Carsten Wegener

发表

Guest Editorial: Analog, Mixed-Signal and RF Testing

Gildas Léger, Carsten Wegener, 2016, J. Electron. Test..

Buck converter modeling in SystemVerilog for verification and virtual test applications

Carsten Wegener, Elvis Shera, 2015, 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW).

Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus

Juha Kostamovaara, Carsten Wegener, Esa Korhonen, 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

Incorporation of hard-fault-coverage in model-based testing of mixed-signal ICs

Michael Peter Kennedy, Carsten Wegener, 2000, DATE '00.

ATPG for mixed-signal circuits using commercial digital tools

Carsten Wegener, 2014, 19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings.

Model-based testing of high-resolution ADCs

Michael Peter Kennedy, Carsten Wegener, 2000, 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353).

Test Development Through Defect and Test Escape Level Estimation for Data Converters

Michael Peter Kennedy, Carsten Wegener, C. Wegener, 2006, J. Electron. Test..

Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits

Michael Peter Kennedy, Bernd Straube, Carsten Wegener, 2001, J. Electron. Test..

Implementation of model-based testing for medium- to high-resolution Nyquist-rate ADCs

Michael Peter Kennedy, Carsten Wegener, 2002, Proceedings. International Test Conference.

An approach to linear model-based testing for nonlinear cascaded mixed-signal systems

Carsten Wegener, Hans-Joachim Jentschel, Heinz Mattes, 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

A Contribution toAdvanced Extraction Methods forStatic ADCNon-linearity

Carsten Wegener, Pravoslav Martinek, Ondirej Subrt, 2007 .

Modeling static analog behavior for determining mixed-signal test coverage using digital tools

Carsten Wegener, 2015, 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW).

Linear model-based error identification and calibration for data converters

Michael Peter Kennedy, Carsten Wegener, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.

Method of reducing contactor effect when testing high-precision adcs

Michael Peter Kennedy, Carsten Wegener, Tom O'Dwyer, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores

Carsten Wegener, Frank Demmerle, Heinz Mattes, 2009, J. Electron. Test..

Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs

Michael Peter Kennedy, Carsten Wegener, C. Wegener, 2005, J. Electron. Test..

Method of modeling analog circuits in verilog for mixed-signal design simulations

Carsten Wegener, 2013, 2013 European Conference on Circuit Theory and Design (ECCTD).

Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing

Michael Peter Kennedy, Carsten Wegener, 2007, J. Electron. Test..

Linear model-based testing of ADC nonlinearities

Michael Peter Kennedy, Carsten Wegener, C. Wegener, 2004, IEEE Transactions on Circuits and Systems I: Regular Papers.

Conquering variability in mixed-signal ICs

Carsten Wegener, Hans Martin von Staudt, 2013, Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME).

Testing ADCs for static and dynamic INL - killing two birds with one stone

Michael Peter Kennedy, Carsten Wegener, 2004, Comput. Stand. Interfaces.

LEMMA-ADC: the linear error mechanism modelling algorithm applied to A/D-converters

Michael Peter Kennedy, Carsten Wegener, Brian Carroll, 1999 .