Chi Chang

Corner-field induced drain leakage in thin oxide MOSFETs

Chi Chang, J. Lien, 1987, 1987 International Electron Devices Meeting.

The Study on Charge-trapping Mechanism in Nitride Storage Flash Memory Device

Chi Chang, Chih-Yuan Lee, C. Kao, 2007 .

Transistors with floating roadblockers as selector gates use forming nand flash memory and bias method to

Yu Sun, Chi Chang, Chung-You Hu, 1997 .

Short channel enhanced degradation during discharge of flash EEPROM memory cell

Chi Chang, J. Lien, S. Haddad, 1995, Proceedings of International Electron Devices Meeting.

Enhanced impurity diffusion resulting from rapid thermal nitridation of thin SiO2

Chi Chang, S. Haddad, A. Wang, 1991 .