N. Mielke
发表
R. E. Shiner,
H. Belgal,
N. Righos,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
H. Belgal,
N. Righos,
N. Mielke,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
P. Kalavade,
H. Belgal,
N. Righos,
2004,
IEEE Transactions on Device and Materials Reliability.
N. Mielke,
S. Rangan,
E.C.C. Yeh,
2003,
IEEE International Electron Devices Meeting 2003.
N. Mielke,
N. Mielke,
G. Verma,
1988,
26th Annual Proceedings Reliability Physics Symposium 1988.
Yung-Huei Lee,
Yin-Lung Ryan Lu,
Sangwoo Pae,
2007,
IEEE Transactions on Device and Materials Reliability.
G. Atwood,
T. C. Ong,
A. Fazio,
1993,
Symposium 1993 on VLSI Technology.
N. Mielke,
K. Seshan,
R. Nachman,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
Yung-Huei Lee,
S. Gupta,
N. Mielke,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
J. Kessenich,
Todd A. Marquart,
N. Mielke,
2008,
2008 IEEE International Reliability Physics Symposium.
Yung-Huei Lee,
N. Mielke,
W. McMahon,
2008,
2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
Neal R. Mielke,
Robert E. Frickey,
Ivan Kalastirsky,
2017,
Proceedings of the IEEE.
Chen Gu,
R.F. Kwasnick,
N.R. Mielke,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
Yung-Huei Lee,
N. Mielke,
R. Nachman,
2003,
IEEE International Electron Devices Meeting 2003.
Steve Jacobs,
Neal Mielke,
Yung-Huei Lee,
2005,
Microelectron. Reliab..