D. Linten
发表
A. Fantini,
W. G. Bennett,
N. Hooten,
2014,
IEEE Transactions on Nuclear Science.
A. Thean,
N. Collaert,
D. Linten,
2016,
IEEE Electron Device Letters.
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Eric Beyne,
Erik Jan Marinissen,
Mirko Scholz,
2015,
2015 International 3D Systems Integration Conference (3DIC).
T. Schram,
N. Horiguchi,
A. Thean,
2016,
2016 IEEE Symposium on VLSI Technology.
D. R. Ball,
B. L. Bhuva,
N. N. Mahatme,
2014,
IEEE Transactions on Nuclear Science.
L. Goux,
R. Degraeve,
S. Clima,
2015
.
C. Y. Chen,
L. Goux,
G. Kar,
2017
.
A. Fantini,
M. Jurczak,
peixiong zhao,
2013,
IEEE Transactions on Nuclear Science.
D. Linten,
B. O’Sullivan,
B. Kaczer,
2020,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
D. Linten,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
R. Degraeve,
D. Linten,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Robin Degraeve,
Antonio Arreghini,
2016,
2016 IEEE 8th International Memory Workshop (IMW).
Mirko Scholz,
Dimitri Linten,
Sandeep Sangameswaran,
2009,
2009 31st EOS/ESD Symposium.
H. Mertens,
D. Linten,
P. Verheyen,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
peixiong zhao,
R. Reed,
E. Zhang,
2021,
IEEE Transactions on Nuclear Science.
Dimitri Linten,
Jonathan Borremans,
Steven Thijs,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.
A. Chasin,
N. Horiguchi,
N. Collaert,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Guido Groeseneken,
Jacopo Franco,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
D. Linten,
S. Decoutere,
G. Groeseneken,
2011,
EOS/ESD Symposium Proceedings.
Luigi Dilillo,
Dimitri Linten,
Eddy Simoen,
2012,
IEEE Transactions on Nuclear Science.
Luigi Dilillo,
Dimitri Linten,
Eddy Simoen,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
peixiong zhao,
R. Reed,
E. Zhang,
2020,
IEEE Transactions on Nuclear Science.
A. Thean,
N. Collaert,
N. Waldron,
2016
.
A. Chasin,
N. Horiguchi,
A. Thean,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Jerome Mitard,
Nicholas C. Hooten,
2014,
IEEE Transactions on Nuclear Science.
N. Collaert,
D. Linten,
R. Rooyackers,
2017,
IEEE Transactions on Device and Materials Reliability.
N. Collaert,
D. Linten,
B. Kaczer,
2021,
IEEE Transactions on Electron Devices.
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
Naoto Horiguchi,
Dimitri Linten,
Jacopo Franco,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Guido Groeseneken,
Jacopo Franco,
2018,
IEEE Transactions on Electron Devices.
G. Meneghesso,
E. Simoen,
C. Claeys,
2010,
IEEE Transactions on Device and Materials Reliability.
Nowab Reza M. D. Ashif,
D. Linten,
Shih-Hung Chen,
2020
.
D. Linten,
Shih-Hung Chen,
Marko Simicic,
2018,
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
B. Kaczer,
G. Hellings,
L. Witters,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
A. De Keersgieter,
A. Chasin,
D. Linten,
2021,
Microelectronics Reliability.
A. Thean,
N. Collaert,
D. Linten,
2015,
2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
N. Collaert,
D. Linten,
M. Heyns,
2020
.
D. Linten,
G. Groeseneken,
I. De Wolf,
2011,
EOS/ESD Symposium Proceedings.
Mirko Scholz,
Dimitri Linten,
M. Sawada,
2008
.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2020,
IEEE Transactions on Device and Materials Reliability.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
D. Linten,
Shih-Hung Chen,
Marko Simicic,
2019,
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
N. Collaert,
D. Linten,
G. Groeseneken,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Mirko Scholz,
Dimitri Linten,
Geert Hellings,
2013,
2013 35th Electrical Overstress/Electrostatic Discharge Symposium.
D. Linten,
A. Spessot,
B. Kaczer,
2020,
Micromachines.
A. De Keersgieter,
A. Chasin,
D. Linten,
2020,
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
A. Chasin,
D. Linten,
T. Grasser,
2019,
IEEE Electron Device Letters.
D. Linten,
A. Spessot,
B. Kaczer,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
Dimitri Linten,
Jerome Mitard,
Liesbeth Witters,
2016,
IEEE Transactions on Device and Materials Reliability.
R. A. Reed,
peixiong zhao,
M. Alles,
2019,
Applied Physics Letters.
M. Gonzalez,
Dimitri Linten,
Jacopo Franco,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Sandeep Sangameswaran,
Jeroen De Coster,
2010,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.
Paul Zuber,
Dimitri Linten,
Eddy Simoen,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
B. L. Bhuva,
N. N. Mahatme,
E. Simoen,
2012,
IEEE Transactions on Nuclear Science.
H. Mertens,
T. Schram,
D. Linten,
2019,
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
Naoto Horiguchi,
Dimitri Linten,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2020,
IEEE Transactions on Device and Materials Reliability.
R. Ritzenthaler,
N. Horiguchi,
D. Linten,
2019,
2019 IEEE International Integrated Reliability Workshop (IIRW).
R. Ritzenthaler,
T. Schram,
A. Chasin,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Chris Van Hoof,
J. De Coster,
Mirko Scholz,
2008
.
D. Linten,
B. Parvais,
B. Kaczer,
2020
.
Natarajan Mahadeva Iyer,
Mirko Scholz,
Dimitri Linten,
2006
.
peixiong zhao,
R. Reed,
E. Zhang,
2020,
IEEE Transactions on Nuclear Science.
L. Larcher,
A. Padovani,
D. Linten,
2019
.
L. Larcher,
A. Padovani,
D. Linten,
2019,
IEEE Transactions on Electron Devices.
D. Mocuta,
A. Thean,
N. Collaert,
2018,
Advances in Science, Technology and Engineering Systems Journal.
N. Collaert,
peixiong zhao,
R. Reed,
2015,
IEEE Transactions on Nuclear Science.
peixiong zhao,
R. Reed,
E. Zhang,
2020,
IEEE Transactions on Nuclear Science.
N. Collaert,
N. Waldron,
peixiong zhao,
2019,
IEEE Transactions on Nuclear Science.
C. Detavernier,
I. Radu,
J. Swerts,
2016
.
G. Kar,
R. Degraeve,
J. Swerts,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
N. Horiguchi,
D. Linten,
M. Ker,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
D. Linten,
E. Simoen,
C. Claeys,
2021
.
Mirko Scholz,
Dimitri Linten,
Geert Hellings,
2013,
2013 35th Electrical Overstress/Electrostatic Discharge Symposium.
Ben Kaczer,
Dieter Claes,
Jakob Michl,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
A. Subirats,
Dimitri Linten,
Geert Hellings,
2018,
Microelectron. Reliab..
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2018,
Microelectron. Reliab..
B. Kaczer,
T. Grasser,
D. Linten,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
L. Goux,
B. Govoreanu,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
M. Okushima,
J. Borremans,
2009,
2009 31st EOS/ESD Symposium.
A. Mercha,
S. Decoutere,
S. Donnay,
2006,
IEEE Transactions on Electron Devices.
B. Kaczer,
J. Van Houdt,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
P. Wambacq,
Ming-Hsiang Song,
Jen-Chou Tseng,
2012,
2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.
D. Linten,
B. Kaczer,
A. Walke,
2021,
IEEE Transactions on Electron Devices.
R. Degraeve,
S. Clima,
D. Linten,
2020
.
Natarajan Mahadeva Iyer,
Dimitri Linten,
Steven Thijs,
2005
.
Naoto Horiguchi,
Dimitri Linten,
Jacopo Franco,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
N. Collaert,
D. Linten,
2008,
2008 IEEE International Reliability Physics Symposium.
B. Parvais,
B. Kaczer,
D. Linten,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2019
.
R. Degraeve,
A. Fantini,
M. Jurczak,
2014,
IEEE Transactions on Nuclear Science.
Luca Benini,
Federico Angiolini,
Paresh Limaye,
2010,
IEEE Journal of Solid-State Circuits.
N. Collaert,
D. Linten,
B. Kaczer,
2015,
IEEE Transactions on Electron Devices.
Dimitri Linten,
Robin Degraeve,
E. Bury,
2019,
IEEE Journal of Solid-State Circuits.
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
N. Horiguchi,
D. Linten,
2019,
IEEE Transactions on Device and Materials Reliability.
A. Vandooren,
Naoto Horiguchi,
Dimitri Linten,
2021,
2021 International Conference on IC Design and Technology (ICICDT).
R. Degraeve,
L. Goux,
B. Govoreanu,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
D. Linten,
B. O’Sullivan,
C. Shin,
2021,
IEEE Transactions on Device and Materials Reliability.
S. Clima,
D. Linten,
B. O’Sullivan,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
D. Linten,
E. Simoen,
J. van Houdt,
2021
.
Dimitri Linten,
Guido Groeseneken,
Jacopo Franco,
2017,
IEEE Transactions on Electron Devices.
D. Linten,
G. Sills,
W. Roberts,
2002
.
Dimitri Linten,
Geert Hellings,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
peixiong zhao,
R. Reed,
E. Zhang,
2023,
IEEE Transactions on Device and Materials Reliability.
Ingrid Verbauwhede,
Dimitri Linten,
Guido Groeseneken,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Dimitri Linten,
Philippe Roussel,
Tibor Grasser,
2016
.
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
B. Parvais,
B. Kaczer,
D. Verkest,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Kaustav Banerjee,
Dimitri Linten,
Harald Gossner,
2010,
2010 International Electron Devices Meeting.
Dimitri Linten,
Niamh Waldron,
Nadine Collaert,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
peixiong zhao,
R. Reed,
E. Zhang,
2022,
IEEE Transactions on Nuclear Science.
M. B. Smith,
Andrew M. Tonigan,
M. W. Rony,
2021,
IEEE Transactions on Electron Devices.
Dimitri Linten,
Geert Hellings,
Philippe Roussel,
2019,
IEEE Electron Device Letters.
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2018,
2018 International Integrated Reliability Workshop (IIRW).
A. Chasin,
D. Linten,
B. Kaczer,
2021,
Advanced Electronic Materials.
A. Chasin,
D. Linten,
B. Kaczer,
2022,
Advanced Materials Interfaces.
B. Kaczer,
L. Witters,
N. Waldron,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
A. Hikavyy,
E. Rosseel,
D. Linten,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
G. Groeseneken,
R. Degraeve,
D. Linten,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Geert Hellings,
Jacopo Franco,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2023,
IEEE International Reliability Physics Symposium.
B. Kaczer,
L. Witters,
N. Collaert,
2016,
2016 IEEE Symposium on VLSI Technology.
B. Govoreanu,
I. Radu,
D. Linten,
2021,
IEEE Transactions on Electron Devices.
B. Govoreanu,
I. Radu,
D. Linten,
2021,
IEEE Transactions on Electron Devices.
N. Collaert,
D. Linten,
B. Kaczer,
2020
.
D. Linten,
B. Kaczer,
G. Groeseneken,
2021,
IEEE Transactions on Electron Devices.
A. Chasin,
D. Linten,
T. Grasser,
2018,
Semiconductors.
P. Wambacq,
A. Mercha,
S. Decoutere,
2004,
IEEE Journal of Solid-State Circuits.
P. Wambacq,
B. Parvais,
A. Mercha,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
peixiong zhao,
R. Reed,
M. Alles,
2017,
IEEE Transactions on Nuclear Science.
H. Dekkers,
N. Horiguchi,
N. Collaert,
2019,
IEEE Transactions on Device and Materials Reliability.
A. De Keersgieter,
A. Chasin,
D. Linten,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Naoto Horiguchi,
Dimitri Linten,
Philippe Roussel,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
H. Mertens,
A. Chasin,
D. Linten,
2019
.
B. Parvais,
G. Groeseneken,
G. Gielen,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
A. Chasin,
peixiong zhao,
E. Zhang,
2023,
IEEE Transactions on Nuclear Science.
N. Collaert,
N. Waldron,
peixiong zhao,
2020,
IEEE Transactions on Nuclear Science.
N. Collaert,
N. Waldron,
peixiong zhao,
2020,
IEEE Transactions on Nuclear Science.
N. Collaert,
N. Waldron,
peixiong zhao,
2018,
IEEE Transactions on Nuclear Science.
Dimitri Linten,
Nicholas C. Hooten,
En Xia Zhang,
2015
.
N. Collaert,
peixiong zhao,
R. Reed,
2015,
IEEE Transactions on Nuclear Science.
R. D. Schrimpf,
D. Linten,
E. Bury,
2018,
IEEE Transactions on Nuclear Science.
A. Thean,
N. Collaert,
A. Veloso,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
James Karp,
Michael J. Hart,
Dimitri Linten,
2018,
IEEE Transactions on Nuclear Science.
Steven Thijs,
G. Hellings,
D. Linten,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
Dimitri Linten,
Philippe Roussel,
S. Rao,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
R. Rooyackers,
C. Duvvury,
N. Collaert,
2008,
IEEE Transactions on Electron Devices.
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
2010 IEEE International Solid-State Circuits Conference - (ISSCC).