G. Shedd

Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application

D. Croft, G. Shedd, S. Devasia, 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).

The scanning tunneling microscope as a tool for nanofabrication

G. Shedd, P. Russell, 1990 .

Focused ion beam induced deposition of gold

John Melngailis, H. J. Lezec, G. Shedd, 1986 .

Summary Abstract: Ion-beam-induced deposition of gold by focused and broad-beam sources

G. Shedd, H. Lezec, J. Melngailis, 1987 .

Electron interference effects in electron projection microscopy

G. Shedd, 1994 .

A simple wave function interference model for the electron-density superstructures observed during scanning tunneling microscopy of perturbed graphite surfaces

G. Shedd, P. Russell, 1992 .

Field electron emission, the atom probe and scanning tunneling spectroscopy

G. Shedd, J. Hren, 1988 .

The effects of low-energy ion impacts on graphite observed by scanning tunneling microscopy

G. Shedd, P. Russell, 1991 .

H2O enhanced focused ion beam micromachining

Dieter P. Griffis, G. Shedd, P. Russell, 1995 .

Characterization of focused ion beam micromachined features

G. Shedd, P. Russell, D. Griffis, 1989 .