M. Leicht

Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction

Wolfgang Fichtner, Mauro Ciappa, Maria Stangoni, 2002, Microelectron. Reliab..

Prediction of wafer bow through thermomechanical simulation of patterned hard coated copper films

T. Detzel, M. Leicht, Rui Huang, 2008, EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.

Reliability and Lifetime Estimation of Sintered Silver Die Attach for Different Accelerated Testing Conditions

M. Leicht, B. Wunderle, J. Heilmann, 2022, 2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC).

Determination of Rate- and Temperature Dependent Inelastic Material Data for Sintered Silver Die Attach and Simulative Implementation

M. Leicht, B. Wunderle, J. Heilmann, 2022, International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems.

A Parametric Simulative Study for Si and SiC Semiconductor Devices Under Various Accelerated Testing Conditions Using Rate- and Temperature Dependent Inelastic Material Data

M. Leicht, B. Wunderle, J. Heilmann, 2021, International Workshop on Thermal Investigations of ICs and Systems.

A Parametric Simulative Study for Lifetime Prediction of Sintered Silver Die Attach Under Different Accelerated Testing Conditions

M. Leicht, B. Wunderle, J. Heilmann, 2021, 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

2D Dopant Profiling on 4H Silicon Carbide P+N Junction by Scanning Capacitance and Scanning Electron Microscopy

Wolfgang Fichtner, Mauro Ciappa, Maria Stangoni, 2004, Microelectron. Reliab..

Progress in quantitative magnetic domain observation

M. Leicht, Jeffrey McCord, M. Leicht, 1993 .

Inverse modeling of oxid deposition using measurements of a TEOS CVD process

S. Selberherr, J. Fugger, M. Leicht, 2005, Research in Microelectronics and Electronics, 2005 PhD.