D. Tsai

Du-Ming Tsai, Wei-Yao Chiu, D. Tsai, 2010, 2010 7th International Conference on Ubiquitous Intelligence & Computing and 7th International Conference on Autonomic & Trusted Computing.

A Macro-Observation Scheme for Abnormal Event Detection in Daily-Life Video Sequences

Du-Ming Tsai, Wei-Yao Chiu, D. Tsai, 2010, EURASIP J. Adv. Signal Process..

Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques

Shu-Kai S. Fan, Du-Ming Tsai, Fei He, 2019, IEEE Transactions on Semiconductor Manufacturing.

Self-Assured Deep Learning With Minimum Pre-Labeled Data for Wafer Pattern Classification

Shu-Kai S. Fan, D. Tsai, Ya-Fang Shih, 2023, IEEE Transactions on Semiconductor Manufacturing.

Automatic surface inspection using wavelet reconstruction

Bo Hsiao, Du-Ming Tsai, D. Tsai, 2001, Pattern Recognit..

Defect detection in colored texture surfaces using Gabor filters

D. Tsai, Chih‐Ping Lin, Kuo-Tang Huang, 2003 .

Automated surface inspection using Gabor filters

D. Tsai, D. M. Tsai, S. K. Wu, 2000 .

A stochastic optimization approach for roundness measurement

Hsien-Yu Tseng, Du-Ming Tsai, Mu-Chen Chen, 1999, Pattern Recognit. Lett..

Non-referential, self-compared shape defect inspection for bond pads with deformed shapes

Du-Ming Tsai, Yan-Jheng Su, D. Tsai, 2009 .

USING INDEPENDENT COMPONENT ANALYSIS BASED PROCESS MONITORING IN TFT-LCD MANUFACTURING

Du-Ming Tsai, Yan-Hsin Tseng, D. Tsai, 2006 .

Curve fitting approach for tangent angle and curvature measurements

Du-Ming Tsai, Ming-fong Chen, D. Tsai, 1994, Pattern Recognit..

DEFECT INSPECTION OF PATTERNED TFT-LCD PANELS USING A FAST SUB-IMAGE BASED SVD

Du-Ming Tsai, Chi-Jie Lu, D. Tsai, 2004 .

Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction

D. Tsai, Yan-Hsin Tseng, S. Fan, 2018 .

1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations

Du-Ming Tsai, Su-Ta Chuang, D. Tsai, 2009, Machine Vision and Applications.

Independent component analysis-based defect detection in patterned liquid crystal display surfaces

Du-Ming Tsai, Chi-Jie Lu, D. Tsai, 2008, Image Vis. Comput..

One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction

Du-Ming Tsai, S.-T. Chuang, Y.-H. Tseng, 2007 .

Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition

C.-Y. Hung, D.-M. Tsai, D. Tsai, 2005 .

LCD SURFACE DEFECT INSPECTION USING MACHINE VISION

Bernard C. Jiang, Du-Ming Tsai, Chi-Jie Lu, 2004 .

Independent Component Analysis-Based Background Subtraction for Indoor Surveillance

D. Tsai, Shia-Chih Lai, 2009, IEEE Transactions on Image Processing.

Rotation-invariant pattern matching using wavelet decomposition

Du-Ming Tsai, Cheng-Huei Chiang, D. Tsai, 2002, Pattern Recognit. Lett..

Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification

Du-Ming Tsai, Morris S. K. Fan, Yi-Quan Huang, 2019, VISIGRAPP.

A fast focus measure for video display inspection

C.-C. Chou, D.-M. Tsai, D. Tsai, 2003, Machine Vision and Applications.

Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing

Shu-Kai S. Fan, D. Tsai, Pei-Chi Yeh, 2023, IEEE Transactions on Semiconductor Manufacturing.