C. C. Chen
发表
R. F. Tsui,
Shien-Yang Wu,
C. Y. Lin,
2014,
2014 IEEE International Electron Devices Meeting.
Horng-Chih Lin,
Tiao-Yuan Huang,
Chun-Yen Chang,
1999
.
Horng-Chih Lin,
Tiao-Yuan Huang,
Chun-Yen Chang,
1998
.
Chun-Yen Chang,
M. Liang,
C. C. Chen,
1999,
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395).
C. C. Chen,
Hao-Hsiung Lin,
Si‐Chen Lee,
1988
.
M. Liang,
V. Chang,
C. C. Chen,
2003,
2003 8th International Symposium Plasma- and Process-Induced Damage..
Horng-Chih Lin,
Tiao-Yuan Huang,
Chun-Yen Chang,
2000
.
C. C. Chen,
Y. S. Wu,
P. Tsao,
2020,
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
C. C. Chen,
Hao-Hsiung Lin,
Si‐Chen Lee,
1987
.
M. Liang,
V. Chang,
C. C. Chen,
2006
.
C.C. Chen,
Shien-Yang Wu,
S.Y. Chang,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
H. T. Lin,
Shien-Yang Wu,
T. Miyashita,
2013,
2013 IEEE International Electron Devices Meeting.
Noah Sturcken,
Kenneth Shepard,
Michael S. Lekas,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).