A. Hyslop

Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

D. E. Russell, E. Smith, W. Mckee, 1996, Proceedings of International Reliability Physics Symposium.

An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices

A. Hyslop, C. Duvvury, D. Baglee, 1984 .

Impact of Hot Carriers on Dram Circuits

C. Duvvury, H. Kitagawa, D. Redwine, 1987, 25th International Reliability Physics Symposium.

Plastic packaging stress induced failures in TiW/Al-Si metal to silicide contacts

A. Hyslop, A. Nishimura, S. Murata, 1988, 26th Annual Proceedings Reliability Physics Symposium 1988.