P. Eaton

发表

J.D. Black, P.H. Eaton, J.R. Chavez, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

P. Eaton, S. Buchner, D. Mcmorrow, 2009, IEEE Transactions on Nuclear Science.

K. Avery, P. Eaton, P. Dodd, 2004, IEEE Transactions on Nuclear Science.

K. Avery, P. Eaton, M. Gadlage, 2004, IEEE Transactions on Nuclear Science.

W. T. Holman, W. H. Robinson, peixiong zhao, 2007, IEEE Transactions on Nuclear Science.

P. Eaton, D. Mavis, Mavis, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

P. Eaton, J. Ahlbin, L. Massengill, 2009, IEEE Transactions on Nuclear Science.

B. Narasimham, B.L. Bhuva, peixiong zhao, 2007, IEEE Transactions on Nuclear Science.

P. Eaton, M. Gadlage, T. Turflinger, 2005, IEEE Transactions on Nuclear Science.

Lloyd W. Massengill, Phillip P. Jenkins, Joseph S. Melinger, 2007 .

Paul H. Eaton, David G. Mavis, M. D. Sibley, 2009, 2009 IEEE International Conference on IC Design and Technology.

B. Narasimham, B.L. Bhuva, A. Balasubramanian, 2008, IEEE Transactions on Nuclear Science.

P.H. Eaton, D.G. Mavis, M.D. Sibley, 2008, IEEE Transactions on Nuclear Science.

P.H. Eaton, D.G. Mavis, P. Eaton, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

M.J. Gadlage, P.H. Eaton, Vivian Zhu, 2006, IEEE Transactions on Nuclear Science.

P.H. Eaton, D.G. Mavis, J.M. Benedetto, 2006, IEEE Transactions on Nuclear Science.

M.J. Gadlage, P.H. Eaton, J.M. Benedetto, 2005, IEEE Transactions on Nuclear Science.

R.D. Schrimpf, M.J. Gadlage, P.H. Eaton, 2004, IEEE Transactions on Nuclear Science.

M.J. Gadlage, P.H. Eaton, R.D. Schrimpf, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

B. Narasimham, W. T. Holman, B.L. Bhuva, 2007, IEEE Transactions on Nuclear Science.

L. W. Massengill, B. L. Bhuva, B. Narasimham, 2011, IEEE Transactions on Device and Materials Reliability.