W. Meeker

发表

System Reliability Theory: Models, Statistical Methods, and Applications, Second Edition

T. P. Ryan, W. Meeker, 2005 .

A Comparison of Accelerated Test Plans to Estimate the Survival Probability at a Design Stress

G. J. Hahn, W. Meeker, 1978 .

A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring

W. Meeker, 1984 .

Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability

G. J. Hahn, W. Meeker, 1977 .

Statistical Intervals: A Guide for Practitioners

Luis A. Escobar, G. J. Hahn, W. Meeker, 1991 .

Teaching about Approximate Confidence Regions Based on Maximum Likelihood Estimation

Luis A. Escobar, W. Meeker, L. Escobar, 1995 .

An Accelerated Life Test Model Based on Reliability Kinetics

W. Meeker, M. LuValle, 1995 .

The nontruncated marginal of a truncated bivariate normal distribution

R. Beaver, B. Arnold, R. A. Groeneveld, 1993 .

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

W. Meeker, 1991 .

Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process

N. Balakrishnan, M. Pecht, W. Meeker, 2012 .

Accelerated degradation tests: modeling and analysis

Luis A. Escobar, W. Meeker, L. Escobar, 1998 .

Bayesian life test planning for the Weibull distribution with given shape parameter

W. Meeker, Yao Zhang, 2005 .

Confidence interval procedures for system reliability and applications to competing risks models

Yili Hong, William Q Meeker, W. Meeker, 2014, Lifetime data analysis.

FISHER INFORMATION MATRICES WITH CENSORING, TRUNCATION, AND EXPLANATORY VARIABLES

William Q. Meeker, Luis A. Escobar, W. Meeker, 1998 .

Assessing influence in regression analysis with censored data.

Luis A. Escobar, W Q Meeker, W. Meeker, 1992, Biometrics.

Statistical Prediction Based on Censored Life Data

William Q. Meeker, Luis A. Escobar, W. Meeker, 1999, Technometrics.

A Statistical Model for Linking Field and Laboratory Exposure Results for a Model Coating

W. Meeker, Iliana Vaca-Trigo, 2009 .

More Pitfalls in Conducting and Interpreting the Results of Accelerated Tests

W. Meeker, G. Sarakakis, A. Gerokostopoulos, 2012 .

Weibull Variances and Confidence Limits by Maximum Likelihood for Singly Censored Data

W. Meeker, W. Nelson, 1977 .

A Review of Recent Research and Current Issues in Accelerated Testing

Luis A. Escobar, W. Meeker, L. Escobar, 1993 .

Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

W. Meeker, Haiming Ma, 2008 .

Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests

W. Meeker, S. V. Wiel, 1990 .

Accuracy of approximate confidence bounds computed from interval censored weibull and lognormal data

W. Meeker, G. Ostrouchov, 1988 .

Planning accelerated life tests with type II censored data

Luis A. Escobar, W. Meeker, L. Escobar, 1986 .

Estimating fatigue curves with the random fatigue-limit model

W. Meeker, F. Pascual, 1999 .

Understanding and Addressing the Unbounded “Likelihood” Problem

W. Meeker, Huaiqin Wu, ShiYao Liu, 2015 .

Asymptotic properties of mean cumulative function estimators from window-observation recurrence data

William Q. Meeker, Jianying Zuo, W. Meeker, 2012 .

Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions

William Q. Meeker, Wayne Nelson, W. Meeker, 1978 .

Directions for improvement of substitute heart valves: National Heart, Lung, and Blood Institute's Working Group report on heart valves.

J M Anderson, W Q Meeker, E A Geiser, 1997, Journal of biomedical materials research.

Quantile POD for nondestructive evaluation with hit--miss data

W. Meeker, Yew-Meng Koh, 2019 .

Wiley Series in Probability and Mathematical Statistics

William Q. Meeker, Gerald J. Hahn, G. J. Hahn, 2011 .

Applications of the Fractional-Random-Weight Bootstrap

Yili Hong, William Q. Meeker, Caleb B. King, 2018, The American Statistician.

THE ASYMPTOTIC EQUIVALENCE OF THE FISHER INFORMATION MATRICES FOR TYPE I AND TYPE II CENSORED DATA FROM LOCATION-SCALE FAMILIES

William Q. Meeker, Luis A. Escobar, W. Meeker, 2000 .

The Number of MCMC Draws Needed to Compute Bayesian Credible Bounds

W. Meeker, D. Nordman, Jia Liu, 2016 .

Bayesian Life Test Planning for the Log-Location-Scale Family of Distributions Yili

W. Meeker, Caleb King, Hong, 2014 .

The importance of identifying different components of a mixture distribution in the prediction of field returns

Yili Hong, William Q. Meeker, W. Meeker, 2011 .

Simultaneous Parametric Confidence Bands for Cumulative Distributions from Censored Data

W. Meeker, Shuen-Lin Jeng, 2000 .

Efficient Model-Assisted Probability of Detection and Sensitivity Analysis for Ultrasonic Testing Simulations Using Stochastic Metamodeling

Leifur Þ. Leifsson, Jiming Song, W. Meeker, 2019, Journal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems.

Methods to Compute Prediction Intervals: A Review and New Results.

William Q. Meeker, Daniel J. Nordman, Qinglong Tian, 2020, 2011.03065.

A general algorithm for computing simultaneous prediction intervals for the (log)-location-scale family of distributions

W. Meeker, L. Escobar, Yili Hong, 2017 .

Analysis of Environmental Data with Censored Observations

William Q. Meeker, Jye-Chyi Lu, Dana W. Kolpin, 1997 .

Field Failure Prediction Using Dynamic Environmental Data

Yili Hong, William Q. Meeker, W. Meeker, 2011 .

For Planning Accelerated Repeated Measures Degradation Tests

W. Meeker, B. Weaver, 2016 .

New Developments in Statistical Computing: New Bias Evaluation Features of EXPLOR—A Program for Assessing Experimental Design Properties

William Q. Meeker, Gerald J. Hahn, Paul I. Feder, 1977 .

Mixture Representations of Reliability in Coherent Systems and Preservation Results Under Double Monitoring

W. Meeker, Zhengcheng Zhang, 2013 .

Supplementary Material: Methods for Planning Repeated Measures Degradation Studies

J. Wendelberger, W. Meeker, L. Escobar, 2013 .

Chapter 2 Principles of Maximum Likelihood Estimation and The Analysis of Censored Data

W. Meeker, W. Stephenson, M. Kaiser, 2003 .

Statistics Preprints Statistics 6-2013 Reliability Meets Big Data : Opportunities and Challenges

W. Meeker, 2016 .

A simulation study on the confidence interval procedures of some mean cumulative function estimators

W. Meeker, Huaiqin Wu, Jianying Zuo, 2013 .

Using Degradation Models to Assess Pipeline Life Using Degradation Models to Assess Pipeline Life

W. Meeker, ShiYao Liu, 2019 .

Life Cycle Reliability Engineering

W. Meeker, 2008 .

Reliability Upsizing: How to adjust for size effect in product life data analysis

G. J. Hahn, W. Meeker, N. Doganaksoy, 2021 .

Development of an Accelerated Test Methodology to the Predict Service Life of Polymeric Materials Subject to Outdoor Weathering

W. Meeker, Yili Hong, X. Gu, 2017, 1705.03050.

Sequential tests of independence for 2 × 2 contingency tables

W. Meeker, 1978 .

Statistical intervals, not statistical significance

G. J. Hahn, W. Meeker, N. Doganaksoy, 2019, The Best Writing on Mathematics 2020.

Modern Statistical Models and Methods for Estimating Fatigue-Life and Fatigue-Strength Distributions from Experimental Data

Luis A. Escobar, W. Meeker, L. Escobar, 2022, 2212.04550.

The Product of Two Normally Distributed Random Variables

W. Q. Meeker, L. W. Cornwell, W. Meeker, 1982 .

Statistical Intervals: A Guide for Practitioners and Researchers

William Q. Meeker, Gerald J. Hahn, Luis A. Escobar, 2017 .

Bayesian Methods for Planning Accelerated Life Tests

Yao Zhang, William Q. Meeker, W. Meeker, 2006, Technometrics.

Bayesian Optimum Planning for Accelerated Life Tests

W. Meeker, Yao Zhang, 2003 .

A Review of Accelerated Test Models

William Q. Meeker, Luis A. Escobar, W. Meeker, 2006, 0708.0369.

Auto-steered Information-Decision Processes for Electric System Asset Management

William Q. Meeker, Vasant Honavar, Yuan Li, 2006, International Conference on Computational Science.

A failure-time model for infant-mortality and wearout failure modes

W. Q. Meeker, V. Chan, W. Meeker, 1999 .

Accelerated Destructive Degradation Test Planning

William Q. Meeker, Luis A. Escobar, Ying Shi, 2009, Technometrics.

Is reliability a new science? A paper from the panel session held at the 10th International Conference on Mathematical Methods in Reliability

William Q. Meeker, Mark Brown, Vitali Volovoi, 2019, Applied Stochastic Models in Business and Industry.

8 - Maximum Likelihood Methods for Fitting Parametric Statistical Models

William Q. Meeker, Luis A. Escobar, W. Meeker, 1994 .

A COMPARISON OF DEGRADATION AND FAILURE-TIME ANALYSIS METHODS FOR ESTIMATING A TIME-TO-FAILURE DISTRIBUTION

William Q. Meeker, Luis A. Escobar, C. Joseph Lu, 1996 .

Fracture Mechanics-Based Quantitative Matching of Forensic Evidence Fragments

William Q. Meeker, Ranjan Maitra, Tianyu Yu, 2021, 2106.04809.

Accelerated Life Test Models and Data Analysis

William Q. Meeker, Luis A. Escobar, Francis Pascual, 2006 .

Prolongation of Skin Homograft Survival in Rabbits by 6-Mercaptopurine.†

W. Meeker, R. Varco, R. Good, 1959 .

Estimating Fatigue Curves With the Random Fatigue-Limit Model

William Q. Meeker, Francis G. Pascual, W. Meeker, 1999, Technometrics.

Coverage Properties of Weibull Prediction Interval Procedures to Contain a Future Number of Failures

W. Meeker, Fanqi Meng, 2019 .

A Comparison of Maximum Likelihood and Median-Rank Regression for Weibull Estimation

William Q. Meeker, Ulrike Genschel, W. Meeker, 2010 .

Prediction of remaining life of power transformers based on left truncated and right censored lifetime data

Yili Hong, William Q. Meeker, James D. McCalley, 2009, 0908.2901.

Weibull Prediction Intervals for a Future Number of Failures

William Q. Meeker, Daniel J. Nordman, W. Meeker, 2002, Technometrics.

Assumptions for statistical inference

William Q. Meeker, Gerald J. Hahn, G. J. Hahn, 1993 .

Methods to Compute Prediction Intervals: A Review and New Results

W. Meeker, D. Nordman, Qinglong Tian, 2020, Statistical Science.

Prediction Intervals for the Ratios of Normal Distribution Sample Variances and Exponential Distribution Sample Means

G. J. Hahn, W. Meeker, 1980 .

Analysis of Window-Observation Recurrence Data

William Q. Meeker, Huaiqing Wu, Jianying Zuo, 2008, Technometrics.

Coverage probabilities of nonparametric simultaneous confidence bands for a survival function

William Q. Meeker, W. Meeker, S. Weston, 1991 .

Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests

William Q. Meeker, Brian P. Weaver, W. Meeker, 2020, Technometrics.

Methods for Planning Repeated Measures Degradation Studies

William Q. Meeker, Brian P. Weaver, Luis A. Escobar, 2013, Technometrics.

Product Component Genealogy Modeling and Field‐failure Prediction

Yili Hong, William Q. Meeker, Caleb King, 2017, Qual. Reliab. Eng. Int..

Statistics Preprints Statistics 2009 Warranty Prediction Based on Auxiliary Use-rate Information

W. Meeker, Yili Hong, 2016 .

Bayesian Methods for Accelerated Destructive Degradation Test Planning

William Q. Meeker, Ying Shi, W. Meeker, 2012, IEEE Transactions on Reliability.

Planning Accelerated Destructive Degradation Test with Competing Risks

William Q. Meeker, Ying Shi, W. Meeker, 2010 .

Trends in the Statistical Assessment of Reliability

William Q. Meeker, W. Meeker, 2010 .

Statistical Methods for Estimating the Minimum Thickness Along a Pipeline

William Q. Meeker, ShiYao Liu, W. Meeker, 2015, Technometrics.

Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring

William Q. Meeker, Luis A. Escobar, Scott W. McKane, 2005, Technometrics.

Using the SAS * System to Assess Local Influence in Regression Analysis with Censored Data

W. Meeker, L. Escobar, 2010 .

Use of Sensitivity Analysis to Assess the Effect of Model Uncertainty in Analyzing Accelerated Life Test Data

William Q. Meeker, Luis A. Escobar, Stephen A. Zayac, 2003 .

Predicting the Number of Future Events

William Q. Meeker, Daniel J. Nordman, Fanqi Meng, 2020, Journal of the American Statistical Association.

Photodegradation modeling based on laboratory accelerated test data and predictions under outdoor weathering for polymeric materials

Yili Hong, William Q. Meeker, Xiaohong Gu, 2017 .

The Future of Industrial Statistics: A Panel Discussion

William Q. Meeker, Nicholas Fisher, Douglas C. Montgomery, 2008, Technometrics.

Bayesian Life Test Planning for Log-Location-Scale Family of Distributions

Yili Hong, William Q. Meeker, Yao Zhang, 2015 .

Bayesian planning of hit-miss inspection tests

William Q. Meeker, Yew-Meng Koh, W. Meeker, 2014 .

Bayesian Design of Reliability Experiments

William Q. Meeker, Yao Zhang, W. Meeker, 2008 .

Planning accelerated life tests with two or more experimental factors

William Q. Meeker, Luis A. Escobar, W. Meeker, 1995 .

Optimum Accelerated Life Tests Wth a Nonconstant Scale Parameter

William Q. Meeker, W. Meeker, Carol A. Meeter, 1994 .

Asymptotic Properties of Bootstrap Likelihood Ratio Statistics for Time Censored Data

S. Lahiri, W. Meeker, Shuen-Lin Jeng, 2003 .

Fisher Information Matrix for the Extreme Value, Normal and Logistic Distributions and Censored Data

William Q. Meeker, Luis A. Escobar, W. Meeker, 1994 .

A BAYESIAN ON-LINE CHANGE DETECTION ALGORITHM WITH PROCESS MONITORING APPLICATIONS

William Q. Meeker, Pradipta Sarkar, W. Meeker, 1998 .

Big data and reliability applications: The complexity dimension

Yili Hong, William Q. Meeker, Man Zhang, 2018, 1803.06206.

Reliability analysis of artificial intelligence systems using recurrent events data from autonomous vehicles pdf

Yili Hong, William Q. Meeker, Caleb B. King, 2021, Journal of the Royal Statistical Society: Series C (Applied Statistics).

Linking Accelerated Laboratory Test with Outdoor Performance Results for a Model Epoxy Coating System

William Q. Meeker, Brian Dickens, Xiaohong Gu, 2008 .

Using Accelerated Life Tests Results to Predict Product Field Reliability

Yili Hong, William Q. Meeker, Luis A. Escobar, 2009, Technometrics.

The Modified Sudden Death Test: Planning Life Tests with a Limited Number of Test Positions

William Q. Meeker, Francis Pascual, W. Meeker, 1998 .

Using degradation models to assess pipeline life

William Q. Meeker, Shiyao Liu, W. Meeker, 2019, Applied Stochastic Models in Business and Industry.

Using Accelerated Tests to Predict Service Life in Highly-Variable Environments

William Q. Meeker, Victor Chan, Luis A. Escobar, 2000 .

Probabilistic Approach to Integrating Thermal Effects in Camber and Stress Analyses of Concrete Beams

William Q. Meeker, Jon Matt Rouse, Sri Sritharan, 2020 .

Statistical Methods for Reliability Data Using SAS R Software

William Q. Meeker, W. Meeker, 1997 .

Estimation of Degradation-Based Reliability in Outdoor Environments

William Q. Meeker, Victor Chan, W. Meeker, 2001 .

Accelerated Destructive Degradation Tests: Data, Models, and Analysis

William Q. Meeker, Luis A. Escobar, Danny L. Kugler, 2003 .

A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images

William Q. Meeker, Ye Tian, Ranjan Maitra, 2017, Technometrics.

Methods for planning repeated measures accelerated degradation tests

William Q. Meeker, Brian P. Weaver, W. Meeker, 2014 .

Reliability Meets Big Data: Opportunities and Challenges

Yili Hong, William Q. Meeker, W. Meeker, 2014 .

More Pitfalls of Accelerated Tests

William Q. Meeker, Georgios Sarakakis, Athanasios Gerokostopoulos, 2013 .

Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information

Yili Hong, William Q. Meeker, W. Meeker, 2013, Technometrics.

Accelerated Destructive Degradation Tests Robust to Distribution Misspecification

William Q. Meeker, Shuen-Lin Jeng, Bei-Ying Huang, 2011, IEEE Transactions on Reliability.

Strategy for Planning Accelerated Life Tests With Small Sample Sizes

Haiming Ma, William Q. Meeker, W. Meeker, 2010, IEEE Transactions on Reliability.

Time Series Modeling of Degradation Due to Outdoor Weathering

William Q. Meeker, W. Meeker, Victor Chan, 2008 .

Pitfalls of accelerated testing

William Q. Meeker, Luis A. Escobar, W. Meeker, 1998 .

Analysis of fatigue data with runouts based on a model with nonconstant standard deviation and a fatigue limit parameter

Francis Pascual, William Q. Meeker, W. Meeker, 1997 .

Statistical tools for the rapid development and evaluation of high-reliability products

William Q. Meeker, M. Hamada, W. Meeker, 1995 .

SPLIDA (S-PLUS Life Data Analysis)

William Q. Meeker, Luis A. Escobar, W. Meeker, 2004 .

Use of Truncated Regression Methods to Estimate the Shelf Life of a Product from Incomplete Historical Data

William Q. Meeker, Luis A. Escobar, W. Meeker, 2001 .

Software for Reliability Data Analysis and Test Planning

William Q. Meeker, Luis A. Escobar, W. Meeker, 2001 .

itfalls of Accelerate

William Q. Meeker, Baton Rouge, Luis A. Escobar, 1998 .

A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions

W. Meeker, Yili Hong, Haiming Ma, 2010, IEEE Transactions on Reliability.

A Spatially Correlated Competing Risks Time-to-Event Model for Supercomputer GPU Failure Data

W. Meeker, G. Ostrouchov, Yili Hong, 2023, arXiv.org.

Early Detection of Reliability Problems Using Information From Warranty Databases

William Q. Meeker, Huaiqing Wu, W. Meeker, 2002, Technometrics.

Detecting cracks in aircraft engine fan blades using vibrothermography nondestructive evaluation

William Q. Meeker, Chunwang Gao, Donna Mayton, 2014, Reliab. Eng. Syst. Saf..

Reliability: The Other Dimension of Quality

William Q. Meeker, Luis A. Escoba, W. Meeker, 2004 .

Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem

William Q. Meeker, Slawomir Koziel, Jiming Song, 2018, ICCS.

Statistical Methods for Degradation Data With Dynamic Covariates Information and an Application to Outdoor Weathering Data

Yili Hong, William Q. Meeker, Xiaohong Gu, 2015, Technometrics.

Planning Life Tests in Which Units Are Inspected for Failure

William Q. Meeker, W. Meeker, 1986, IEEE Transactions on Reliability.

Statistical Assessment of Probability of Detection for Automated Eddy Current Nondestructive Evaluation Inspection

William Q. Meeker, Ming Li, Brian Larson, 2013 .

Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications

William Q. Meeker, W. Meeker, 2003, Technometrics.

Seasonal warranty prediction based on recurrent event data

Yili Hong, William Q. Meeker, Qianqian Shan, 2020, The Annals of Applied Statistics.

Statistical Intervals: A Guide for Practitioners

Luis A. Escobar, G. J. Hahn, W. Meeker, 1991 .

Quantitative Multi-Inspection-Site Comparison of Probability of Detection for Vibrothermography Nondestructive Evaluation Data

William Q. Meeker, Ming Li, Stephen D. Holland, 2011 .

Parametric Simultaneous Confidence Bands for Cumulative Distributions From Censored Data

William Q. Meeker, Shuen-Lin Jeng, W. Meeker, 2001, Technometrics.

W. Meeker, G. Sarakakis, A. Gerokostopoulos, 2013 .

Sample Size and Number of Failure Requirements for Demonstration Tests with Log-Location-Scale Distributions and Type II Censoring

William Q. Meeker, Luis A. Escobar, W. Meeker, 2001 .

Weibull Percentile Estimates and Confidence Limits from Singly Censored Data by Maximum Likelihood

William Q. Meeker, Wayne Nelson, W. Meeker, 1976, IEEE Transactions on Reliability.

Two-sided tolerance intervals for members of the (log)-location-scale family of distributions

Yili Hong, William Q. Meeker, Luis A. Escobar, 2018 .

Applications of statistical methods to nondestructive evaluation

William Q. Meeker, Bryan Olin, W. Meeker, 1996 .

Classification With the Matrix-Variate-t Distribution

William Q. Meeker, Ranjan Maitra, Geoffrey Z. Thompson, 2019, Journal of computational and graphical statistics : a joint publication of American Statistical Association, Institute of Mathematical Statistics, Interface Foundation of North America.

System Reliability Theory: Models and Statistics Methods (Arnljot Høyland and Marvin Rausand)

William Q. Meeker, W. Meeker, 1996, SIAM Review.

Speedier Reliability Analysis

William Q. Meeker, Gerald J. Hahn, Necip Doganaksoy, 2003 .

Reliability: The Other Dimension of Quality

Luis A. Escoba, W. Meeker, 2004 .

Degradation Models and Analyses

Yili Hong, William Q. Meeker, Luis A. Escobar, 2011 .