R. Truche
发表
J. L. Pelloie,
E. Delagnes,
O. Flament,
1998
.
M. Dentan,
E. Delagnes,
M. Rouger,
1993
.
M. Dentan,
E. Delagnes,
R. Truche,
1994
.
M. Dentan,
P. Borgeaud,
M. Rouger,
1993
.
M. Dentan,
E. Delagnes,
R. Truche,
1991
.
A. Umbert,
B. Giffard,
Michel Bruel,
1988
.
R. Truche,
Y. Campidelli,
D. Bensahel,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
F. Andrieu,
T. Ernst,
2003,
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..
X. Garros,
O. Faynot,
P. Batude,
2010,
2010 Symposium on VLSI Technology.
O. Faynot,
B. Paul,
D. Lachartre,
1998,
1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255).
R. Truche,
P. Roche,
E. Orsier,
1996
.
Eric Delagnes,
R. Truche,
R. Chipaux,
1997
.
M. Dentan,
P. Abbon,
P. Borgeaud,
1995,
1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record.
R. Truche,
C. Leroux,
G. Ghibaudo,
2010
.
R. Truche,
J. Hartmann,
P. Rivallin,
2007
.
R. Truche,
L. Arnaud,
T. Berger,
2001
.
R. Truche,
J. Hartmann,
A. Papon,
2003
.
R. Truche,
S. Deleonibus,
T. Ernst,
2004
.
R. Truche,
H. Moriceau,
F. Laugier,
2004
.
Yves Campidelli,
Y. Bogumilowicz,
R. Truche,
2005
.
Y. Bogumilowicz,
Jean-Michel Hartmann,
R. Truche,
2004
.
Quantitative off‐axis electron holography of GaAs p‐n junctions prepared by focused ion beam milling
P. Midgley,
R. Truche,
R. Dunin‐Borkowski,
2009,
Journal of microscopy.
R. Truche,
J. Hartmann,
F. Bertin,
2008
.
R. Truche,
J. Rouviere,
D. Cooper,
2008,
Ultramicroscopy.
Eric Delagnes,
A. Mekkaoui,
O. Flament,
1994
.
X. Garros,
G. Reimbold,
Emmanuel Augendre,
2009
.
G. Le Carval,
M. Vinet,
S. Deleonibus,
2008
.
M. Vinet,
J.-M. Hartmann,
E. Augendre,
2009,
2009 International Symposium on VLSI Technology, Systems, and Applications.
R. Truche,
J. Hartmann,
E. Augendre,
2010
.
R. Truche,
J. Pontcharra,
A. Papon,
1987
.
T. Ernst,
J.-M. Hartmann,
S. Deleonibus,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
A new nondestructive X-ray method for the determination of the 3D mineralogy at the micrometer scale
M. Chukalina,
Alexandre Simionovici,
Laurence Lemelle,
2004
.
Thomas Skotnicki,
Sorin Cristoloveanu,
Simon Deleonibus,
2003,
2003 8th International Symposium Plasma- and Process-Induced Damage..
X. Garros,
S. Deleonibus,
C. Leroux,
2002,
Digest. International Electron Devices Meeting,.
O. Faynot,
O. Flament,
R. Truche,
1997
.