H. Yun

发表

Anomalous Stress-Induced Hump Effects in Amorphous Indium Gallium Zinc Oxide TFTs

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Investigation of zinc interstitial ions as the origin of anomalous stress-induced hump in amorphous indium gallium zinc oxide thin film transistors

Ga-Won Lee, Seung-Dong Yang, Ho-Jin Yun, 2013 .

Investigation of atomic-layer-deposited Al-doped ZnO film for AZO/ZnO double-stacked active layer thin-film transistor application

H. Yun, Seung-Dong Yang, H. Lee, 2017 .

Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis

Yu-Mi Kim, K. Jeong, H. Yun, 2013 .

The Short Channel Effect Immunity of Silicon Nanowire SONOS Flash Memory Using TCAD Simulation

Ga-Won Lee, Seung-Dong Yang, Ho-Jin Yun, 2013 .

Crystal Quality Effect on Low-Frequency Noise in ZnO TFTs

Yu-Mi Kim, K. Jeong, H. Yun, 2011, IEEE Electron Device Letters.

Effect of interfacial reactions between atomic-layer-deposited HfO2 films and n-GaAs (100) substrate using postnitridation with NH3 vapor

H. Yun, K. Chung, Hyunsoo Lee, 2010 .

Analysis of Nitride traps in MONOS Flash Memory

Yu-Mi Kim, H. Yun, Seung-Dong Yang, 2015 .

Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress

Yu-Mi Kim, K. Jeong, H. Yun, 2014 .

High performance SONOS flash memory with in-situ silicon nanocrystals embedded in silicon nitride charge trapping layer

H. Yun, Seung-Dong Yang, H. Lee, 2017 .

Improvement of Electrical Performance and Stability in ZnO Channel TFTs with Al Doped ZnO Layer

Yu-Mi Kim, K. Jeong, H. Yun, 2015 .

A Light-induced Threshold Voltage Instability Based on a Negative-U Center in a-IGZO TFTs with Different Oxygen Flow Rates

Yu-Mi Kim, K. Jeong, H. Yun, 2014 .

RTS Noise Analysis in Fin‐type Silicon‐Oxide‐High‐k‐Oxide‐Silicon Flash Memory

K. Jeong, H. Yun, Seung-Dong Yang, 2012 .

Analysis of Fin-Type SOHOS Flash Memory using Hafnium Oxide as Trapping Layer

Yu-Mi Kim, K. Jeong, H. Yun, 2010 .

The Post‐Annealing Effects of N‐Doped ZnO Films Deposited by the Atomic Layer Deposition

K. Jeong, H. Yun, Seung-Dong Yang, 2012 .

Chemical bonding structures of silicon oxynitride films grown by ionised N2 and pure O2 gas mixtures at low temperature

H. Yun, M. Jung, J. Lee, 2011 .

Interface Treatment Effect of High Performance Flexible Organic Thin Film Transistor (OTFT) Using PVP Gate Dielectric in Low Temperature

H. Yun, H. Lee, Ga-Won Lee, 2011 .

A Study on the Corner Effect of Fin-type SONOS Flash Memory Using TCAD Simulation

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Electrical, Structural and Optical Characteristic Analysis of Al-doped ZnO Film Deposited by Atomic Layer Deposition

Yu-Mi Kim, K. Jeong, H. Yun, 2011 .

Enhanced Photo Current in n-ZnO/p-Si Diode Via Embedded Ag Nanoparticles for the Solar Cell Application

Yu-Mi Kim, K. Jeong, H. Yun, 2015 .

An analysis on applicability of Ti-doped ZnO films as the channel layer of TFTs

Yu-Mi Kim, K. Jeong, H. Yun, 2010, 2010 IEEE Nanotechnology Materials and Devices Conference.

Dual etch processes of via and metal paste filling for through silicon via process

Kwang-Ho Kwon, Lee-Mi Do, Ho-Jin Yun, 2011 .

Electrical Characterization in Pillar Type Silicon‐Oxide‐Nitride‐Oxide‐Silicon Flash Memory using Bandgap Engineering Method

H. Yun, Seung-Dong Yang, Sang-Youl Lee, 2012 .

Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO2 and S3N4 as Trapping Layer

Sang-Youl Lee, Hi-Deok Lee, Ga-Won Lee, 2012, IEICE Trans. Electron..

P‐Type Conductive Behaviors of AlN Co‐Doped ZnO Films Deposited by the Atomic Layer Deposition

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Novel silicon surface passivation by Al2O3/ZnO/Al2O3 films deposited by thermal atomic layer deposition

Ga-Won Lee, Ho-Jin Yun, Kwang-Seok Jeong, 2014 .

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Yu-Mi Kim, K. Jeong, H. Yun, 2013, Electronic Materials Letters.

Hysteresis analysis in excimer‐laser‐annealed low‐temperature polycrystalline‐silicon thin‐film transistors

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Channel engineering of ZnO-based thin film transistors using Al2O3 interlayer grown by atomic layer deposition

Yu-Mi Kim, K. Jeong, H. Yun, 2014 .

Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O2 Ambient

K. Jeong, H. Yun, Seung-Dong Yang, 2012 .

The 1/f Noise Analysis of 3D SONOS Multi Layer Flash Memory Devices Fabricated on Nitride or Oxide Layer

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si3N4 and Si3N4/Al2O3 Gate Dielectrics

Yu-Mi Kim, K. Jeong, H. Yun, 2012 .

Analysis of the Threshold Voltage Instability of Bottom-Gated ZnO TFTs with Low-Frequency Noise Measurements

Yu-Mi Kim, K. Jeong, H. Yun, 2010 .

Investigation of Low-Temperature Processed Amorphous ZnO TFTs Using a Sol-Gel Method

H. Yun, Seung-Dong Yang, Hyo Jin Kim, 2017 .

Improvement of reliability characteristics using the N2 implantation in SOHOS flash memory

Yu-Mi Kim, K. Jeong, H. Yun, 2010, 2010 IEEE Nanotechnology Materials and Devices Conference.

Effect of Al2O3 Capping Layer in ZnO TFT Fabricated by Atomic Layer Deposition

K. Jeong, H. Yun, Seung-Dong Yang, 2013 .

Current–voltage and low-frequency noise analysis of heterojunction diodes with various passivation layers

Yu-Mi Kim, K. Jeong, H. Yun, 2016 .