J. T. Park

发表

Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination

Daehyun Kim, Jong Tae Park, D. Kim, 2015, Microelectron. Reliab..

Multiple-gate SOI MOSFETs: device design guidelines

Jean-Pierre Colinge, J. T. Park, J. Colinge, 2002 .

Device Instability Under High Gate and Drain Biases in InGaZnO Thin Film Transistors

J. T. Park, W. Cho, S. M. Lee, 2014, IEEE Transactions on Device and Materials Reliability.

Characterization of gate oxide breakdown in junctionless amorphous InGaZnO thin film transistors

J. T. Park, Yoo Jin Chang, Jinho Seo, 2018 .

The Effects of Hot Band Annealing Temperature on the Texture of 2%Si Nonoriented Electrical Steel

J. T. Park, Jae kwan Kim, Jae-young Choi, 2007 .

Cu (InGa) SeTe Nanocrystals Structural and Optical Properties

Ashutosh Kumar Singh, J. T. Park, JunHo Kim, 2015 .

Evolution of recrystallization texture in nonoriented electrical steels

J. T. Park, J. Szpunar, Jong-Tae Park, 2003 .

Memory window characteristics of vertical nanowire MOSFET with asymmetric source/drain for 1T-DRAM application

J. T. Park, Jae Hoon Lee, 2016 .

The impacts of SILC and hot carrier induced drain leakage current on the refresh time in DRAM

Sung H. Hong, J. T. Park, Chong-Gun Yu, 2000 .

Properties of the chalcogenide–carbon nano tubes and graphene composite materials

Ashutosh Kumar Singh, K. S. Sangunni, J. T. Park, 2015 .

Evolution of the Texture on Primary Recrystallization and Grain Growth in Fe-3%Si Steels

J. T. Park, Jae kwan Kim, J. Szpunar, 2007 .

Quantification of magnetic flux density in non-oriented electrical steel sheets by analysis of texture components

J. S. Kim, K. Lee, J. T. Park, 2011 .

Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors

Sang Woo Kim, Jong Tae Park, Won-Ju Cho, 2018, Microelectron. Reliab..

Solution-processed CuI films towards flexible visible-photodetectors: Role of annealing temperature on Cu/I ratio and photodetective properties

J. T. Park, M. Krishnaiah, Ajit Kumar, 2021 .

Role of monoethanolamine concentration for physical properties of Cu2CoSnS4 nanoparticles via one-pot hydrothermal synthesis: Toward low temperature, high performance nanocrystalline CCTS photodetectors by hybrid UV-vacuum annealing

J. T. Park, M. Krishnaiah, Ajit Kumar, 2019, Materials Letters.

Highly crystalline, large grain Cu2CoSnS4 films with reproducible stoichiometry via direct solution spin coating for optoelectronic device application

R. K. Mishra, Seung Gi Seo, J. T. Park, 2019, Ceramics International.

The Impact of Substrate Bias on the Steep Subthreshold Slope in Junctionless MuGFETs

J. T. Park, S. M. Lee, 2013, IEEE Transactions on Electron Devices.

Part I Solid State Physics, Electronics and Optics Section 1 Materials and Fabrication Section 2 Quantum-effect Devices Section 3 Optics and Devices Section 4 Surfaces and Interfaces

J. T. Park, R. J. Aggarwal, Jae‐Jin Lee, 2009 .

Recrystallisation, Grain Growth and Texture Evolution in Nonoriented Electrical Steels

J. T. Park, Jae kwan Kim, J. Szpunar, 2007 .

Effect of Initial Grain Size Prior to Cold Rolling on Annealing Texture in Non-Oriented Electrical Steel

J. T. Park, J. Szpunar, K. Han, 2002 .

See-through metal oxide frameworks for transparent photovoltaics and broadband photodetectors

J. T. Park, Joondong Kim, A. Rana, 2019, Nano Energy.

Annealing temperature and stabilizer effects on morphological evolution of Cu2CoSnS4 films on thermally oxidized Si wafers via direct spin-coating

R. K. Mishra, Seung Gi Seo, J. T. Park, 2019, Journal of Alloys and Compounds.

Monte Carlo Simulation of Texture and Microstructure Transformation during Annealing of Steel

J. T. Park, J. Szpunar, H. Li, 2007 .

Device instability of amorphous InGaZnO thin film transistors with transparent source and drain

Jong-Tae Park, Sang Min Kim, Min-Ju Ahn, 2016, Microelectron. Reliab..

P-15: Prediction Method of Device Instability in a-InGaZnO TFTs under Positive Gate Biases and Thermal Stresses using TCAD Simulation

J. T. Park, W. Cho, Jong-Tea Park, 2017 .

The effect of gate overlap on the device degradation in IGZO thin film transistors

Daehyun Kim, Jong Tae Park, J. T. Park, 2014, Microelectron. Reliab..

Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics

Se Won Lee, Jong-Tae Park, Seul Ki Lee, 2012, Microelectron. Reliab..

Device Degradation with Gate Lengths and Gate Widths in InGaZnO Thin Film Transistors

J. T. Park, Jong-Tea Park, Jae-Ki Lee, 2012 .

Device Degradation Under High Gate and Drain Bias Stress in IGZO Transistors

J. T. Park, Jong-Tea Park, S. M. Lee, 2013 .

Device performances and instabilities of the engineered active layer with different film thickness and composition ratios in amorphous InGaZnO thin film transistors

J. T. Park, W. Cho, E. Hong, 2020 .

Reliability improvement by the suppression of keyhole generation in W-plug vias

Jong-Tae Park, Kyosun Kim, Seok Hee Jeon, 2005, Microelectron. Reliab..

Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors

Jong-Tae Park, Seung Min Lee, Hyun Jun Jang, 2013, Microelectron. Reliab..

A Quantum Definition of Threshold Voltage in MuGFETs

J. T. Park, D. Lederer, Chong-Gun Yu, 2007, 2007 IEEE International SOI Conference.

Goss Texture Formation by Strain Induced Boundary Migration in Semi-Processed Nonoriented Electrical Steels

J. T. Park, K. Han, 2012 .

Texture Evolution during Recrystallization in Nonoriented Electrical Steels

J. T. Park, Jae kwan Kim, J. Szpunar, 2007 .

Texture Development during Final Annealing in Nonoriented Electrical Steels

J. T. Park, Jae kwan Kim, J. Szpunar, 2005 .

Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain

Jae Won Kim, Jong-Tae Park, Jong Hoon Lee, 2016, Microelectron. Reliab..