S. Buchner

发表

Attenuation of single event induced pulses in CMOS combinational logic

M. Baze, S. Buchner, 1997 .

Heavy ion and proton-induced single event multiple upset

R. Reed, O. Musseau, T. Corbiere, 1997 .

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

R. Reed, S. Buchner, M. Carts, 2000 .

Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter String

P. Eaton, S. Buchner, D. Mcmorrow, 2009, IEEE Transactions on Nuclear Science.

Critical charge for single-event transients (SETs) in bipolar linear circuits

peixiong zhao, R. Pease, S. Buchner, 2001 .

Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques

C. Hafer, S. Hisano, A. Zanchi, 2011, IEEE Transactions on Nuclear Science.

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2004 .

Three-dimensional mapping of single-event effects using two photon absorption

L. W. Massengill, R. L. Pease, William T. Lotshaw, 2003 .

Focused-lon-beam assisted bipolar transistor characterization and analog single-event transient circuit analysis of the OP27

L. W. Massengill, Andrew L. Sternberg, Robert A. Weller, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

The role of parasitic elements in the single-event transient response of linear circuits

Lloyd W. Massengill, R. L. Pease, Andrew L. Sternberg, 2002 .

Subbandgap laser-induced single event effects: carrier generation via two-photon absorption

R. Pease, S. Buchner, J. Melinger, 2002 .

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

D. S. Walsh, Lloyd W. Massengill, R. L. Pease, 2002 .

Single Event Transient Characterization in the LM 119 Voltage Comparator

S. Buchner, D. Mcmorrow, A. Sternberg, 2002 .

Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

S. Buchner, J. Melinger, A. Campbell, 1994 .

Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

S. Buchner, D. Mcmorrow, P. McMarr, 2015, IEEE Transactions on Nuclear Science.

Pulsed-laser testing methodology for single event transients in linear devices

C. Poivey, D. McMorrow, S. Buchner, 2004, IEEE Transactions on Nuclear Science.

Measurement and Analysis of Multiple Output Transient Propagation in BJT Analog Circuits

S. Buchner, D. Mcmorrow, J. Warner, 2016, IEEE Transactions on Nuclear Science.

Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference

S. Buchner, L. Dusseau, D. Mcmorrow, 2012, IEEE Transactions on Nuclear Science.

Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays

L Dusseau, J Boch, F Saigne, 2011, IEEE Transactions on Nuclear Science.

Carrier lifetime variation in thick 4H-SiC epilayers using two-photon absorption

S. Buchner, P. Klein, R. Stahlbush, 2017 .

A digital CMOS design technique for SEU hardening

M. Baze, S. Buchner, D. Mcmorrow, 2000 .

Variable Depth Bragg Peak Method for Single Event Effects Testing

S. Buchner, D. Mcmorrow, P. O'Neill, 2011, IEEE Transactions on Nuclear Science.

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

J. C. Pickel, R. Reed, S. Buchner, 2003 .

Dependence of the SEU window of vulnerability of a logic circuit on magnitude of deposited charge

S. Buchner, K. Kang, D. Krening, 1993 .

Comparison of error rates in combinational and sequential logic

M. Baze, S. Buchner, D. Brown, 1997 .

Rate predictions for single-event effects - critique II

S. Buchner, D. Mcmorrow, L. Massengill, 2005, IEEE Transactions on Nuclear Science.

Single-Event Effect Performance of a Commercial Embedded ReRAM

Hak S. Kim, S. Buchner, K. Label, 2014, IEEE Transactions on Nuclear Science.

Single-event upset in flip-chip SRAM induced by through-wafer, two-photon absorption

S. Buchner, J. Melinger, D. Mcmorrow, 2005, IEEE Transactions on Nuclear Science.

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

J. Perry, S. Buchner, J. Melinger, 2014, IEEE Transactions on Nuclear Science.

Evaluating the Effects of Single Event Transients in FET-Based Single-Pole Double-Throw RF Switches

David M. Fleischhauer, S. Buchner, J. Cressler, 2014, IEEE Transactions on Nuclear Science.

Laser Simulation of Single Event Upsets

W. D. Raburn, S. Buchner, A. Campbell, 1987, IEEE Transactions on Nuclear Science.

Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors

J. Pelloie, O. Musseau, S. Buchner, 2000 .

Single-Event Effects in a W-Band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2015, IEEE Transactions on Nuclear Science.

The effects of radiation on MEMS accelerometers

A. B. Campbell, Alvin R. Knudson, S. P. Buchner, 1996 .

Response of a MEMS Microshutter Operating at 60 K to Ionizing Radiation

S. Buchner, T. Hait, H. Moseley, 2007, IEEE Transactions on Nuclear Science.

Evidence for angular effects in proton-induced single-event upsets

K. A. LaBel, Paul W. Marshall, Raymond L. Ladbury, 2002 .

Single-Event Effects in High-Frequency Linear Amplifiers: Experiment and Analysis

John D. Cressler, Hanbin Ying, Jeffrey H. Warner, 2017, IEEE Transactions on Nuclear Science.

Medium-energy heavy-ion single-event-burnout imaging of power MOSFETs

O. Musseau, S. Buchner, A. Campbell, 1999 .

Charge collection in GaAs MESFET circuits using a high energy microbeam

S. Buchner, A. Campbell, D. Mcmorrow, 1996 .

Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing

S. Buchner, D. Mcmorrow, Adrian Ildefonso, 2021, IEEE Transactions on Nuclear Science.

SEU measurements and predictions on MPTB for a large energetic solar particle event

A. B. Campbell, S. P. Buchner, Clive Dyer, 2002 .

Analysis of multiple bit upsets (MBU) in CMOS SRAM

A. B. Campbell, Joseph S. Melinger, Robert A. Reed, 1996 .

Proton-Induced Single Event Multiple Upset

S. Buchner, J. Melinger, T. Corbi, 1997 .

Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing

A. B. Campbell, S. Buchner, Alvin R. Knudson, 1990 .

Artificial neural network robustness for on-board satellite image processing: results of upset simulations and ground tests

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1997 .

Pulsed laser validation of recovery mechanisms of critical SEE's in an artificial neural network system

S. Buchner, J. Melinger, D. Mcmorrow, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

Investigation of single-ion multiple-bit upsets in memories on board a space experiment

D. McMorrow, S. Buchner, S. Kuboyama, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Correlation of Pulsed-Laser Energy and Heavy-Ion LET by Matching Analog SET Ensemble Signatures and Digital SET Thresholds

S. Buchner, A. Zanchi, C. Hafer, 2013, IEEE Transactions on Nuclear Science.

Effect of amplifier parameters on single-event transients in an inverting operational amplifier

Lloyd W. Massengill, R. L. Pease, S. P. Buchner, 2002 .

Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

T. Scott, Dale McMorrow, Nadim F. Haddad, 1999 .

New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles

George N. Tzintzarov, S. Buchner, J. Cressler, 2020, IEEE Transactions on Nuclear Science.

Optimizing Optical Parameters to Facilitate Correlation of Laser- and Heavy-Ion-Induced Single-Event Transients in SiGe HBTs

Zachary E. Fleetwood, George N. Tzintzarov, S. Buchner, 2019, IEEE Transactions on Nuclear Science.

Application of a Pulsed Laser to Identify a Single-Event Latchup Precursor

S. Buchner, D. Mcmorrow, V. Ferlet-Cavrois, 2015, IEEE Transactions on Nuclear Science.

Three-Dimensional Modeling of the Two Photon Absorption Effect in a Complex Bipolar Transistor

R. Pease, S. Buchner, J. Melinger, 2005, 2005 8th European Conference on Radiation and Its Effects on Components and Systems.

Three-dimensional mapping of single event effects using nonlinear absorption

R. Pease, S. Buchner, J. Melinger, 2004 .

Charge collection studies of SOI diodes

O. Musseau, S. Buchner, A. Campbell, 2002 .

Charge collection studies of SOI diodes

O. Musseau, S. Buchner, A. Campbell, 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).

Application of a pulsed laser for evaluation and optimization of SEU-hard designs

T. Scott, D. McMorrow, S. Buchner, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Single-Event Transient Response of Comparator Pre-Amplifiers in a Complementary SiGe Technology

Mehmet Kaynak, John D. Cressler, Jeffrey H. Warner, 2017, IEEE Transactions on Nuclear Science.

Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI

George N. Tzintzarov, Anup P. Omprakash, S. Buchner, 2020, IEEE Transactions on Nuclear Science.

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

S. Buchner, K. Label, R. Ladbury, 2007, 2007 IEEE Radiation Effects Data Workshop.

Test methodology for characterizing the SEE response of a commercial IEEE 1394 serial bus (FireWire)

K. A. LaBel, S. P. Buchner, Paul W. Marshall, 2002 .

Characteristics of single-event upsets in a fabric switch (AD8151)

S. Buchner, M. Carts, P. Marshall, 2004, IEEE Transactions on Nuclear Science.

Characteristics of single-event upsets in a fabric switch (AD8151)

S. Buchner, M. Carts, P. Marshall, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

High Voltage GaN Lateral Photoconductive Semiconductor Switches

S. Buchner, K. Hobart, A. Koehler, 2017 .

A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal

M. Liu, S. Buchner, D. Mcmorrow, 2010, IEEE Transactions on Nuclear Science.

A Simplified Approach for Predicting Pulsed-Laser-Induced Carrier Generation in Semiconductor

S. Buchner, D. Mcmorrow, J. Warner, 2017, IEEE Transactions on Nuclear Science.

Certification of Parts for Space With the Variable Depth Bragg Peak Method

S. Buchner, C. C. Foster, B. D. Reddell, 2012, IEEE Transactions on Nuclear Science.

Single event transient response of InGaSb p-MOSFETs using pulsed laser excitation: Comparison of buried-channel and surface-channel structures

J. B. Boos, K. Saraswat, S. Buchner, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Proton-Induced Transient Charge Collection in GaAs and InAlSb/InAs-Based FETs

J. B. Boos, peixiong zhao, R. Reed, 2013, IEEE Transactions on Nuclear Science.

Novel Energy-Dependent Effects Revealed in GeV Heavy-Ion-Induced Transient Measurements of Antimony-Based III-V HEMTs

J. B. Boos, peixiong zhao, R. Reed, 2010, IEEE Transactions on Nuclear Science.

Charge-enhancement mechanisms of GaAs field-effect transistors: experiment and simulation

S. Buchner, J. Melinger, A. Campbell, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

Charge-collection efficiency of GaAs field effect transistors fabricated with a low-temperature grown buffer layer: dependence on charge deposition profile

S. Buchner, J. Melinger, D. Mcmorrow, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Charge-collection mechanisms of AlGaAs/GaAs HBTs

S. Buchner, J. Melinger, A. Campbell, 1997 .

Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

Nicholas C. Hooten, En Xia Zhang, Ronald D. Schrimpf, 2015, IEEE Transactions on Nuclear Science.

C ent Mechanisms of GaAs Field-Effect xperiment and Simulation

S. Buchner, J. Melinger, A. Campbell, 1998 .

Charge-enhancement mechanisms of GaAs field-effect transistors: Experiment and simulation

S. Buchner, J. Melinger, A. Campbell, 1997 .

Modification of single event upset cross section of an SRAM at high frequencies

S. Buchner, J. Melinger, A. Campbell, 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

Ani Khachatrian, Joel M. Hales, Dale McMorrow, 2015, IEEE Transactions on Nuclear Science.

Two-Photon Absorption Induced Charge Generation for Single-Event Effects Studies

S. Buchner, D. Mcmorrow, J. Warner, 2019 .

An Investigation of the SET Response of Devices and Differential Pairs in a 32-nm SOI CMOS Technology

Zachary E. Fleetwood, S. Buchner, J. Cressler, 2015, IEEE Transactions on Nuclear Science.

A Comparison of Single-Event Transients in Pristine and Irradiated ${{\rm Al}_{0.3}}{{\rm Ga}_{0.7}}{{\rm N}/{\rm GaN}}$ HEMTs using Two-Photon Absorption and Heavy Ions

S. Buchner, D. Mcmorrow, V. Ferlet-Cavrois, 2015, IEEE Transactions on Nuclear Science.

Electronic-to-Photonic Single-Event Transient Propagation in a Segmented Mach–Zehnder Modulator in a Si/SiGe Integrated Photonics Platform

George N. Tzintzarov, Sunil G. Rao, Jeffrey W. Teng, 2020, IEEE Transactions on Nuclear Science.

Charge-collection characteristics of GaAs MESFETs fabricated with a low-temperature grown GaAs buffer layer: computer simulation

S. Buchner, J. Melinger, A. Campbell, 1996 .

leetion ~~arae~eri$tie$ of GaAs MESFETs ~~~riea~ed with a eratu~~ GIWWBI aAs Buffer Layer: CO r Simulation

S. Buchner, J. Melinger, A. Campbell, 1996 .

Charge-collection characteristics of GaAs heterostructure FETs fabricated with a low-temperature grown GaAs buffer layer

S. Buchner, P. Marshall, J. Melinger, 1995, Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems.

Single-Event Effect Performance of a Commercial ReRAM

Hak S. Kim, S. Buchner, K. Label, 2014 .

Radiation Hardness Assurance for Space Systems

C. Poivey, Stephen P. Buchner, S. Buchner, 2013 .

Analysis of single-ion multiple-bit upset in high-density DRAMs

Sumio Matsuda, A. B. Campbell, N. Nemoto, 2000 .

Single-Event Phenomena in

A. B. Campbell, Steve Buchner, T. R. Weatherford, 1996 .

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits

Adrian Ildefonso, Ickhyun Song, Ani Khachatrian, 2020, Sensors.

Charge collection in GaAs MESFETs and MODFETs

A. B. Campbell, Y. J. Chen, Dale McMorrow, 1991 .

SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing

R. D. Schrimpf, N. J. Gaspard, D. McMorrow, 2013, IEEE Transactions on Nuclear Science.

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

V. Pouget, C. Larue, F. Miller, 2011, IEEE Transactions on Nuclear Science.

Modeling single-event effects in a complex digital device

D. J. Fouts, T. R. Weatherford, Dale McMorrow, 2003 .

Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption

S. Buchner, P. Klein, R. Stahlbush, 2018, Materials Science Forum.

Pulsed-Laser Testing for Single-Event Effects Investigations

V. Pouget, F. Miller, S. P. Buchner, 2013, IEEE Transactions on Nuclear Science.

An Electrostatic Discharge Protection Circuit Technique for the Mitigation of Single-Event Transients in SiGe BiCMOS Technology

Zachary E. Fleetwood, S. Buchner, J. Cressler, 2018, IEEE Transactions on Nuclear Science.

The Effect of the Gate-Connected Field Plate on Single-Event Transients in AlGaN/GaN Schottky-Gate HEMTs

S. Buchner, A. Koehler, A. Khachatrian, 2019, IEEE Transactions on Nuclear Science.

Spatial Mapping of Pristine and Irradiated AlGaN/GaN HEMTs With UV Single-Photon Absorption Single-Event Transient Technique

S. Buchner, A. Koehler, T. Anderson, 2016, IEEE Transactions on Nuclear Science.

The Use of Inverse-Mode SiGe HBTs as Active Gain Stages in Low-Noise Amplifiers for the Mitigation of Single-Event Transients

John D. Cressler, Ickhyun Song, Zachary E. Fleetwood, 2017, IEEE Transactions on Nuclear Science.

Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation

peixiong zhao, R. Reed, E. Zhang, 2021, IEEE Transactions on Nuclear Science.

Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode

peixiong zhao, R. Reed, E. Zhang, 2020, IEEE Transactions on Nuclear Science.

Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits

F. Saigne, J. Boch, V. Pouget, 2009, IEEE Transactions on Nuclear Science.

Total dose effects on error rates in linear bipolar systems

D. McMorrow, S. Buchner, L. Dusseau, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational Amplifier

D. McMorrow, S. Buchner, L. Dusseau, 2008, IEEE Transactions on Nuclear Science.

The Impact of Metal Line Reflections on Through-Wafer TPA SEE Testing

R. Reed, S. Buchner, J. Warner, 2015, IEEE Transactions on Nuclear Science.

Using Bessel beams and two-photon absorption to predict radiation effects in microelectronics.

Adrian Ildefonso, George N. Tzintzarov, Ani Khachatrian, 2019, Optics express.

2014IEEENuclearandSpaceRadiationEffects ConferenceAwards CommentsbytheChairman I

Alyson D. Topper, R. A. Gigliuto, S. Buchner, 2014 .

Technique to measure an ion track profile

A. B. Campbell, V. Ferlet-Cavrois, O. Musseau, 1998 .

Space Radiation Effects and Microelectromechanical Systems

S. Buchner, 2005 .

The Impact of the Space Radiation Environment on Micro Electro Mechanical Systems (MEMS) and Microstructures

S.P. Buchner, M.A.G. Darrin, M. Martin, 2005, 2005 8th European Conference on Radiation and Its Effects on Components and Systems.

SEU measurements and predictions on MPTB for a large energetic solar particle event

S. Buchner, S. Buchner, A. Campbell, 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).

Theoretical Investigation of an Equivalent Laser LET

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2001, Microelectron. Reliab..

Laser confirmation of SEU experiments in GaAs MESFET combinational logic (for space application)

T. R. Weatherford, S. Buchner, S. Buchner, 1992 .

The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2017, IEEE Transactions on Nuclear Science.

Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2017, IEEE Transactions on Nuclear Science.

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

J. Boch, K. LaBel, R. Ecoffet, 2007, IEEE Transactions on Nuclear Science.

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

R. Reed, D. McMorrow, C. Seidleck, 2004, IEEE Transactions on Nuclear Science.

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

M.D. Berg, D. McMorrow, S.P. Buchner, 2009, IEEE Transactions on Nuclear Science.

Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray Beam

S. Buchner, A. Koehler, T. Anderson, 2019, IEEE Transactions on Nuclear Science.

Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

W. H. Robinson, W. H. Robinson, S. P. Buchner, 2013, IEEE Transactions on Nuclear Science.

An SEU analysis approach for error propagation in digital VLSI CMOS ASICs

S. P. Buchner, M. Baze, W. G. Bartholet, 1995 .

Laboratory tests for single-event effects

S. P. Buchner, Dale McMorrow, J. S. Melinger, 1996 .

Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption

George N. Tzintzarov, Jeffrey W. Teng, S. Buchner, 2021, IEEE Transactions on Nuclear Science.

Observation of solar particle events from CREDO and MPTB during the current solar maximum

S. P. Buchner, Clive Dyer, S. Buchner, 2002 .

Comparison of threshold transient upset levels induced by flash X-rays and pulsed lasers

W. D. Raburn, S. Buchner, R. Singh, 1988 .

On the Application of Inverse-Mode SiGe HBTs in RF Receivers for the Mitigation of Single-Event Transients

Adrian Ildefonso, Ickhyun Song, Moon-Kyu Cho, 2017, IEEE Transactions on Nuclear Science.

An Investigation of the Use of Inverse-Mode SiGe HBTs as Switching Pairs for SET-Mitigated RF Mixers

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2016, IEEE Transactions on Nuclear Science.

Demonstration of single-event effects induced by through-wafer two-photon absorption

D. McMorrow, S. Buchner, S. Buchner, 2004, IEEE Transactions on Nuclear Science.

Laser-Induced Latchup Screening and Mitigation in CMOS Devices

M. Baze, S. Buchner, K. Label, 2005, 2005 8th European Conference on Radiation and Its Effects on Components and Systems.

Tradeoffs Between RF Performance and SET Robustness in Low-Noise Amplifiers in a Complementary SiGe BiCMOS Platform

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2020, IEEE Transactions on Nuclear Science.