E. P. Vandamme

Unsolved problems on 1/f noise in MOSFETs and possible solutions

E. P. Vandamme, L.K.J. Vandamme, 2000 .

Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements

Servaas Vandenberghe, Jan Verspecht, E. P. Vandamme, 2001 .

Reliability assessment of potentiometers by 1/f noise analysis

E. P. Vandamme, L.K.J. Vandamme, 1994 .

Current crowding and its effect on 1/f noise and third harmonic distortion – a case study for quality assessment of resistors

E. P. Vandamme, E. Vandamme, L. Vandamme, 2000 .

Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes

E. P. Vandamme, L.K.J. Vandamme, E. Vandamme, 1997 .

Diagnostics of the quality of MOSFETs

E. P. Vandamme, E. Vandamme, L. Vandamme, 1996 .

Critical discussion on unified 1/f noise models for MOSFETs

E. P. Vandamme, E. Vandamme, L. Vandamme, 2000 .

Impact of non-quasi-static effects on the high frequency small-signal behaviour of MOSFETs

E. P. Vandamme, G. Badenes, E. Vandamme, 2000, ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453).

Parameter extraction and 1/f noise in a surface and a bulk-type p-channel LDD MOSFET

E. P. Vandamme, L.K.J. Vandamme, E. Vandamme, 1994 .

Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: Process window versus complexity

Emmanuel Augendre, Rita Rooyackers, E. P. Vandamme, 2000 .