J. Zwinkels

发表

Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements.

Jian Liu, Mario Noël, Joanne Zwinkels, 2005, Applied optics.

Report on project QR9816B1 gloss measurements at NPL.

J. Zwinkels, A. Hanson, J. A. Taylor, 2000 .

Optical characterization of a reference instrument for gloss measurements in both a collimated and a converging beam geometry.

Jian Liu, Mario Noël, Joanne Zwinkels, 2006, Applied optics.

Issue PDF

J. Zwinkels, M. Lombardi, E. Mulhern, 2016 .

Specular gloss measurement services at the National Research Council of Canada

M. Nöel, J. Zwinkels, 1995 .

Investigation of converging and collimated beam instrument geometry on specular gloss measurements

J. Zwinkels, É. Côté, J. Morgan, 2018 .

Reflectance matrix approach to absolute photoluminescence measurements with integrating spheres.

J. Zwinkels, L. Sandilands, 2019, Optics express.

Determination of spectrophotometer polarization and its use in rapid accurate polarized transmission measurements.

J. Zwinkels, C. Dodd, 1989, Applied optics.

Crystallinity, order, the thin-film silicon continuum, and the spectral dependence of the refractive index in thin silicon films grown through ultra-high-vacuum evaporation for a range of growth temperatures

D. J. Lockwood, M. Nöel, J. Zwinkels, 2021 .

An amorphous-to-crystalline phase transition within thin silicon films grown through ultra-high-vacuum evaporation on fused quartz substrates

D. J. Lockwood, M. Nöel, J. Zwinkels, 2016 .

An amorphous-to-crystalline phase transition within thin silicon films grown by ultra-high-vacuum evaporation and its impact on the optical response

D. J. Lockwood, M. Nöel, J. Zwinkels, 2016 .

Molecular Beam Epitaxially Deposited Amorphous Silicon

D. J. Lockwood, M. Nöel, J. Zwinkels, 2000 .

Disorder and the optical properties of amorphous silicon grown by molecular beam epitaxy

D. J. Lockwood, M. Nöel, J. Zwinkels, 2001 .

Optical dispersion relationships in amorphous silicon grown by molecular beam epitaxy

D. J. Lockwood, M. Nöel, J. Zwinkels, 2001 .

Metrology of photoluminescent materials

J. Zwinkels, 2010 .

Optical absorption in an amorphous silicon superlattice grown by molecular beam epitaxy

D. J. Lockwood, M. Nöel, J. Zwinkels, 2002 .

Amorphous Silicon Films and Superlattices Grown by Molecular Beam Epitaxy: An Optical Analysis

D. J. Lockwood, M. Nöel, J. Zwinkels, 2002 .

Optical properties of UV transmitting acrylics for use in a heavy water Cerenkov detector.

J. Zwinkels, W. F. Davidson, C. Dodd, 1990, Applied optics.

Characterization of a versatile reference instrument for traceable fluorescence measurements using different illumination and viewing geometries specified in practical colorimetry—part 2: sphere geometry (8:d)

M. Nöel, J. Zwinkels, W. Neil, 2017 .

Straining strained molecules - I. The synthesis of the first cyclophane within a cyclophane - [2,2]paracyclo ([2,2]metacyclophane)

J. Zwinkels, R. H. Mitchell, R. Carruthers, 1976 .

Far-infrared diffuse reflectance spectrum of kaolinite

J. Zwinkels, K. Michaelian, 1985 .

Phonon-assisted optical absorption in germanium

D. J. Lockwood, M. Nöel, J. Zwinkels, 2018, Physical Review B.

Surface Fluorescence: the Only Standardized Method of Measuring Luminescence

Joanne C. Zwinkels, J. Zwinkels, 2008 .

The i.r. and Raman spectra of tetrolyl fluoride

J. Zwinkels, W. J. Balfour, K. Beveridge, 1979 .

Spectral Fluorescence Measurements

J. Zwinkels, P. DeRose, J. Leland, 2014 .

Colour-measuring instruments and their calibration

Joanne C. Zwinkels, J. Zwinkels, 1996 .

Photometry, radiometry and ‘the candela’: evolution in the classical and quantum world

Nigel P. Fox, Erkki Ikonen, Maria Luisa Rastello, 2010 .

Theoretical Concepts in Spectrophotometric Measurements

J. Zwinkels, T. Germer, B. Tsai, 2014 .

Thin-film optical function acquisition from experimental measurements of the reflectance and transmittance spectra: a case study

D. J. Lockwood, M. Nöel, J. Zwinkels, 2021, Journal of Materials Science: Materials in Electronics.

Influence of the growth temperature on the spectral dependence of the optical functions associated with thin silicon films grown by ultra-high-vacuum evaporation on optical quality fused quartz substrates

D. J. Lockwood, M. Nöel, J. Zwinkels, 2020, Journal of Materials Science: Materials in Electronics.

State-of-the art comparability of corrected emission spectra. 2. Field laboratory assessment of calibration performance using spectral fluorescence standards.

Ute Resch-Genger, Rainer Macdonald, Paul C DeRose, 2012, Analytical chemistry.

State-of-the art comparability of corrected emission spectra. 1. Spectral correction with physical transfer standards and spectral fluorescence standards by expert laboratories.

Ute Resch-Genger, Rainer Macdonald, Paul C DeRose, 2012, Analytical chemistry.

An international evaluation of holmium oxide solution reference materials for wavelength calibration in molecular absorption spectrophotometry.

Melody V. Smith, K. L. Eckerle, M. Nöel, 2002, Analytical Chemistry.

Quantitative Intensity Measurements By Fourier Transform Infrared Spectroscopy (FT-IR)

John E. Bertie, Hans H. Eysel, V. Behnam, 1985, Other Conferences.

Blackbody and Blackbody Radiation

J. Zwinkels, 2015 .

Design and characterization of a new absolute diffuse reflectance reference instrument at the NRC

Joanne C. Zwinkels, Luke J. Sandilands, Éric Côté, 2018, Optical Engineering + Applications.

Spectrophotometry : accurate measurement of optical properties of materials

Benjamin K. Tsai, Joanne C. Zwinkels, Thomas A. Germer, 2014 .

Intrinsic Wavelength Standard Absorption Bands in Holmium Oxide Solution for UV/visible Molecular Absorption Spectrophotometry

Melody V. Smith, M. Nöel, J. Zwinkels, 2005 .

Joanne C. Zwinkels, M. Nöel, J. Zwinkels, 2016 .

Mise en pratique for the definition of the candela and associated derived units for photometric and radiometric quantities in the International System of Units (SI)

Joaquín Campos Acosta, Emma R. Woolliams, Joanne C. Zwinkels, 2016 .

Specular gloss scales comparison between the national institute of standards and technology and the national research council of canada

Maria E. Nadal, Joanne C. Zwinkels, M. Nöel, 2003 .