Chimoon Huang

发表

Modeling hot-electron gate current in Si MOSFET's using a coupled drift-diffusion and Monte Carlo method

Chimoon Huang, Tahui Wang, C. N. Chen, 1992 .

Interface trap induced thermionic and field emission current in off-state MOSFET's

Chimoon Huang, Tahui Wang, Tse-En Chang, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.

Investigation of oxide charge trapping and detrapping in a n-MOSFET

Chimoon Huang, Tahui Wang, Tse-En Chang, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

A new technique to measure an oxide trap density in a hot carrier stressed n-MOSFET

Chimoon Huang, Tahui Wang, Tse-En Chang, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

Mechanisms of interface trap-induced drain leakage current in off-state n-MOSFET's

Chimoon Huang, Tahui Wang, Tahui Wang, 1995 .

Effects of hot carrier induced interface state generation in submicron LDD MOSFET's

Steve S. Chung, Chimoon Huang, Tahui Wang, 1994 .

Device and circuit simulation of anomalous DX trap effects in DCFL and SCFL HEMT inverters

Tahui Wang, Sheng-Jyh Wu, Chimoon Huang, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Interface trap effect on gate induced drain leakage current in submicron N-MOSFET's

C. Y. Chang, Chimoon Huang, Tahui Wang, 1994 .

Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique

N. K. Zous, L. P. Chiang, Chimoon Huang, 1997 .

Field and temperature effects on oxide charge detrapping in a metal-oxide-semiconductor field effect transistor by measuring a subthreshold current transient

Chimoon Huang, Tahui Wang, L. Chiang, 1997 .

Hot hole stress induced leakage current (SILC) transient in tunnel oxides

Chimoon Huang, Tahui Wang, N. Zous, 1998 .