F. Schanovsky
发表
Karl Rupp,
Tibor Grasser,
Ben Kaczer,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
M. Nelhiebel,
T. Grasser,
F. Schanovsky,
2011,
IEEE Transactions on Electron Devices.
T. Grasser,
M. Waltl,
F. Schanovsky,
2013,
2013 IEEE International Electron Devices Meeting.
T. Grasser,
M. Waltl,
F. Schanovsky,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
F. Schanovsky,
H. Reisinger,
2010,
2010 IEEE International Reliability Physics Symposium.
F. Schanovsky,
An Chen,
D. V. Blerkom,
2013
.
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
F. Schanovsky,
O. Baumgartner,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
T. Grasser,
F. Schanovsky,
W. Gos,
2011
.
T. Grasser,
F. Schanovsky,
V. Sverdlov,
2012
.
T. Grasser,
F. Schanovsky,
W. Goes,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
T. Grasser,
M. Waltl,
F. Schanovsky,
2014,
IEEE Transactions on Electron Devices.
T. Grasser,
M. Waltl,
G. Rzepa,
2014,
2014 IEEE International Electron Devices Meeting.
T. Grasser,
F. Schanovsky,
W. Goes,
2013,
2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
F. Schanovsky,
W. Gös,
2010
.
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013
.
G. Rzepa,
C. Kernstock,
O. Baumgartner,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
T. Grasser,
B. Stampfer,
M. Waltl,
2018,
IEEE Journal of the Electron Devices Society.
T. Grasser,
F. Schanovsky,
2014
.
T. Grasser,
F. Schanovsky,
2011,
2012 IEEE International Reliability Physics Symposium (IRPS).
T. Grasser,
F. Schanovsky,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.
F. Schanovsky,
M. Karner,
D. Verreck,
2019,
2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
T. Grasser,
B. Stampfer,
M. Waltl,
2020,
Micromachines.
Tibor Grasser,
Wolfgang Goes,
F. Schanovsky,
2014
.
F. Schanovsky,
W. Goes,
T. Crasser,
2010,
2010 14th International Workshop on Computational Electronics.
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2010,
2010 International Electron Devices Meeting.
R. L. de Orio,
S. Selberherr,
F. Schanovsky,
2011,
2011 International Conference on Simulation of Semiconductor Processes and Devices.
M. Rosmeulen,
G. Rzepa,
F. Schanovsky,
2021,
2021 IEEE International Electron Devices Meeting (IEDM).
Dimitri Linten,
Geert Hellings,
Jacopo Franco,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Ming Liu,
F. Schanovsky,
Hong Yang,
2021,
Symposium on VLSI Technology.
K. Steiner,
Markus Karner,
Zoran Stanojevic,
2018,
2018 48th European Solid-State Device Research Conference (ESSDERC).
F. Schanovsky,
C. Kernstock,
Z. Stanojević,
2024,
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
T. Grasser,
F. Schanovsky,
B. Kaczer,
2013
.