advanced Lithography.

R. Liu, K.C. Chen, K.Y. Hsieh, 2008, 2008 Symposium on VLSI Technology.

Chih-Yuan Lu, Dai-Ying Lee, Erh-Kun Lai, 2016, IEEE Electron Device Letters.