K. Kim

High‐Current‐Density CuO x/InZnOx Thin‐Film Diodes for Cross‐Point Memory Applications

I. Baek, Myoung-Jae Lee, Chang Bum Lee, 2008 .

Reliability investigations for manufacturable high density PRAM

Kinarn Kim, Su Jin Ahn, K. Kim, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Low‐Temperature‐Grown Transition Metal Oxide Based Storage Materials and Oxide Transistors for High‐Density Non‐volatile Memory

Young-soo Park, Huaxiang Yin, Seung-Eon Ahn, 2009 .

Electrical manipulation of nanofilaments in transition-metal oxides for resistance-based memory.

Jung-Hyun Lee, Jong-Bong Park, Chang Jung Kim, 2009, Nano letters.

Multilevel Programmable Oxide Diode for Cross-Point Memory by Electrical-Pulse-Induced Resistance Change

Chang Jung Kim, Seung-Eon Ahn, Myoung-Jae Lee, 2009, IEEE Electron Device Letters.

Stackable All-Oxide-Based Nonvolatile Memory With $ \hbox{Al}_{2}\hbox{O}_{3}$ Antifuse and $\hbox{p-CuO}_{x}/ \hbox{n-InZnO}_{x}$ Diode

Chang Jung Kim, Seung-Eon Ahn, Myoung-Jae Lee, 2009, IEEE Electron Device Letters.