Daniel Marienfeld

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2004, Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..

Self-checking Carry-selectAdder with Sum-bit Duplication

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2004, ARCS Workshops.

New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2005, 14th Asian Test Symposium (ATS'05).

A new self-checking sum-bit duplicated carry-select adder

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

Array Termination Impacts in Advanced SRAM

Randy W. Mann, Daniel Marienfeld, Xiaoqiang Zhang, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Effiziente Fehlererkennung für arithmetische Einheiten

Daniel Marienfeld, 2007 .

Self-checking code-disjoint carry-select adder with low area overhead by use of add1-circuits

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2004, Proceedings. 10th IEEE International On-Line Testing Symposium.

A modulo p checked self-checking carry select adder

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..

A new self-checking and code-disjoint non-restoring array divider

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

Partially duplicated code-disjoint carry-skip adder

Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld, 2002, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..